Heterogeneous Integration Technology for More Moore

A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Nanoelectronics, Nanosensors and Devices".

Deadline for manuscript submissions: closed (20 February 2025) | Viewed by 1882

Special Issue Editors


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Guest Editor
Department of Electrical Engineering, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong, China
Interests: CMOS integrated circuits; high-k dielectric thin films; nanoelectronics; semiconductor device models; MOSFET; approximation theory; ballistic transport; circuit optimization; electrostatics; elemental semiconductors; field effect transistors; nanowires; numerical analysis; sensitivity; silicon; surface potential; surface roughness; silicon compounds; dielectric thin films; tunnelling; interface states; X-ray photoelectron spectra; electron traps; hafnium compounds; SPICE
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Guest Editor
Hubei Jiu Feng Shan Laboratory, Wuhan 430074, China
Interests: silicon-based semiconductor device and MEMS device technology; silicon optical process device technology; wide band gap compound semiconductor epitaxy and device technology; advanced packaging technology

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Guest Editor
Hubei Jiu Feng Shan Laboratory, Wuhan 430074, China
Interests: wafer bonding technology and heterogeneous integration technology; silicon-based optoelectronic integration; 3D integration and advanced packaging; gate dielectric engineering of MOS devices and novel memory devices and integration technology.

Special Issue Information

Dear Colleagues,

Over the past few decades, the CMOS transistor technology has relentlessly progressed towards the realms of 3 nm and 2 nm nodes, adhering to the guiding principles of Moore's Law. However, as Moore’s Law approaches its theoretical limits amidst the burgeoning demands of applications such as AI for memory, 5G, and the Internet of Things (IoT), the pursuit of multi-functionality, high-density integration, reduced form factor, and weight, low power consumption, large bandwidth, and low latency in electronic information systems has become increasingly urgent. To propel the evolution of high-performance computing chips and diverse functional chips, the global landscape has witnessed the emergence of numerous innovative processes, novel devices, and advanced chip technologies in recent years. These include heterogeneous integration technology, Chiplet technology, 3D stacking integration technology, wide-bandgap and ultra-wide-bandgap semiconductor material devices and chips, photonic devices, hybrid optoelectronic devices, 2D material-based devices, flexible optoelectronic/microelectronic devices, quantum computing devices, neuromorphic devices, etc. Through heterogeneous integration technology, the integration of devices and chips made from diverse materials (e.g., compound semiconductor materials, 2D materials, organic materials), various dimensions, different fabrication processes nodes, and multiple functionalities onto silicon-based CMOS integrated circuit chips can take advantage of the unique strengths of each material and device, thereby maximizing the functionality and performance of the heterogeneous integrated chips. The advancement of heterogeneous integration technology would propel the overall integrated system from planar integration towards three-dimensional integration, further enabling the realization of complex and high-performance electronic information integrated systems composed of compound semiconductor devices, RF devices, power devices, MEMS sensors, and more. Also, it will bring about a new revolution in integrated circuits, microelectronics, and optoelectronics.

Follow the success of previous special issues: Abridging the CMOS Technology (https://www.mdpi.com/2079-4991/12/23/4245) and Abridging the CMOS Technology II (https://www.mdpi.com/2079-4991/14/11/897), this Special Issue focuses on the physics and technology of heterogeneous integration of advanced technology and devices with silicon technology. It serves as a forum for multidisciplinary experts to address various aspects of recent advancements in nanomaterials, nanotechnology and other novel processes that could help in the further advancements of CMOS technology. The format of articles includes full papers, communications, and reviews. Topics include, but are not limited to:

  • Heterogeneous integration of nanomaterials on a silicon substrate;
  • Heterogeneous integration of advanced functional micro/nano modules and devices, such as photonic chips, power devices, radio-frequency devices, 2D chips, quantum computing chips, neuromorphic chips, etc.;
  • Novel heterogeneous integration technology and process for micro/nanoelectronic devices, such as heteroepitaxy, smart-cut technology, wafer-level bonding technology, die-to-wafer bonding technology, and Chiplet technology;
  • Interconnects technology for heterogeneous 3D integration for micro/nanoelectronic devices: 3D stacking process technology, interconnect techniques, through silicon via (TSV) technique, silicon interpose technology, application of 2D materials for interconnect and thermal budget mitigation;
  • Characterization and measurement methods for heterogeneous integrated materials, structures, and devices;
  • Modelling and simulation of various aspects of heterogeneous integration technology;
  • Thermal management involving heterogeneous integration technology.

