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Keywords = rectifying junction

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21 pages, 5551 KB  
Article
State-Space Modelling of Schottky Diode Rectifiers Including Parasitic and Coupling Effects up to the Terahertz Band
by Martins Aizanabor Odiamenhi, Haleh Jahanbakhsh Basherlou, Chan Hwang See, Naser Ojaroudi Parchin, Keng Goh and Hongnian Yu
Electronics 2025, 14(18), 3718; https://doi.org/10.3390/electronics14183718 - 19 Sep 2025
Viewed by 251
Abstract
A nonlinear state-space model for Schottky diode rectifiers is presented that incorporates junction dynamics, layout parasitic effects, and electromagnetic coupling effects. Unlike prior approaches, the model resolves conduction intervals under harmonic-rich excitation and integrates electromagnetic voltage–current feedback to capture field-induced perturbations at high [...] Read more.
A nonlinear state-space model for Schottky diode rectifiers is presented that incorporates junction dynamics, layout parasitic effects, and electromagnetic coupling effects. Unlike prior approaches, the model resolves conduction intervals under harmonic-rich excitation and integrates electromagnetic voltage–current feedback to capture field-induced perturbations at high frequencies. The framework was validated through the design of a 5.8 GHz rectifier, achieving 62% RF–DC efficiency at −10 dBm into a 500 Ω load, with close agreement between the simulation and measurement. The results confirm the model’s predictive accuracy and its utility for high-efficiency rectenna systems in microwave and terahertz applications. Full article
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15 pages, 3397 KB  
Article
A Compact Model with Self-Heating Effect Applying to the SCR Device for ESD Protection
by Hongkun Wang, Hailian Liang and Junliang Liu
Electronics 2025, 14(5), 843; https://doi.org/10.3390/electronics14050843 - 21 Feb 2025
Cited by 1 | Viewed by 740
Abstract
This work develops a novel compact Silicon-Controlled Rectifier (SCR) model incorporating self-heating effects, extending the conventional Ebers–Moll (E–M) framework for Bipolar Junction Transistors (BJTs) by comprehensively integrating parasitic effects. The temperature dependence of critical device parameters, including junction capacitances, emitter resistances, and saturation [...] Read more.
This work develops a novel compact Silicon-Controlled Rectifier (SCR) model incorporating self-heating effects, extending the conventional Ebers–Moll (E–M) framework for Bipolar Junction Transistors (BJTs) by comprehensively integrating parasitic effects. The temperature dependence of critical device parameters, including junction capacitances, emitter resistances, and saturation currents, is systematically characterized to accurately predict the device’s electrical behavior under Electrostatic Discharge (ESD) stress. Furthermore, a self-heating modeling approach is introduced based on the SCR layout characteristics. The impact of self-heating on SCR transient response was verified by comparing simulation results with measurements from SCR devices fabricated in a 0.18 µm Bipolar-CMOS-DMOS (BCD) process. Comparative analysis demonstrates superior accuracy over existing models. The proposed SCR model includes a complete definition of parameters and electrical relationships, ensuring compatibility with various Electronic Design Automation (EDA) platforms. Full article
(This article belongs to the Section Semiconductor Devices)
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14 pages, 1880 KB  
Article
Trench MOS Schottky Diodes: A Physics-Based Analytical Model Approach to Charge Sharing
by Mohammed Tanvir Quddus, Alvaro D. Latorre-Rey, Zeinab Ramezani and Mihir Mudholkar
Micromachines 2025, 16(1), 90; https://doi.org/10.3390/mi16010090 - 14 Jan 2025
Cited by 1 | Viewed by 1396
Abstract
Trench MOS Barrier Schottky (TMBS) rectifiers offer superior static and dynamic electrical characteristics when compared with planar Schottky rectifiers for a given active die size. The unique structure of TMBS devices allows for efficient manipulation of the electric field, enabling higher doping concentrations [...] Read more.
