Extreme Ultraviolet and X-ray Optics for Plasma Diagnostics: Systems and Technologies
A special issue of Photonics (ISSN 2304-6732).
Deadline for manuscript submissions: closed (20 August 2023) | Viewed by 5243
Special Issue Editors
Interests: X-ray imaging optics; plasma diagnostics
Special Issue Information
Dear Colleagues,
Extreme ultraviolet (EUV) and soft X-rays are important information carriers for laser-driven, heavy-ion-driven, Z-pinch, and other inertial confinement fusion and magnetic-confinement fusion experiments. The key data of plasma evolution play an important role in deeply understanding the important physical laws of the fusion process and revealing key physical problems. EUV and soft X-ray optical systems and technologies are important tools for plasma diagnostics. The collaborative application of normal incidence, grazing incidence reflection, spectroscopic devices (such as transmission optical structures, multilayers, crystals, and zone plates), and time-resolved recording devices (such as framing cameras and streak cameras), as well as the exploration of new methods, technologies, and systems, have become an important research direction for precision extreme ultraviolet and X-ray diagnostics.
This Special Issue plans to provide an overview of recent advances in high-performance extreme ultraviolet and soft X-ray optical systems and their applications in different fields.
This Special Issue focuses on the new structural design, device development and exploration of new diagnostic methods, technologies and systems for EUV and soft X-ray optics for plasma diagnostics. Potential topics include, but are not limited to:
- EUV and soft X-ray imaging system;
- EUV and soft X-ray spectroscopy element and system;
- High time-resolved EUV and soft X-ray measurement device;
- EUV and soft X-ray diagnostic techniques in inertial confinement fusion;
- EUV and soft X-ray diagnostic techniques in magnetic confinement fusion;
- Key EUV and soft X-ray optical elements for plasma diagnostics;
- Novel optical structures for EUV and soft X-ray imaging or spectroscopy;
- Key technologies in EUV and soft X-ray optics development.
Dr. Shengzhen Yi
Dr. Wei Wang
Guest Editors
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Keywords
- EUV and X-ray microscopy
- plasma diagnostics
- high resolution
- X-ray bent-crystal optics
- spectral resolution
- time-resolved detector
- grazing incidence optics
- X-ray multilayers elements
- X-ray diagnostics
- inertial confinement fusion
- magnetic confinement fusion
- EUV and X-ray optics for synchrotron radiation
- diagnostics technology by EUV or X-ray optics
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