Kawaguchi, S.; Nomoto, R.; Sato, H.; Takarada, T.; Chang, Y.H.; Kawarada, H.
pH Measurement at Elevated Temperature with Vessel Gate and Oxygen-Terminated Diamond Solution Gate Field Effect Transistors. Sensors 2022, 22, 1807.
https://doi.org/10.3390/s22051807
AMA Style
Kawaguchi S, Nomoto R, Sato H, Takarada T, Chang YH, Kawarada H.
pH Measurement at Elevated Temperature with Vessel Gate and Oxygen-Terminated Diamond Solution Gate Field Effect Transistors. Sensors. 2022; 22(5):1807.
https://doi.org/10.3390/s22051807
Chicago/Turabian Style
Kawaguchi, Shuto, Reona Nomoto, Hirotaka Sato, Teruaki Takarada, Yu Hao Chang, and Hiroshi Kawarada.
2022. "pH Measurement at Elevated Temperature with Vessel Gate and Oxygen-Terminated Diamond Solution Gate Field Effect Transistors" Sensors 22, no. 5: 1807.
https://doi.org/10.3390/s22051807
APA Style
Kawaguchi, S., Nomoto, R., Sato, H., Takarada, T., Chang, Y. H., & Kawarada, H.
(2022). pH Measurement at Elevated Temperature with Vessel Gate and Oxygen-Terminated Diamond Solution Gate Field Effect Transistors. Sensors, 22(5), 1807.
https://doi.org/10.3390/s22051807