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Keywords = TFET (tunneling field-effect transistor)

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10 pages, 1722 KB  
Article
High-Indium-Composition, Ultra-Low-Power GaAsSb/InGaAs Heterojunction Tunnel Field-Effect Transistors
by Yan Liu, Xiang Li, Dao-Hua Zhang, Meng-Qi Fan, Xiao-Ping Wang and Yun-Jiang Jin
Micromachines 2026, 17(2), 149; https://doi.org/10.3390/mi17020149 - 23 Jan 2026
Viewed by 120
Abstract
In this work, we report the first systematic examination of how the In composition in the intrinsic InxGa1-xAs layer and the p-type doping concentration in the p-type GaAsSb layer affect the device performance of side-gate p-GaAs0.5Sb0.5 [...] Read more.
In this work, we report the first systematic examination of how the In composition in the intrinsic InxGa1-xAs layer and the p-type doping concentration in the p-type GaAsSb layer affect the device performance of side-gate p-GaAs0.5Sb0.5/i-InxGa1-xAs/n-In0.53Ga0.47As TFETs, using the technology computer-aided design (TCAD) simulations with a non-local band-to-band model. By tuning these two parameters, a moderate staggered alignment is achieved, enabling self-off operation at zero gate bias while maintaining high on-current. This tunability is an intrinsic and significant advantage of the p-GaAsSb/i-InxGa1-xAs heterojunction that has not been previously explored. It is found that the best device performance does not occur in the TFET with an In composition of 0.53 in the intrinsic layer, which is lattice-matched to the InP substrate, but rather occurs in the device with a higher In composition of around 0.59 in the InGaAs layer, which has been verified by experimental data to some extent. Optimal parameter combinations yield a minimum subthreshold swing of 13.51 mV/dec and an ON-state current of 35.39 μA/μm at VDS = VGS = 0.5 V due to the enhanced tunneling capability. Full article
(This article belongs to the Special Issue Power Semiconductor Devices and Integration Technology)
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10 pages, 1872 KB  
Article
Preparation and Performance Exploration of MoS2/WSe2 Van Der Waals Heterojunction Tunneling Field-Effect Transistor
by Chen Chong, Hongxia Liu, Shulong Wang, Shupeng Chen and Cong Yan
Micromachines 2025, 16(10), 1108; https://doi.org/10.3390/mi16101108 - 29 Sep 2025
Viewed by 1231
Abstract
Due to their high carrier mobility, thermal conductivity, and exceptional foldability, transition metal dichalcogenides (TMDs) present promising prospects in the realm of flexible semiconductor devices. Concurrently, tunneling field-effect transistors (TFETs) have garnered significant attention owing to their low energy consumption. This study investigates [...] Read more.
Due to their high carrier mobility, thermal conductivity, and exceptional foldability, transition metal dichalcogenides (TMDs) present promising prospects in the realm of flexible semiconductor devices. Concurrently, tunneling field-effect transistors (TFETs) have garnered significant attention owing to their low energy consumption. This study investigates a TMD van der Waals heterojunction (VdWH) TFET, specifically by fabricating MoS2 field-effect transistors (FETs), WSe2 FETs, and MoS2/WSe2 VdWH TFETs. The N-type characteristics of the MoS2 and P-type characteristics of WSe2 are established through an analysis of the electrical characteristics of the respective FETs. Finally, we analyze the energy band and electrical characteristics of the MoS2/WSe2 VdWH TFET, which exhibits a drain current switching ratio of 105. This study provides valuable insights for the development of novel low-power devices. Full article
(This article belongs to the Section D1: Semiconductor Devices)
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24 pages, 2773 KB  
Article
Highly Sensitive SOI-TFET Gas Sensor Utilizing Tailored Conducting Polymers for Selective Molecular Detection and Microbial Biosensing Integration
by Mohammad K. Anvarifard and Zeinab Ramezani
Biosensors 2025, 15(8), 525; https://doi.org/10.3390/bios15080525 - 11 Aug 2025
Cited by 1 | Viewed by 923
Abstract
We present a highly sensitive and selective gas sensor based on an advanced silicon-on-insulator tunnel field-effect transistor (SOI-TFET) architecture, enhanced through the integration of customized conducting polymers. In this design, traditional metal gates are replaced with distinct functional polymers—PPP-TOS/AcCN, PP-TOS/AcCN, PP-FE(CN)63− [...] Read more.
