Special Issue "Progress in the Characterization of Metal, Dielectric and Semiconducting Optical Thin Films and Coatings"
Deadline for manuscript submissions: 31 December 2021.
Interests: theory and modelling of optical coatings
We would like to invite you to submit your work to a Special Issue on “Progress in the Characterization of Metal, Dielectric and Semiconducting Optical Thin Films and Coatings”. Here, thin film and coating characterization is understood as all experimental and theoretical activities that pursue the determination of construction parameters of a coating under investigation. Thus, the characterization of a typical thin film sample could include the clarification of its geometrical construction parameters (surface roughness or film thickness), and typical macroscopic material parameters like optical constants, porosity, average stoichiometry, or density. At a deeper analytical level, it is also the clarification of the crystallinity, energy band structure, internal path length or response times of charge carriers in a sample, which gives us a key to understanding the specifics of light–matter interactions defining the particular optical properties of the investigated sample.
Thin inorganic and organic solid films and their characterization are relevant in semiconductor physics, solar cell development, physical chemistry, optoelectronics, and optical coatings development, to give just a few examples. Growing demands on the performance of optical coatings result in the need for the development and improvement of versatile and accurate coating characterization techniques.
The aim of this Special Issue is to provide a snapshot of the state-of-the-art in optical coating characterization from the extreme ultraviolet (EUV) down to the Terahertz (THz) spectral regions, including metal, semiconducting and dielectric coatings.
In particular, the topics of interest include, but are not limited to
- Advances in optical coating characterization techniques, including both ex situ and in situ characterization approaches
- Progress in non-optical characterization techniques
- Hard- and software developments relevant to coating characterization
- Measurement of coating properties, reverse search procedures
- Modelling of coating properties, including ultrathin coatings and island films
- Structure–property relations
- Non-linear optical properties of coatings
- Characterization of coatings for ultrafast optical spectroscopy
Dr. Olaf Stenzel
Dr. Steffen Wilbrandt
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Coatings is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1800 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.