Trench MOS Barrier Schottky (TMBS) rectifiers offer superior static and dynamic electrical characteristics when compared with planar Schottky rectifiers for a given active die size. The unique structure of TMBS devices allows for efficient manipulation of the electric field, enabling higher doping concentrations in the drift region and thus achieving a lower forward voltage drop (VF) and reduced leakage current (IR) while maintaining high breakdown voltage (BV). While the use of trenches to push electric fields away from the mesa surface is a widely employed concept for vertical power devices, a significant gap exists in the analytical modeling of this effect, with most prior studies relying heavily on computationally intensive numerical simulations. This paper introduces a new physics-based analytical model to elucidate the behavior of electric field and potential in the mesa region of a TMBS rectifier in reverse bias. Our model leverages the concept of shared charge between the Schottky and MOS junctions, capturing how electric field distribution is altered in response to trench geometry and bias conditions. This shared charge approach not only simplifies the analysis of electric field distribution but also reveals key design parameters, such as trench depth, oxide thickness, and doping concentration, that influence device performance. This model employs the concept of shared charge between the vertical Schottky and MOS junction. Additionally, it provides a detailed view of the electric field suppression mechanism in the TMBS device, highlighting the significant effects of the inversion charge on the MOS interface. By comparing our analytical results with TCAD simulations, we demonstrate strong agreement, underscoring the model’s accuracy and its potential to serve as a more accessible alternative to resource-intensive simulations. This work contributes to a valuable tool for TMBS device design, offering insights into electric field management that support high-efficiency, high-voltage applications, including power supplies, automotive electronics, and renewable energy systems. Full article
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10 pages, 1729 KB  
Communication
Band Alignment of Stacked Crystalline Si/GaN pn Heterostructures Interfaced with an Amorphous Region Using X-Ray Photoelectron Spectroscopy
by Kwangeun Kim
Materials 2024, 17(24), 6099; https://doi.org/10.3390/ma17246099 - 13 Dec 2024
Viewed by 1082
Abstract
The energy band alignment of a stacked Si/GaN heterostructure was investigated using X-ray photoelectron spectroscopy (XPS) depth profiling, highlighting the influence of the amorphous interface region on the electronic properties. The crystalline Si/GaN pn heterostructure was formed by stacking a Si nanomembrane onto [...] Read more.
The energy band alignment of a stacked Si/GaN heterostructure was investigated using X-ray photoelectron spectroscopy (XPS) depth profiling, highlighting the influence of the amorphous interface region on the electronic properties. The crystalline Si/GaN pn heterostructure was formed by stacking a Si nanomembrane onto a GaN epi-substrate. The amorphous layer formed at the stacked Si/GaN interface altered the energy band of the stacked heterostructure and affected the injection of charge carriers across the junction interface region. This study revealed the interfacial upward energy band bending of the stacked Si/GaN heterostructure with surface potentials of 0.99 eV for GaN and 1.14 eV for Si, attributed to the formation of the amorphous interface. These findings challenge the conventional electron affinity model by accounting for interfacial bonding effects. Electrical measurements of the stacked Si/GaN pn heterostructure diode exhibited a rectifying behavior, consistent with the XPS-determined energy band alignment. The diode outperformed early design with a low leakage current density of 5 × 10−5 A/cm2 and a small ideality factor of 1.22. This work underscores the critical role of the amorphous interface in determining energy band alignment and provides a robust methodology for optimizing the electronic performance of stacked heterostructures. The XPS-based approach can be extended to analyze and develop multi-layered bipolar devices. Full article
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11 pages, 7658 KB  
Communication
A Self-Biased Triggered Dual-Direction Silicon-Controlled Rectifier Device for Low Supply Voltage Application-Specific Integrated Circuit Electrostatic Discharge Protection
by Jie Pan, Fanyang Li, Liguo Wen, Jiazhen Jin, Xiaolong Huang and Jiaxun Han
Electronics 2024, 13(17), 3458; https://doi.org/10.3390/electronics13173458 - 30 Aug 2024
Cited by 1 | Viewed by 1139
Abstract
A direct bidirectional current discharge path between the input/output (I/O) and ground (GND) is essential for the robust protection of charging device models (CDM) in the tightly constrained design parameters of advanced low-voltage (LV) processes. Dual-direction silicon controlled rectifiers (DDSCRs) serve as ESD [...] Read more.
A direct bidirectional current discharge path between the input/output (I/O) and ground (GND) is essential for the robust protection of charging device models (CDM) in the tightly constrained design parameters of advanced low-voltage (LV) processes. Dual-direction silicon controlled rectifiers (DDSCRs) serve as ESD protection devices with high efficiency unit area discharge, enabling bidirectional electrostatic protection. However, the high trigger voltage of conventional DDSCR makes it unsuitable for ASICs used for the preamplification of biomedical signals, which only operate at low supply voltage. To address this issue, a self-biased triggered DDSCR (STDDSCR) structure is proposed to further reduce the trigger voltage. When the ESD pulse comes, the external RC trigger circuit controls the PMOS turn-on by self-bias, and the current release path is opened in advance to reduce the trigger voltage. As the ESD pulse voltage increases, the SCR loop opens to establish positive feedback and drain the amplified current. Additionally, the junction capacitance is decreased through high-resistance epitaxy and low-concentration P-well injection to further lower the trigger voltage. The simulation results of LTspice and TCAD respectively demonstrate that ESD devices can clamp transient high voltages earlier, with low parasitic capacitance and leakage current suitable for ESD protection of high-speed ports up to 1.5 V under normal operating conditions. Full article
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18 pages, 6598 KB  
Article
Investigations of In2O3 Added SiC Semiconductive Thin Films and Manufacture of a Heterojunction Diode
by Chia-Te Liao, Chia-Yang Kao, Zhi-Ting Su, Yu-Shan Lin, Yi-Wen Wang and Cheng-Fu Yang
Nanomaterials 2024, 14(10), 881; https://doi.org/10.3390/nano14100881 - 19 May 2024
Cited by 2 | Viewed by 1918
Abstract
This study involved direct doping of In2O3 into silicon carbide (SiC) powder, resulting in 8.0 at% In-doped SiC powder. Subsequently, heating at 500 °C was performed to form a target, followed by the utilization of electron beam (e-beam) technology to [...] Read more.