We present a highly sensitive and selective gas sensor based on an advanced silicon-on-insulator tunnel field-effect transistor (SOI-TFET) architecture, enhanced through the integration of customized conducting polymers. In this design, traditional metal gates are replaced with distinct functional polymers—PPP-TOS/AcCN, PP-TOS/AcCN, PP-FE(CN)63−/H2O, PPP-TCNQ-TOS/AcCN, and PPP-ClO4/AcCN—which enable precise molecular recognition and discrimination of various target gases. To further enhance sensitivity, the device employs an oppositely doped source region, significantly improving gate control and promoting stronger band-to-band tunneling. This structural modification amplifies sensing signals and improves noise immunity, allowing reliable detection at trace concentrations. Additionally, optimization of the subthreshold swing contributes to faster switching and response times. Thermal stability is addressed by embedding a P-type buffer layer within the buried oxide, which increases thermal conductivity and reduces lattice temperature, further stabilizing device performance. Experimental results demonstrate that the proposed sensor outperforms conventional SOI-TFET designs, exhibiting superior sensitivity and selectivity toward analytes such as methanol, chloroform, isopropanol, and hexane. Beyond gas sensing, the unique polymer-functionalized gate design enables integration of microbial biosensing capabilities, making the platform highly versatile for biochemical detection. This work offers a promising pathway toward ultra-sensitive, low-power sensing technologies for environmental monitoring, industrial safety, and medical diagnostics. Full article
(This article belongs to the Special Issue Microbial Biosensor: From Design to Applications—2nd Edition)
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31 pages, 11019 KB  
Review
A Review of Tunnel Field-Effect Transistors: Materials, Structures, and Applications
by Shupeng Chen, Yourui An, Shulong Wang and Hongxia Liu
Micromachines 2025, 16(8), 881; https://doi.org/10.3390/mi16080881 - 29 Jul 2025
Cited by 3 | Viewed by 5568
Abstract
The development of an integrated circuit faces the challenge of the physical limit of Moore’s Law. One of the most important “Beyond Moore” challenges is the scaling down of Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) versus their increasing static power consumption. This is because, at [...] Read more.
The development of an integrated circuit faces the challenge of the physical limit of Moore’s Law. One of the most important “Beyond Moore” challenges is the scaling down of Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) versus their increasing static power consumption. This is because, at room temperature, the thermal emission transportation mechanism will cause a physical limitation on subthreshold swing (SS), which is fundamentally limited to a minimum value of 60 mV/decade for MOSFETs, and accompanied by an increase in off-state leakage current with the process of scaling down. Moreover, the impacts of short-channel effects on device performance also become an increasingly severe problem with channel length scaling down. Due to the band-to-band tunneling mechanism, Tunnel Field-Effect Transistors (TFETs) can reach a far lower SS than MOSFETs. Recent research works indicated that TFETs are already becoming some of the promising candidates of conventional MOSFETs for ultra-low-power applications. This paper provides a review of some advances in materials and structures along the evolutionary process of TFETs. An in-depth discussion of both experimental works and simulation works is conducted. Furthermore, the performance of TFETs with different structures and materials is explored in detail as well, covering Si, Ge, III-V compounds and 2D materials, alongside different innovative device structures. Additionally, this work provides an outlook on the prospects of TFETs in future ultra-low-power electronics and biosensor applications. Full article
(This article belongs to the Special Issue MEMS/NEMS Devices and Applications, 3rd Edition)
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13 pages, 10954 KB  
Article
A Stepped Gate Oxide Structure for Suppressing Gate-Induced Drain Leakage in Fully Depleted Germanium-on-Insulator Multi-Subchannel Tunneling Field-Effect Transistors
by Rui Chen, Liming Wang, Ruizhe Han, Keqin Liao, Xinlong Shi, Peijian Zhang and Huiyong Hu
Micromachines 2025, 16(4), 375; https://doi.org/10.3390/mi16040375 - 26 Mar 2025
Cited by 1 | Viewed by 1116
Abstract
To address the severe gate-induced drain leakage (GIDL) issue in fully depleted germanium-on-insulator (FD-GeOI) multi-subchannel tunneling field-effect transistors (MS TFETs), this paper proposes a stepped gate oxide (SGO) structure. In the off-state, the SGO structure effectively suppresses GIDL by reducing the electric field [...] Read more.
