Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy
Richert, D.; Morán-Meza, J.; Kaja, K.; Delvallée, A.; Allal, D.; Gautier, B.; Piquemal, F. Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy. Nanomaterials 2021, 11, 3104. https://doi.org/10.3390/nano11113104
Richert D, Morán-Meza J, Kaja K, Delvallée A, Allal D, Gautier B, Piquemal F. Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy. Nanomaterials. 2021; 11(11):3104. https://doi.org/10.3390/nano11113104
Chicago/Turabian StyleRichert, Damien, José Morán-Meza, Khaled Kaja, Alexandra Delvallée, Djamel Allal, Brice Gautier, and François Piquemal. 2021. "Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy" Nanomaterials 11, no. 11: 3104. https://doi.org/10.3390/nano11113104