Special Issue "Nanometrology"
A special issue of Nanomaterials (ISSN 2079-4991).
Deadline for manuscript submissions: closed (30 September 2021) | Viewed by 6112
Thanks to advances in nanoscience and nanotechnology and increasing use of their research outputs in real products, there is an increasing need for reliable measurement techniques. Nanometrology is a rapidly evolving area of measurement focusing on characterization of nanostructures and nanomaterials. It includes a wide variety of analytical methods that can be applied to samples used in nanotechnology, typically being based on methods that have very high spatial resolution and can measure local physical quantities or chemical composition. A key aspect of nanometrology is to make these measurements reliable and metrologically traceable. This is a challenge in many areas as the measurement methods often represent state-of-the-art in sensing, and establishing metrological traceability can be a very complex task. As nanomaterials are one of the key scientific areas and products of nanoscience and nanotechnology and as many of the nanometrology methods are therefore focused on them, I am pleased to announce this Special Issue of Nanomaterials concentrating on this topic.
Dr. Petr Klapetek
Manuscript Submission Information
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- Dimensional and other physical parameters measurements in nanoscience and nanotechnology
- Analytical methods with nanoscale resolution
- Emerging measurement techniques
- Analysis of nanoparticles and nanocomposites
- Metrological traceability at nanoscale