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Electronics
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Efficiency- and Reliability-Oriented Design of Power Electronic Devices, Converters, and...
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Efficiency- and Reliability-Oriented Design of Power Electronic Devices, Converters, and Systems

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Power Electronics".

Deadline for manuscript submissions: 20 October 2025 | Viewed by 526

Special Issue Editor

Dr. Chaochao Song

E-Mail Website
Guest Editor
Energy Technology, Aalborg University, Aalborg 9100, Denmark
Interests: optimal control of power electronic converters; dual-active-bridge (DAB) converters; multilevel converters; digital twin modeling of power electronic converters

Special Issue Information

Dear Colleagues,

Efficiency and reliability are two major issues of power electronic devices, converters, and systems that strongly affect their long-term stable, efficient, and robust operation. Therefore, efficiency- and reliability-oriented design is a crucial research topic in a variety of areas, including modeling, assessment, control, hardware design, and prototype demonstration. This Special Issue aims to reveal the current research, challenges, and prospects related to the efficiency- and reliability-oriented design of power electronics. Topics that will be covered include, but are not limited to, the following:

  • The modeling, simulation, and assessment of the efficiency and reliability of power components, converters, and systems.
  • Control strategies to improve the efficiency of power electronic converters and systems.
  • Control strategies to enhance reliability such as voltage and current stress mitigation, power loss and thermal balancing, fault tolerance, and so on.
  • Optimal hardware design such as power device selection, topology improvement, protection systems, and so on.
  • Prototype demonstration with efficiency- and reliability-oriented design.
  • State-of-the-art reviews on efficiency- and reliability-oriented design.

Dr. Chaochao Song
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • power electronics
  • efficiency
  • reliability
  • optimal control
  • hardware design

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Published Papers (1 paper)

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Research

21 pages, 2388 KiB  
Article
MTBF-PoL Reliability Evaluation and Comparison Using Prediction Standard MIL-HDBK-217F vs. SN 29500
by Dan Butnicu and Gabriel Bonteanu
Electronics 2025, 14(13), 2538; https://doi.org/10.3390/electronics14132538 - 23 Jun 2025
Viewed by 366
Abstract
In the design of military, automotive, medical, space, and professional equipment, it is essential to demonstrate that devices can operate for a specific duration with a given level of confidence. Reliability must be considered in the design process, which can involve component selection, [...] Read more.
In the design of military, automotive, medical, space, and professional equipment, it is essential to demonstrate that devices can operate for a specific duration with a given level of confidence. Reliability must be considered in the design process, which can involve component selection, component testing, and mitigation techniques such as redundancy and forward error correction (FEC). In modern DC–DC converters, a higher level of reliability is now a mandatory requirement—the ISO 26262, for example, acts as the guidance to provide the appropriate standardized requirements, processes and risk based approach, and it determines integrity levels (known as automotive safety integrity levels or ASILs). The purpose is to reduce risks caused by systematic and random failures to an appropriate level of acceptance. Since the release of MIL-HDBK-217F Notice 2 in 1995, newer standards for predicting failure rates have emerged in the electronic systems reliability market. These updated standards were introduced to address the limitations of the older standards, particularly in relation to advanced component technologies. Numerous studies have shown that the output capacitor bank is one of the most critical components concerning reliability. This work focuses on calculating the failure rates of an output capacitor bank and a MOSFET transistor pair used in a high-current, low-voltage buck converter. The failure rates are calculated using both the latest prediction standard, SN 29500, and the previous MIL-HDBK standard. This comparison serves as a valuable tool for selecting the output capacitor during the early stages of design. Both simulations and experimental setups were employed to measure the temperatures of the components. The SN 29500 standard is particularly beneficial for components operating in harsh environments, as it provides up-to-date failure rate data and stress models. The environmental conditions for the components were defined using a standard point of load (PoL) buck converter for both calculation methods. Results are compared by considering the impact of component temperature and by applying specific parameters such as reference and operating conditions. This kind of comparison is useful for circuit designers, especially in the field of Power electronics when the concept of designing with reliability in mind is adopted. Full article
(This article belongs to the Special Issue Efficiency- and Reliability-Oriented Design of Power Electronic Devices, Converters, and Systems)
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