Liu, Y.; Liu, E.; Chen, Y.; Wang, X.; Sun, C.; Tan, J.
Study on Propagation Depth of Ultrasonic Longitudinal Critically Refracted (LCR) Wave. Sensors 2020, 20, 5724.
https://doi.org/10.3390/s20195724
AMA Style
Liu Y, Liu E, Chen Y, Wang X, Sun C, Tan J.
Study on Propagation Depth of Ultrasonic Longitudinal Critically Refracted (LCR) Wave. Sensors. 2020; 20(19):5724.
https://doi.org/10.3390/s20195724
Chicago/Turabian Style
Liu, Yongmeng, Enxiao Liu, Yuanlin Chen, Xiaoming Wang, Chuanzhi Sun, and Jiubin Tan.
2020. "Study on Propagation Depth of Ultrasonic Longitudinal Critically Refracted (LCR) Wave" Sensors 20, no. 19: 5724.
https://doi.org/10.3390/s20195724
APA Style
Liu, Y., Liu, E., Chen, Y., Wang, X., Sun, C., & Tan, J.
(2020). Study on Propagation Depth of Ultrasonic Longitudinal Critically Refracted (LCR) Wave. Sensors, 20(19), 5724.
https://doi.org/10.3390/s20195724