- Feature Paper
- Article
Industrial Fault Detection Based on Discriminant Enhanced Stacking Auto-Encoder Model
- Bowen Liu,
- Yi Chai,
- Yutao Jiang and
- Yiming Wang
In the recent years, deep learning has been widely used in process monitoring due to its strong ability to extract features. However, with the increasing layers of the deep network, the compression of features by the deep model will lead to the loss...