To address the severe gate-induced drain leakage (GIDL) issue in fully depleted germanium-on-insulator (FD-GeOI) multi-subchannel tunneling field-effect transistors (MS TFETs), this paper proposes a stepped gate oxide (SGO) structure. In the off-state, the SGO structure effectively suppresses GIDL by reducing the electric field intensity at the channel/drain interface while simultaneously decreasing gate capacitance to reduce static power consumption. Based on an accurate device model, a systematic investigation was conducted into the effects of varying the thickness and length of the SGO structure on TFET performance, enabling the optimization of the SGO design. The simulation results demonstrate that, compared to normal MS TFETs, the SGO MS TFET reduces the off-state GIDL current (Ioff) from 4.6×107 A to 2.6×1011 A, achieving a maximum improvement of 4.22 orders of magnitude in the on-state-to-off-state current ratio (Ion/Ioff) and a 28% reduction in subthreshold swing (SS). Furthermore, compared to lightly doped drain (LDD) MS TFETs, the SGO MS TFET achieves a 32% reduction in total gate capacitance and a 23% enhancement in carrier mobility at the channel/drain interface. This study demonstrates that SGO provides an effective solution for GIDL suppression. Full article
(This article belongs to the Section D1: Semiconductor Devices)
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10 pages, 3507 KB  
Article
Improving the Performance of Arsenene Nanoribbon Gate-All-Around Tunnel Field-Effect Transistors Using H Defects
by Shun Song, Lu Qin, Zhi Wang, Juan Lyu, Jian Gong and Shenyuan Yang
Nanomaterials 2024, 14(23), 1960; https://doi.org/10.3390/nano14231960 - 6 Dec 2024
Cited by 2 | Viewed by 1280
Abstract
We systematically study the transport properties of arsenene nanoribbon tunneling field-effect transistors (TFETs) along the armchair directions using first-principles calculations based on density functional theory combined with the non-equilibrium Green’s function approach. The pristine nanoribbon TFET devices with and without underlap (UL) exhibit [...] Read more.
We systematically study the transport properties of arsenene nanoribbon tunneling field-effect transistors (TFETs) along the armchair directions using first-principles calculations based on density functional theory combined with the non-equilibrium Green’s function approach. The pristine nanoribbon TFET devices with and without underlap (UL) exhibit poor performance. Introducing a H defect in the left UL region between the source and channel can drastically enhance the ON-state currents and reduce the SS to below 60 mV/decade. When the H defect is positioned far from the gate and/or at the center sites, the ON-state currents are substantially enhanced, meeting the International Technology Roadmap for Semiconductors requirements for high-performance and low-power devices with 5 nm channel length. The gate-all-around (GAA) structure can further improve the performance of the devices with H defects. Particularly for the devices with H defects near the edge, the GAA structure significantly reduces the SS values as low as 35 mV/decade. Our study demonstrates that GAA structure can greatly enhance the performance of the arsenene nanoribbon TFET devices with H defects, providing theoretical guidance for improving TFET performance based on two-dimensional material nanoribbons through the combination of defect engineering and GAA gate structures. Full article
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12 pages, 5753 KB  
Article
A Study on Dual-Gate Dielectric Face Tunnel Field-Effect Transistor for Ternary Inverter
by Aoxuan Wang, Hongliang Lu, Yuming Zhang, Jiale Sun and Zhijun Lv
Nanomaterials 2024, 14(15), 1307; https://doi.org/10.3390/nano14151307 - 3 Aug 2024
Viewed by 1730
Abstract
In this article, we propose a dual-gate dielectric face tunnel field-effect transistor (DGDFTFET) that can exhibit three different output voltage states. Meanwhile, according to the requirements of the ternary operation in the ternary inverter, four related indicators representing the performance of the DGDFTFET [...] Read more.
