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Open AccessArticle

Selection of Optimal Path Control Algorithms for Probe Heads Used on Five-Axis Measuring Systems

Laboratory of Coordinate Metrology, Cracow University of Technology, 31-155 Kraków, Poland
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Author to whom correspondence should be addressed.
Appl. Sci. 2018, 8(12), 2455; https://doi.org/10.3390/app8122455
Received: 30 October 2018 / Revised: 19 November 2018 / Accepted: 22 November 2018 / Published: 2 December 2018
(This article belongs to the Special Issue Precision Dimensional Measurements)
The utilization of rotational movements of a probing system during points measurements
contributes to the reduction of measurement duration and increases measurement repeatability.
However, knowledge on such behavior and accuracy of probing systems is still unsatisfactory.
Machines combined with articulating probing systems that have the ability of continuous indexation
become redundant systems, which means that the same points can be measured using almost infinite
mutual configurations of the machine and probe stylus orientations. Therefore, the proper selection
of inspection path planning method becomes one of the main factors affecting the accuracy of the
measurement. It is possible to assess the impact of this factor on the accuracy of the measurement
by comparing the results of the measurements of gauge elements, which are done using different
path controlling algorithms. After that, the best method for basic measuring tasks can be chosen
in order to reduce measurement errors. Measurements of the multi-feature check gauge, using the
default method for path planning and those chosen on the basis of described experiments, indicates
that the improvement of accuracy may reach several microns. Results presented in this paper can be
directly transferred to similar systems and measuring tasks, which are commonly met in industrial
and scientific practice. View Full-Text
Keywords: five-axis system; CMM; dimensional measurements; inspection planning; accuracy five-axis system; CMM; dimensional measurements; inspection planning; accuracy
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MDPI and ACS Style

Gąska, A.; Gąska, P.; Gruza, M.; Sładek, J. Selection of Optimal Path Control Algorithms for Probe Heads Used on Five-Axis Measuring Systems. Appl. Sci. 2018, 8, 2455.

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