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Clustered DNA Damages induced by 0.5 to 30 eV Electrons
Open AccessReview

Reaction of Electrons with DNA: Radiation Damage to Radiosensitization

Department of Chemistry, Oakland University, Rochester, MI 48309, USA
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Int. J. Mol. Sci. 2019, 20(16), 3998; https://doi.org/10.3390/ijms20163998
Received: 11 July 2019 / Revised: 1 August 2019 / Accepted: 12 August 2019 / Published: 16 August 2019
(This article belongs to the Special Issue Radiation-Induced Damage to DNA)
This review article provides a concise overview of electron involvement in DNA radiation damage. The review begins with the various states of radiation-produced electrons: Secondary electrons (SE), low energy electrons (LEE), electrons at near zero kinetic energy in water (quasi-free electrons, (eqf)) electrons in the process of solvation in water (presolvated electrons, epre), and fully solvated electrons (eaq). A current summary of the structure of eaq, and its reactions with DNA-model systems is presented. Theoretical works on reduction potentials of DNA-bases were found to be in agreement with experiments. This review points out the proposed role of LEE-induced frank DNA-strand breaks in ion-beam irradiated DNA. The final section presents radiation-produced electron-mediated site-specific formation of oxidative neutral aminyl radicals from azidonucleosides and the evidence of radiosensitization provided by these aminyl radicals in azidonucleoside-incorporated breast cancer cells. View Full-Text
Keywords: quasi-free electron; solvated electron; low energy electrons; ion-beam radiation; radiosensitization quasi-free electron; solvated electron; low energy electrons; ion-beam radiation; radiosensitization
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Kumar, A.; Becker, D.; Adhikary, A.; Sevilla, M.D. Reaction of Electrons with DNA: Radiation Damage to Radiosensitization. Int. J. Mol. Sci. 2019, 20, 3998.

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