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Comparative Study of Square and Circular Loop Frequency Selective Surfaces for Millimeter-Wave Imaging Diagnostics Systems

School of Electronics Engineering, Kyungpook National University, 80 Daehak-ro, Buk-gu, Daegu 41566, Korea
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Sensors 2018, 18(9), 3079; https://doi.org/10.3390/s18093079
Received: 25 July 2018 / Revised: 16 August 2018 / Accepted: 10 September 2018 / Published: 13 September 2018
(This article belongs to the Special Issue Sensors for Microwave Imaging and Detection)
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Abstract

A design method of large-sized square-loop and circular-loop frequency selective surface (FSS) filters for protection of mm-wave imagining receivers is presented. Due to fine cell structure requirements, the performance of the FSS structures at mm-wave frequencies can be significantly affected by fabrication tolerances, especially involved with large-size panel fabrication. Through a comprehensive parametric variation study on the performance of square-loop and circular-loop FSS structures, it is found that the circular-loop FSS structure performs much less sensitively to the fabrication tolerances, thereby producing better and consistent performances with given design values. As a design example, square-loop and circular-loop notch filters resonating at 105 GHz were designed and the performances were evaluated with multiple prototypes. The resonant frequencies of the implemented circular-loop FSS filters deviated by only about 0.5 GHz from the accurate designed value, which can be easily adjusted in the design process. The implemented square-loop and circular loop FSS filters provided low-loss in the pass-band and high rejection of 23 dB at the resonant frequency with good oblique angle performance. View Full-Text
Keywords: frequency selective surface (FSS); millimeter-wave; imaging diagnostics systems; large-size FSS frequency selective surface (FSS); millimeter-wave; imaging diagnostics systems; large-size FSS
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Mohyuddin, W.; Kim, D.H.; Choi, H.C.; Kim, K.W. Comparative Study of Square and Circular Loop Frequency Selective Surfaces for Millimeter-Wave Imaging Diagnostics Systems. Sensors 2018, 18, 3079.

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