Beatriz, S.-P.; Luis, N.; Leonor, C.; Laura, M.; Elena, M.; Yolanda, F.-N.
Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications. Materials 2016, 9, 109.
https://doi.org/10.3390/ma9020109
AMA Style
Beatriz S-P, Luis N, Leonor C, Laura M, Elena M, Yolanda F-N.
Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications. Materials. 2016; 9(2):109.
https://doi.org/10.3390/ma9020109
Chicago/Turabian Style
Beatriz, Suárez-Peña, Negral Luis, Castrillón Leonor, Megido Laura, Marañón Elena, and Fernández-Nava Yolanda.
2016. "Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications" Materials 9, no. 2: 109.
https://doi.org/10.3390/ma9020109
APA Style
Beatriz, S.-P., Luis, N., Leonor, C., Laura, M., Elena, M., & Yolanda, F.-N.
(2016). Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications. Materials, 9(2), 109.
https://doi.org/10.3390/ma9020109