Advanced Characterization Techniques in Metallic Materials
A special issue of Metals (ISSN 2075-4701).
Deadline for manuscript submissions: 31 March 2026 | Viewed by 21
Special Issue Editor
Interests: surface analysis; lead-free solders; bearing alloys; material property characterization
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The rapid advancement of metallic materials in industries ranging from aerospace to electronics demands increasingly sophisticated characterization techniques to understand their structure–property relationships across multiple length scales. From surface chemistry to bulk microstructure, modern characterization tools such as “X-ray photoelectron spectroscopy (XPS), electron microscopy (SEM/TEM), electron backscatter diffraction (EBSD), and atom probe tomography (APT)” are revolutionizing our ability to probe materials with unprecedented precision. Meanwhile, the integration of artificial intelligence (AI), machine learning (ML), and multi-modal data fusion is transforming raw analytical data into actionable insights, accelerating the discovery and optimization of next-generation metallic materials.
This Special Issue, "Advanced Characterization Techniques in Metallic Materials", aims to highlight cutting-edge developments in experimental methodologies that bridge the gap between atomic-scale surface analysis and macro-scale material performance. We welcome contributions that explore the following:
- Innovative applications of XPS, AES, and TOF-SIMS** in corrosion, catalysis, coatings, and interface engineering.
- Advanced electron and ion microscopy techniques (SEM, TEM, FIB-SEM, and APT) for defect, phase, and grain boundary analysis.
- In situ and operando characterization under thermal, mechanical, or electrochemical stimuli.
- Data-driven approaches, including AI-assisted spectral interpretation, multi-technique correlative microscopy, and high-throughput characterization.
- Case studies linking microstructural evolution to mechanical, electrical, or functional properties in alloys, composites, and additive-manufactured metals.
We encourage submissions that emphasize methodological advancements, interdisciplinary approaches, and industrial applications, particularly those addressing challenges in materials design, processing, and failure analysis. Both original research articles and comprehensive reviews are welcome.
By bringing together experts in characterization science and materials engineering, this Special Issue seeks to establish a roadmap for future innovations in metallic materials analysis.
We look forward to your contributions.
Dr. Wenchao Yang
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metals is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- X-ray photoelectron spectroscopy (XPS)
- multiscale characterization
- metallic materials
- electron microscopy (SEM/TEM)
- in situ characterization
- artificial intelligence (AI) in materials science
- surface and interface analysis
- additive manufacturing characterization
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