In this article, we propose a dual-gate dielectric face tunnel field-effect transistor (DGDFTFET) that can exhibit three different output voltage states. Meanwhile, according to the requirements of the ternary operation in the ternary inverter, four related indicators representing the performance of the DGDFTFET are proposed, and we explain the impact of these indicators on the inverter and confirm that better indicators can be obtained by choosing appropriate design parameters for the device. Then, the ternary inverter implemented with this device can exhibit voltage transfer characteristics (VTCs) with three stable output voltage levels and bigger static noise margins (SNMs). In addition, by comparing the indicators of the DGDFTFET and a face tunnel field-effect transistor (FTFET), as well as the SNM of inverters, it is demonstrated that the performance of the DGDFTFET far surpasses the FTFET. Full article
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16 pages, 3407 KB  
Article
Performance Projection of Vacuum Gate Dielectric Doping-Free Carbon Nanoribbon/Nanotube Field-Effect Transistors for Radiation-Immune Nanoelectronics
by Khalil Tamersit, Abdellah Kouzou, José Rodriguez and Mohamed Abdelrahem
Nanomaterials 2024, 14(11), 962; https://doi.org/10.3390/nano14110962 - 1 Jun 2024
Cited by 5 | Viewed by 2130
Abstract
This paper investigates the performance of vacuum gate dielectric doping-free carbon nanotube/nanoribbon field-effect transistors (VGD-DL CNT/GNRFETs) via computational analysis employing a quantum simulation approach. The methodology integrates the self-consistent solution of the Poisson solver with the mode space non-equilibrium Green’s function (NEGF) in [...] Read more.
This paper investigates the performance of vacuum gate dielectric doping-free carbon nanotube/nanoribbon field-effect transistors (VGD-DL CNT/GNRFETs) via computational analysis employing a quantum simulation approach. The methodology integrates the self-consistent solution of the Poisson solver with the mode space non-equilibrium Green’s function (NEGF) in the ballistic limit. Adopting the vacuum gate dielectric (VGD) paradigm ensures radiation-hardened functionality while avoiding radiation-induced trapped charge mechanisms, while the doping-free paradigm facilitates fabrication flexibility by avoiding the realization of a sharp doping gradient in the nanoscale regime. Electrostatic doping of the nanodevices is achieved via source and drain doping gates. The simulations encompass MOSFET and tunnel FET (TFET) modes. The numerical investigation comprehensively examines potential distribution, transfer characteristics, subthreshold swing, leakage current, on-state current, current ratio, and scaling capability. Results demonstrate the robustness of vacuum nanodevices for high-performance, radiation-hardened switching applications. Furthermore, a proposal for extrinsic enhancement via doping gate voltage adjustment to optimize band diagrams and improve switching performance at ultra-scaled regimes is successfully presented. These findings underscore the potential of vacuum gate dielectric carbon-based nanotransistors for ultrascaled, high-performance, energy-efficient, and radiation-immune nanoelectronics. Full article
(This article belongs to the Section Nanoelectronics, Nanosensors and Devices)
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68 pages, 16436 KB  
Review
CMOS Scaling for the 5 nm Node and Beyond: Device, Process and Technology
by Henry H. Radamson, Yuanhao Miao, Ziwei Zhou, Zhenhua Wu, Zhenzhen Kong, Jianfeng Gao, Hong Yang, Yuhui Ren, Yongkui Zhang, Jiangliu Shi, Jinjuan Xiang, Hushan Cui, Bin Lu, Junjie Li, Jinbiao Liu, Hongxiao Lin, Haoqing Xu, Mengfan Li, Jiaji Cao, Chuangqi He, Xiangyan Duan, Xuewei Zhao, Jiale Su, Yong Du, Jiahan Yu, Yuanyuan Wu, Miao Jiang, Di Liang, Ben Li, Yan Dong and Guilei Wangadd Show full author list remove Hide full author list
Nanomaterials 2024, 14(10), 837; https://doi.org/10.3390/nano14100837 - 9 May 2024
Cited by 77 | Viewed by 30505
Abstract
After more than five decades, Moore’s Law for transistors is approaching the end of the international technology roadmap of semiconductors (ITRS). The fate of complementary metal oxide semiconductor (CMOS) architecture has become increasingly unknown. In this era, 3D transistors in the form of [...] Read more.
