Reliability of Power Electronics Devices and Converter Systems
A special issue of Energies (ISSN 1996-1073). This special issue belongs to the section "F3: Power Electronics".
Deadline for manuscript submissions: 31 July 2025 | Viewed by 3869
Special Issue Editors
Interests: power semiconductor devices and applications (including design, characterization, modeling, reliability, gate driver, converter control and topology)
Interests: power electronics reliability
Interests: advanced driving; condition monitoring; packaging; characterization of power semiconductor devices
Interests: modeling of PV module and PV system; failure mechanisms of PV module; fault diagnosis; intelligent maintenance of PV systems; PV fed microgrids
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Special Issue Information
Dear Colleagues,
Power electronics, such as renewable energy generation systems, electric vehicles, and smart grids, are key in energy conversion and management. However, industrial experience indicates that the power converter is one of the weakest components in the system. Thus, there is a pressing need to improve the reliability of power converters and reduce the system downtime induced by the failure of power converters. The failure mechanism, thermal network model, junction temperature estimation, lifetime prediction, condition monitoring, and power electronics system thermal control become increasingly important. This Special Issue aims to present and disseminate the most recent advances related to the reliability of power electronics systems. Topics of interest for publication include, but are not limited to:
1 Failure and degradation mechanism of power devices and converters;
2 Testing methodologies, techniques, and platforms design for power devices and converters;
3 Junction temperature estimation and thermal management of power devices and converters;
4 Packaging and modeling of advanced semiconductor power devices, such as SiC, GaN, and Ga2O3;
5 Condition monitoring, fault detection, and diagnosis of power devices and converters;
6 Gate drivers and artificial intelligence-driven reliability enhancement methodology of power device and converters;
7 Digital twin modeling of power electronic converters and components.
Prof. Dr. Jun Wang
Dr. Jun Zhang
Dr. Kun Tan
Dr. Jingwei Zhang
Dr. Hengyu Yu
Guest Editors
Manuscript Submission Information
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Keywords
- power device
- power converter
- reliability
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