pH Measurement at Elevated Temperature with Vessel Gate and Oxygen-Terminated Diamond Solution Gate Field Effect Transistors
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Kawaguchi, S.; Nomoto, R.; Sato, H.; Takarada, T.; Chang, Y.H.; Kawarada, H. pH Measurement at Elevated Temperature with Vessel Gate and Oxygen-Terminated Diamond Solution Gate Field Effect Transistors. Sensors 2022, 22, 1807. https://doi.org/10.3390/s22051807
Kawaguchi S, Nomoto R, Sato H, Takarada T, Chang YH, Kawarada H. pH Measurement at Elevated Temperature with Vessel Gate and Oxygen-Terminated Diamond Solution Gate Field Effect Transistors. Sensors. 2022; 22(5):1807. https://doi.org/10.3390/s22051807
Chicago/Turabian StyleKawaguchi, Shuto, Reona Nomoto, Hirotaka Sato, Teruaki Takarada, Yu H. Chang, and Hiroshi Kawarada. 2022. "pH Measurement at Elevated Temperature with Vessel Gate and Oxygen-Terminated Diamond Solution Gate Field Effect Transistors" Sensors 22, no. 5: 1807. https://doi.org/10.3390/s22051807