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Open AccessArticle
Integrated Hardware and Algorithmic Decoupling of Light-Noise-Attenuation Coupled Errors: A Path to 50 Pa Precision in Micro-Pressure PSP Measurements
by
Kun Cao
Kun Cao
,
Qiang Liu
Qiang Liu
Chunhua Wei
Chunhua Wei
Yunmao Bai
Yunmao Bai
Lei Liang
Lei Liang
China Aerodynamics Research and Development Center, Mianyang 621000, China
*
Authors to whom correspondence should be addressed.
Aerospace 2025, 12(10), 929; https://doi.org/10.3390/aerospace12100929 (registering DOI)
Submission received: 18 August 2025
/
Revised: 20 September 2025
/
Accepted: 28 September 2025
/
Published: 15 October 2025
Abstract
In low-speed flow (Ma < 0.3), pressure-sensitive paint (PSP) technology encounters a significant bottleneck in micro-pressure measurements due to the coupled interference of light source instability, camera noise, and paint photodegradation. This study introduces a hardware–algorithm collaborative decoupling framework to address the light noise–degradation coupling issue. The framework integrates real-time light source fluctuation monitoring using a photomultiplier tube (PMT), a combined histogram–wavelet denoising algorithm, and a dynamic photodegradation compensation model. A high-precision static calibration system with a pressure control error of 3.4 Pa was constructed to validate the proposed framework. The experimental results indicate that light source fluctuations contribute an error of 42.61 Pa, accounting for 33% of the total error. After collaborative optimization, the PSP measurement error was reduced to below 50 Pa, representing a 50% improvement compared to previous results (100 Pa). This study provides reliable technical support for micro-pressure measurement applications, such as low-speed wind tunnel testing of aerospace vehicles and microfluidic diagnostics.
Share and Cite
MDPI and ACS Style
Cao, K.; Liu, Q.; Wei, C.; Bai, Y.; Liang, L.
Integrated Hardware and Algorithmic Decoupling of Light-Noise-Attenuation Coupled Errors: A Path to 50 Pa Precision in Micro-Pressure PSP Measurements. Aerospace 2025, 12, 929.
https://doi.org/10.3390/aerospace12100929
AMA Style
Cao K, Liu Q, Wei C, Bai Y, Liang L.
Integrated Hardware and Algorithmic Decoupling of Light-Noise-Attenuation Coupled Errors: A Path to 50 Pa Precision in Micro-Pressure PSP Measurements. Aerospace. 2025; 12(10):929.
https://doi.org/10.3390/aerospace12100929
Chicago/Turabian Style
Cao, Kun, Qiang Liu, Chunhua Wei, Yunmao Bai, and Lei Liang.
2025. "Integrated Hardware and Algorithmic Decoupling of Light-Noise-Attenuation Coupled Errors: A Path to 50 Pa Precision in Micro-Pressure PSP Measurements" Aerospace 12, no. 10: 929.
https://doi.org/10.3390/aerospace12100929
APA Style
Cao, K., Liu, Q., Wei, C., Bai, Y., & Liang, L.
(2025). Integrated Hardware and Algorithmic Decoupling of Light-Noise-Attenuation Coupled Errors: A Path to 50 Pa Precision in Micro-Pressure PSP Measurements. Aerospace, 12(10), 929.
https://doi.org/10.3390/aerospace12100929
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