Next Article in Journal
Nanowire Ring Embedded in a Flexible Substrate for Local Strain Detection
Previous Article in Journal
Effects of Si/C Ratio on the Phase Composition of Si-C-N Powders Synthesized by Carbonitriding
Previous Article in Special Issue
Polyacrylamide Ferrogels with Ni Nanowires
Open AccessArticle

Nanocrystallization in FINEMET-Type Fe73.5Nb3Cu1Si13.5B9 and Fe72.5Nb1.5Mo2Cu1.1Si14.2B8.7 Thin Films

1
Department of Solid State Magnetism IPAM, Ural Federal University, Mira st. 19, 620002 Ekaterinburg, Russia
2
SGIKER, Servicios Generales de Investigación, Universidad del País Vasco UPV-EHU, Apartado 644, 48080 Bilbao, Spain
3
Departamento de Electricidad y Electrónica, Universidad del País Vasco UPV-EHU and BCMaterials, Apartado 644, 48080 Bilbao, Spain
*
Author to whom correspondence should be addressed.
Materials 2020, 13(2), 348; https://doi.org/10.3390/ma13020348
Received: 27 November 2019 / Revised: 9 January 2020 / Accepted: 10 January 2020 / Published: 12 January 2020
(This article belongs to the Special Issue Advances in Magnetic Materials and Magneto-Elastic Sensors )
A growing variety of microelectronic devices and magnetic field sensors as well as a trend of miniaturization demands the development of low-dimensional magnetic materials and nanostructures. Among them, soft magnetic thin films of Finemet alloys are appropriate materials for sensor and actuator devices. Therefore, one of the important directions of the research is the optimization of thin film magnetic properties. In this study, the structural transformations of the Fe73.5Nb3Cu1Si13.5B9 and Fe72.5Nb1.5Mo2Cu1.1Si14.2B8.7 films of 100, 150 and 200 nm thicknesses were comparatively analyzed together with their magnetic properties and magnetic anisotropy. The thin films were prepared using the ion-plasma sputtering technique. The crystallization process was studied by certified X-ray diffraction (XRD) methods. The kinetics of crystallization was observed due to the temperature X-ray diffraction (TDX) analysis. Magnetic properties of the films were studied by the magneto-optical Kerr microscopy. Based on the TDX data the delay of the onset crystallization of the films with its thickness decreasing was shown. Furthermore, the onset crystallization of the 150 and 200 nm films began at the temperature of about 400–420 °C showing rapid grain growth up to the size of 16–20 nm. The best magnetic properties of the films were formed after crystallization after the heat treatment at 350–400 °C when the stress relaxation took place. View Full-Text
Keywords: thin magnetic film; annealing treatment; FINEMET; soft magnetic material; X-ray diffraction; sensor applications thin magnetic film; annealing treatment; FINEMET; soft magnetic material; X-ray diffraction; sensor applications
Show Figures

Figure 1

MDPI and ACS Style

Mikhalitsyna, E.A.; Kataev, V.A.; Larrañaga, A.; Lepalovskij, V.N.; Kurlyandskaya, G.V. Nanocrystallization in FINEMET-Type Fe73.5Nb3Cu1Si13.5B9 and Fe72.5Nb1.5Mo2Cu1.1Si14.2B8.7 Thin Films. Materials 2020, 13, 348.

Show more citation formats Show less citations formats
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

1
Back to TopTop