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Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode

1
Flinders Institute for NanoScale Science and Technology, College of Science and Engineering, Flinders University, Bedford Park, SA 5042, Australia
2
Adelaide Microscopy, The University of Adelaide, Adelaide, SA 5005, Australia
3
Department of Chemistry, The University of Adelaide, Adelaide, SA 5005, Australia
4
Australian Institute for Bioengineering and Nanotechnology, The University of Queensland, Brisbane, QLD 4072, Australia
5
Department of Biochemistry and Molecular Biology, Bio21 Institute, University of Melbourne, Melbourne, VIC 3010, Australia
*
Authors to whom correspondence should be addressed.
Nanomaterials 2018, 8(10), 807; https://doi.org/10.3390/nano8100807
Received: 6 September 2018 / Revised: 24 September 2018 / Accepted: 6 October 2018 / Published: 9 October 2018
(This article belongs to the Special Issue Applications of Carbon Nanotubes)
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Abstract

In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition to stable operation, the PFT mode is shown to eliminate “ringing” artefacts that often affect CNT-AFM probes in tapping mode near steep vertical step edges. This will allow for the characterization of high aspect ratio structures using CNT-AFM probes, an exercise which has previously been challenging with the standard tapping mode. View Full-Text
Keywords: carbon nanotubes; atomic force microscope tips; tapping mode; PeakForce tapping mode; imaging artefacts carbon nanotubes; atomic force microscope tips; tapping mode; PeakForce tapping mode; imaging artefacts
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
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Slattery, A.D.; Shearer, C.J.; Shapter, J.G.; Blanch, A.J.; Quinton, J.S.; Gibson, C.T. Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode. Nanomaterials 2018, 8, 807.

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