Prof. Dr. Hei Wong
Dr. Jun Liu
Dr. JIeqiong Zhang
Guest Editors

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Keywords

  • heterogeneous integration technology
  • heterogeneous 3D integration
  • silicon substrate
  • micro/nanoelectronic devices
  • wafer bonding technology

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Published Papers (2 papers)

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Research

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14 pages, 26016 KiB  
Article
Electrodeposition of Nanostructured Metals on n-Silicon and Insights into Rhodium Deposition
by Giulio Pappaianni, Francesco Montanari, Marco Bonechi, Giovanni Zangari, Walter Giurlani and Massimo Innocenti
Nanomaterials 2024, 14(24), 2042; https://doi.org/10.3390/nano14242042 - 20 Dec 2024
Viewed by 898
Abstract
In this study, we investigate the electrodeposition of various metals on silicon. Mn, Co, Ni, Ru, Pd, Rh, and Pt were identified as promising candidates for controlled electrodeposition onto silicon. Electrochemical evaluations employing cyclic voltammetry, Scanning Electron Microscopy (SEM) associated with energy-dispersive X-Ray [...] Read more.
In this study, we investigate the electrodeposition of various metals on silicon. Mn, Co, Ni, Ru, Pd, Rh, and Pt were identified as promising candidates for controlled electrodeposition onto silicon. Electrochemical evaluations employing cyclic voltammetry, Scanning Electron Microscopy (SEM) associated with energy-dispersive X-Ray Spectroscopy (SEM-EDS), and X-Ray Photoelectron Spectroscopy (XPS) techniques confirmed the deposition of Pd, Rh, and Pt as nanoparticles. Multi-cycle charge-controlled depositions were subsequently performed to evaluate the possibility of achieving tunable electrodeposition of nanostructured rhodium on n-doped silicon. The procedure increased surface coverage from 9% to 84%, with the average particle size diameter ranging from 57 nm to 168 nm, and with an equivalent thickness of the deposits up to 43.9 nm, varying the number of charge-controlled deposition cycles. The electrodeposition of rhodium on silicon presents numerous opportunities across various scientific and technological domains, driving innovation and enhancing the performance of devices and materials used in catalysis, electronics, solar cells, fuel cells, and sensing. Full article
(This article belongs to the Special Issue Heterogeneous Integration Technology for More Moore)
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Review

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24 pages, 11408 KiB  
Review
Emerging Copper-to-Copper Bonding Techniques: Enabling High-Density Interconnects for Heterogeneous Integration
by Wenhan Bao, Jieqiong Zhang, Hei Wong, Jun Liu and Weidong Li
Nanomaterials 2025, 15(10), 729; https://doi.org/10.3390/nano15100729 - 12 May 2025
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Abstract
As CMOS technology continues to downsize to the nanometer range, the exponential growth predicted by Moore’s Law has been significantly decelerated. Doubling chip density in the two-dimensional domain will no longer be feasible without further device downsizing. Meanwhile, emerging new device technologies, which [...] Read more.
As CMOS technology continues to downsize to the nanometer range, the exponential growth predicted by Moore’s Law has been significantly decelerated. Doubling chip density in the two-dimensional domain will no longer be feasible without further device downsizing. Meanwhile, emerging new device technologies, which may be incompatible with the mainstream CMOS technology, offer potential performance enhancements for system integration and could be options for a More-than-Moore system. Additionally, the explosive growth of artificial intelligence (AI) demands ever-high computing power and energy-efficient computing platforms. Heterogeneous multi-chip integration, which combines diverse components or a larger number of functional blocks with different process technologies and materials into compact 3D systems, has emerged as a critical pathway to overcome the performance limitations of monolithic integrated circuits (ICs), such as limited process/material options, low yield, and multifunctional design complexity. Furthermore, it sustains Moore’s Law progression for a further smaller footprint and higher integration density, and it has become pivotal for “More-than-Moore” strategies in the next CMOS technology revolution. This approach is also crucial for sustaining computational advancements with low-power dissipation and low-latency interconnects in the coming decades. The key techniques for heterogeneous wafer-to-wafer bonding involve both copper-to-copper (Cu-Cu) and dielectric-to-dielectric bonding. This review provides a comprehensive comparison of recent advancements in Cu-Cu bonding techniques. Major issues, such as plasma treatment to activate bonding surfaces, passivation to suppress oxidation, Cu geometry, and microstructure optimization to enhance interface diffusion and regrowth, and the use of polymers as dielectrics to mitigate contamination and wafer warpage, as well as pitch size scaling, are discussed in detail. Full article
(This article belongs to the Special Issue Heterogeneous Integration Technology for More Moore)
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