After more than five decades, Moore’s Law for transistors is approaching the end of the international technology roadmap of semiconductors (ITRS). The fate of complementary metal oxide semiconductor (CMOS) architecture has become increasingly unknown. In this era, 3D transistors in the form of gate-all-around (GAA) transistors are being considered as an excellent solution to scaling down beyond the 5 nm technology node, which solves the difficulties of carrier transport in the channel region which are mainly rooted in short channel effects (SCEs). In parallel to Moore, during the last two decades, transistors with a fully depleted SOI (FDSOI) design have also been processed for low-power electronics. Among all the possible designs, there are also tunneling field-effect transistors (TFETs), which offer very low power consumption and decent electrical characteristics. This review article presents new transistor designs, along with the integration of electronics and photonics, simulation methods, and continuation of CMOS process technology to the 5 nm technology node and beyond. The content highlights the innovative methods, challenges, and difficulties in device processing and design, as well as how to apply suitable metrology techniques as a tool to find out the imperfections and lattice distortions, strain status, and composition in the device structures. Full article
(This article belongs to the Section Nanoelectronics, Nanosensors and Devices)
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15 pages, 3668 KB  
Article
Electrostatically Doped Junctionless Graphene Nanoribbon Tunnel Field-Effect Transistor for High-Performance Gas Sensing Applications: Leveraging Doping Gates for Multi-Gas Detection
by Khalil Tamersit, Abdellah Kouzou, José Rodriguez and Mohamed Abdelrahem
Nanomaterials 2024, 14(2), 220; https://doi.org/10.3390/nano14020220 - 19 Jan 2024
Cited by 11 | Viewed by 2795
Abstract
In this paper, a new junctionless graphene nanoribbon tunnel field-effect transistor (JLGNR TFET) is proposed as a multi-gas nanosensor. The nanosensor has been computationally assessed using a quantum simulation based on the self-consistent solutions of the mode space non-equilibrium Green’s function (NEGF) formalism [...] Read more.
In this paper, a new junctionless graphene nanoribbon tunnel field-effect transistor (JLGNR TFET) is proposed as a multi-gas nanosensor. The nanosensor has been computationally assessed using a quantum simulation based on the self-consistent solutions of the mode space non-equilibrium Green’s function (NEGF) formalism coupled with the Poisson’s equation considering ballistic transport conditions. The proposed multi-gas nanosensor is endowed with two top gates ensuring both reservoirs’ doping and multi-gas sensing. The investigations have included the IDS-VGS transfer characteristics, the gas-induced electrostatic modulations, subthreshold swing, and sensitivity. The order of change in drain current has been considered as a sensitivity metric. The underlying physics of the proposed JLGNR TFET-based multi-gas nanosensor has also been studied through the analysis of the band diagrams behavior and the energy-position-resolved current spectrum. It has been found that the gas-induced work function modulation of the source (drain) gate affects the n-type (p-type) conduction branch by modulating the band-to-band tunneling (BTBT) while the p-type (n-type) conduction branch still unaffected forming a kind of high selectivity from operating regime point of view. The high sensitivity has been recorded in subthermionic subthreshold swing (SS < 60 mV/dec) regime considering small gas-induced gate work function modulation. In addition, advanced simulations have been performed for the detection of two different types of gases separately and simultaneously, where high-performance has been recorded in terms of sensitivity, selectivity, and electrical behavior. The proposed detection approach, which is viable, innovative, simple, and efficient, can be applied using other types of junctionless tunneling field-effect transistors with emerging channel nanomaterials such as the transition metal dichalcogenides materials. The proposed JLGNRTFET-based multi-gas nanosensor is not limited to two specific gases but can also detect other gases by employing appropriate gate materials in terms of selectivity. Full article
(This article belongs to the Section Nanoelectronics, Nanosensors and Devices)
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12 pages, 4731 KB  
Article
Demonstration of a Frequency Doubler Using a Tunnel Field-Effect Transistor with Dual Pocket Doping
by Jang Hyun Kim and Hyunwoo Kim
Electronics 2023, 12(24), 4932; https://doi.org/10.3390/electronics12244932 - 8 Dec 2023
Cited by 1 | Viewed by 1973
Abstract
In this study, a frequency doubler that consists of a tunnel field-effect transistor (TFET) with dual pocket doping is proposed, and its operation is verified using technology computer-aided design (TCAD) simulations. The frequency-doubling operation is important to having symmetrical current characteristics, which eliminate [...] Read more.
