Reliability of Power Electronics Devices and Converter Systems: 2nd Edition
A special issue of Energies (ISSN 1996-1073). This special issue belongs to the section "F3: Power Electronics".
Deadline for manuscript submissions: 20 January 2026 | Viewed by 301
Special Issue Editors
Interests: power semiconductor devices and applications (including design, characterization, modeling, reliability, gate driver, converter control and topology)
Special Issues, Collections and Topics in MDPI journals
Interests: power electronics reliability
Special Issues, Collections and Topics in MDPI journals
Interests: advanced driving; condition monitoring; packaging; characterization of power semiconductor devices
Special Issues, Collections and Topics in MDPI journals
Interests: modeling of PV module and PV system; failure mechanisms of PV module; fault diagnosis; intelligent maintenance of PV systems; PV fed microgrids
Special Issues, Collections and Topics in MDPI journals
Interests: reliability and ruggedness of advanced semiconductor power devices; health state monitoring technologies; applications in power electronic systems
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Power electronics play a key role in energy conversion and management, being prominent in renewable energy generation systems, electric vehicles, smart grids, etc. However, industrial experience indicates that the power converter is one of the weakest components in the system. Thus, there is a pressing need to improve the reliability of power converters and reduce the system downtime induced by the failure of power converters. The failure mechanism, thermal network model, junction temperature estimation, lifetime prediction, condition monitoring, and thermal control of power electronics systems have become increasingly important. This Special Issue aims to present and disseminate the most recent advances related to the reliability of power electronics system. Topics of interest for publication include, but are not limited to, the following:
1) Failure and degradation mechanism of power devices and converters;
2) Testing methodologies, techniques, and platforms design for power devices and converters;
3) Junction temperature estimation and thermal management of power devices and converters;
4) Packaging and modeling of advanced semiconductor power devices, such as SiC, GaN, Ga2O3, etc;
5) Condition monitoring, fault detection, and diagnosis of power device and converters;
6) Gate drivers and artificial intelligence-driven reliability enhancement methodology of power device and converters;
7) Digital twin modeling of power electronic converters and components.
Prof. Dr. Jun Wang
Dr. Jun Zhang
Dr. Kun Tan
Dr. Jingwei Zhang
Dr. Hengyu Yu
Guest Editors
Manuscript Submission Information
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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Energies is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- power device
- power converter
- reliability
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