Special Issue "Deposition and Characterization of Thin Metallic- and Semiconductor-Based Films"
Deadline for manuscript submissions: closed (31 December 2020).
The production of thin films and their efficient characterization is continually growing research topic. Thin films, especially the nanostructured ones, show many interesting effects because of their strongly reduced size, and they have numerous important ongoing and potential applications.
The aim of this Issue is to provide insight into the recent development of techniques for the preparation and characterization of thin films. Especially interesting are the techniques enabling the self-assembled growth of regularly ordered nanostructures, complex nano-objects like core/shell nanoparticles or nanowires, as well as all types of thin films with some interesting properties and/or applications. Another focus of this Issue concerns the modern techniques for the efficient characterization of the thin films’ properties. Grazing incidence X-ray based techniques are welcomed, as well all others techniques sensitive to the close-to-the-surface area of the material. Techniques for the characterization of the optical and electrical properties of the thin films are of high interest as well.
Dr. Maja Mičetić
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
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Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
- Deposition of semiconductor- and metallic-based thin films
- thin film characterization