In this study, a frequency doubler that consists of a tunnel field-effect transistor (TFET) with dual pocket doping is proposed, and its operation is verified using technology computer-aided design (TCAD) simulations. The frequency-doubling operation is important to having symmetrical current characteristics, which eliminate odd harmonics and the need for extra filter circuitry. The proposed TFET has intrinsically bidirectional and controllable currents that can be implemented by pocket doping, which is located at the junction between the source/drain (S/D) and the channel region, to modify tunneling probabilities. The source-to-channel (ISC) and channel-to-drain currents (ICD) can be independently changed by managing each pocket doping concentration on the source and drain sides (NS,POC and ND,POC). After that, the current matching process was investigated through NS,POC and ND,POC splits, respectively. However, it was found that the optimized doping condition achieved at the device level (namely, a transistor evaluation) is not suitable for a frequency doubler operation because the voltage drop generated by a load resistor in the frequency doubler circuit configuration causes the currents to be unbalanced between ISC and ICD. Therefore, after symmetrical current matching was performed by optimizing NS,POC and ND,POC at the circuit level, it was clearly seen that the output frequency was doubled in comparison to the input sinusoidal signal. In addition, the effects of the S/D and pocket doping variations that can occur during process integration were investigated to determine how much frequency multiplications are affected, and these variations have the immunity of S/D doping and pocket doping length changes. Furthermore, the impact of device scaling with gate length (LG) variations was evaluated. Based on these findings, the proposed frequency doubler is anticipated to offer benefits for circuit design and low-power applications compared to the conventional one. Full article
(This article belongs to the Special Issue Novel Semiconductor Devices Technology and Systems)
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10 pages, 5386 KB  
Article
Electrically Doped PNPN Tunnel Field-Effect Transistor Using Dual-Material Polarity Gate with Improved DC and Analog/RF Performance
by Chan Shan, Ying Liu, Yuan Wang, Rongsheng Cai and Lehui Su
Micromachines 2023, 14(12), 2149; https://doi.org/10.3390/mi14122149 - 24 Nov 2023
Cited by 4 | Viewed by 1601
Abstract
A new structure for PNPN tunnel field-effect transistors (TFETs) has been designed and simulated in this work. The proposed structure incorporates the polarity bias concept and the gate work function engineering to improve the DC and analog/RF figures of merit. The proposed device [...] Read more.
A new structure for PNPN tunnel field-effect transistors (TFETs) has been designed and simulated in this work. The proposed structure incorporates the polarity bias concept and the gate work function engineering to improve the DC and analog/RF figures of merit. The proposed device consists of a control gate (CG) and a polarity gate (PG), where the PG uses a dual-material gate (DMG) structure and is biased at −0.7 V to induce a P+ region in the source. The PNPN structure introduces a local minimum on the conduction band edge curve at the tunneling junction, which dramatically reduces the tunneling width. Furthermore, we show that incorporating the DMG architecture further enhances the drive current and improves the subthreshold slope (SS) characteristics by introducing an additional electric field peak. The numerical simulation reveals that the electrically doped PNPN TFET using DMG improves the DC and analog/RF performances in comparison to a conventional single-material gate (SMG) device. Full article
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21 pages, 20950 KB  
Article
Modeling and Simulation of a TFET-Based Label-Free Biosensor with Enhanced Sensitivity
by Sagarika Choudhury, Krishna Lal Baishnab, Koushik Guha, Zoran Jakšić, Olga Jakšić and Jacopo Iannacci
Chemosensors 2023, 11(5), 312; https://doi.org/10.3390/chemosensors11050312 - 22 May 2023
Cited by 21 | Viewed by 4565
Abstract
This study discusses the use of a triple material gate (TMG) junctionless tunnel field-effect transistor (JLTFET) as a biosensor to identify different protein molecules. Among the plethora of existing types of biosensors, FET/TFET-based devices are fully compatible with conventional integrated circuits. JLTFETs are [...] Read more.
