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Resonator-Inspired Metamaterial Sensor: Design and Experimental Validation for Measuring Thickness of Multi-Layered Structures

Centre of Advanced Electronic and Communication Engineering, Universiti Kebangsaan Malaysia, UKM Bangi, Selangor 43600, Malaysia
Patuakhali Science and Technology University, Patuakhali 8602, Bangladesh
Authors to whom correspondence should be addressed.
Sensors 2018, 18(12), 4213;
Received: 1 August 2018 / Revised: 13 October 2018 / Accepted: 16 October 2018 / Published: 1 December 2018
(This article belongs to the Special Issue Antenna Technologies for Microwave Sensors)
PDF [4245 KB, uploaded 1 December 2018]


A digit 8-shaped resonator inspired metamaterial is proposed herein for sensor applications. The resonator is surrounded by a ground frame and excited by a microstrip feedline. The measurement of the sensor can be performed using common laboratory facilities in lieu of using the waveguide, as the resonator, ground frame, and feedline are all on the same microstrip. To achieve metamaterial properties, more than one unit cell is usually utilized, whereas, in this work, a single cell was used to achieve the metamaterial characteristics. The properties of the metamaterial were investigated to find the relationship between the simulation and measurements. The proposed metamaterial sensor shows considerable sensitivity in sensor application. For the sensor application, FR4 and Rogers RO4350 materials were used as the over-layer. The sensor can measure dielectric thickness with a sensitivity of 625 MHz/mm, 468 MHz/mm, and 354 MHz/mm for the single over-layer, double over-layers, and multiple over-layers, respectively. The proposed prototype can be utilized in several applications where metamaterial characteristics are required. View Full-Text
Keywords: metamaterial sensor; resonator; thickness; sensitivity metamaterial sensor; resonator; thickness; sensitivity

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Islam, M.T.; Rahman, M.N.; Samsuzzaman, M.; Mansor, M.F.; Misran, N. Resonator-Inspired Metamaterial Sensor: Design and Experimental Validation for Measuring Thickness of Multi-Layered Structures. Sensors 2018, 18, 4213.

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