This study discusses the use of a triple material gate (TMG) junctionless tunnel field-effect transistor (JLTFET) as a biosensor to identify different protein molecules. Among the plethora of existing types of biosensors, FET/TFET-based devices are fully compatible with conventional integrated circuits. JLTFETs are preferred over TFETs and JLFETs because of their ease of fabrication and superior biosensing performance. Biomolecules are trapped by cavities etched across the gates. An analytical mathematical model of a TMG asymmetrical hetero-dielectric JLTFET biosensor is derived here for the first time. The TCAD simulator is used to examine the performance of a dielectrically modulated label-free biosensor. The voltage and current sensitivity of the device and the effects of the cavity size, bioanalyte electric charge, fill factor, and location on the performance of the biosensor are also investigated. The relative current sensitivity of the biosensor is found to be about 1013. Besides showing an enhanced sensitivity compared with other FET- and TFET-based biosensors, the device proves itself convenient for low-power applications, thus opening up numerous directions for future research and applications. Full article
(This article belongs to the Special Issue State-of-the-Art (Bio)chemical Sensors—Celebrating 10th Anniversary)
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13 pages, 2161 KB  
Article
Performance Assessment of a Junctionless Heterostructure Tunnel FET Biosensor Using Dual Material Gate
by Haiwu Xie and Hongxia Liu
Micromachines 2023, 14(4), 805; https://doi.org/10.3390/mi14040805 - 31 Mar 2023
Cited by 17 | Viewed by 2721
Abstract
Biosensors based on tunnel FET for label-free detection in which a nanogap is introduced under gate electrode to electrically sense the characteristics of biomolecules, have been studied widely in recent years. In this paper, a new type of heterostructure junctionless tunnel FET biosensor [...] Read more.
Biosensors based on tunnel FET for label-free detection in which a nanogap is introduced under gate electrode to electrically sense the characteristics of biomolecules, have been studied widely in recent years. In this paper, a new type of heterostructure junctionless tunnel FET biosensor with an embedded nanogap is proposed, in which the control gate consists of two parts, namely the tunnel gate and auxiliary gate, with different work functions; and the detection sensitivity of different biomolecules can be controlled and adjusted by the two gates. Further, a polar gate is introduced above the source region, and a P+ source is formed by the charge plasma concept by selecting appropriate work functions for the polar gate. The variation of sensitivity with different control gate and polar gate work functions is explored. Neutral and charged biomolecules are considered to simulate device-level gate effects, and the influence of different dielectric constants on sensitivity is also researched. The simulation results show that the switch ratio of the proposed biosensor can reach 109, the maximum current sensitivity is 6.91 × 102, and the maximum sensitivity of the average subthreshold swing (SS) is 0.62. Full article
(This article belongs to the Section D1: Semiconductor Devices)
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9 pages, 2817 KB  
Article
Modeling and Simulation Investigation of Ferroelectric-Based Electrostatic Doping for Tunnelling Field-Effect Transistor
by Dong Wang, Hongxia Liu, Hao Zhang, Ming Cai and Jinfu Lin
Micromachines 2023, 14(3), 672; https://doi.org/10.3390/mi14030672 - 17 Mar 2023
Cited by 5 | Viewed by 3009
Abstract
In this paper, a novel ferroelectric-based electrostatic doping (Fe-ED) nanosheet tunneling field-effect transistor (TFET) is proposed and analyzed using technology computer-aided design (TCAD) Sentaurus simulation software. By inserting a ferroelectric film into the polarity gate, the electrons and holes are induced in an [...] Read more.
In this paper, a novel ferroelectric-based electrostatic doping (Fe-ED) nanosheet tunneling field-effect transistor (TFET) is proposed and analyzed using technology computer-aided design (TCAD) Sentaurus simulation software. By inserting a ferroelectric film into the polarity gate, the electrons and holes are induced in an intrinsic silicon film to create the p-source and the n-drain regions, respectively. Device performance is largely independent of the chemical doping profile, potentially freeing it from issues related to abrupt junctions, dopant variability, and solid solubility. An improved ON-state current and ION/IOFF ratio have been demonstrated in a 3D-calibrated simulation, and the Fe-ED NSTFET’s on-state current has increased significantly. According to our study, Fe-ED can be used in versatile reconfigurable nanoscale transistors as well as highly integrated circuits as an effective doping strategy. Full article
(This article belongs to the Section D1: Semiconductor Devices)
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