This study involved direct doping of In2O3 into silicon carbide (SiC) powder, resulting in 8.0 at% In-doped SiC powder. Subsequently, heating at 500 °C was performed to form a target, followed by the utilization of electron beam (e-beam) technology to deposit the In-doped SiC thin films with the thickness of approximately 189.8 nm. The first breakthrough of this research was the successful deposition of using e-beam technology. The second breakthrough involved utilizing various tools to analyze the physical and electrical properties of In-doped SiC thin films. Hall effect measurement was used to measure the resistivity, mobility, and carrier concentration and confirm its n-type semiconductor nature. The uniform dispersion of In ions in SiC was as confirmed by electron microscopy energy-dispersive spectroscopy and secondary ion mass spectrometry analyses. The Tauc Plot method was employed to determine the Eg values of pure SiC and In-doped SiC thin films. Semiconductor parameter analyzer was used to measure the conductivity and the I-V characteristics of devices in In-doped SiC thin films. Furthermore, the third finding demonstrated that In2O3-doped SiC thin films exhibited remarkable current density. X-ray photoelectron spectroscopy and Gaussian-resolved spectra further confirmed a significant relationship between conductivity and oxygen vacancy concentration. Lastly, depositing these In-doped SiC thin films onto p-type silicon substrates etched with buffered oxide etchant resulted in the formation of heterojunction p-n junction. This junction exhibited the rectifying characteristics of a diode, with sample current values in the vicinity of 102 mA, breakdown voltage at approximately −5.23 V, and open-circuit voltage around 1.56 V. This underscores the potential of In-doped SiC thin films for various semiconductor devices. Full article
(This article belongs to the Special Issue Advances in Wide-Bandgap Semiconductor Nanomaterials)
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13 pages, 9090 KB  
Article
Design and Simulation of Tunneling Diodes with 2D Insulators for Rectenna Switches
by Evelyn Li, Parameswari Raju and Erhai Zhao
Materials 2024, 17(4), 953; https://doi.org/10.3390/ma17040953 - 19 Feb 2024
Cited by 4 | Viewed by 2511
Abstract
Rectenna is the key component in radio-frequency circuits for receiving and converting electromagnetic waves into direct current. However, it is very challenging for the conventional semiconductor diode switches to rectify high-frequency signals for 6G telecommunication (>100 GHz), medical detection (>THz), and rectenna solar [...] Read more.
Rectenna is the key component in radio-frequency circuits for receiving and converting electromagnetic waves into direct current. However, it is very challenging for the conventional semiconductor diode switches to rectify high-frequency signals for 6G telecommunication (>100 GHz), medical detection (>THz), and rectenna solar cells (optical frequencies). Such a major challenge can be resolved by replacing the conventional semiconductor diodes with tunneling diodes as the rectenna switches. In this work, metal–insulator–metal (MIM) tunneling diodes based on 2D insulating materials were designed, and their performance was evaluated using a comprehensive simulation approach which includes a density-function theory simulation of 2D insulator materials, the modeling of the electrical characteristics of tunneling diodes, and circuit simulation for rectifiers. It is found that novel 2D insulators such as monolayer TiO2 can be obtained by oxidizing sulfur-metal layered materials. The MIM diodes based on such insulators exhibit fast tunneling and excellent current rectifying properties. Such tunneling diodes effectively convert the received high-frequency electromagnetic waves into direct current. Full article
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14 pages, 3152 KB  
Article
Asymmetric Schottky Barrier-Generated MoS2/WTe2 FET Biosensor Based on a Rectified Signal
by Xinhao Zhang, Shuo Chen, Heqi Ma, Tianyu Sun, Xiangyong Cui, Panpan Huo, Baoyuan Man and Cheng Yang
Nanomaterials 2024, 14(2), 226; https://doi.org/10.3390/nano14020226 - 20 Jan 2024
Cited by 7 | Viewed by 2813
Abstract
Field-effect transistor (FET) biosensors can be used to measure the charge information carried by biomolecules. However, insurmountable hysteresis in the long-term and large-range transfer characteristic curve exists and affects the measurements. Noise signal, caused by the interference coefficient of external factors, may destroy [...] Read more.
Field-effect transistor (FET) biosensors can be used to measure the charge information carried by biomolecules. However, insurmountable hysteresis in the long-term and large-range transfer characteristic curve exists and affects the measurements. Noise signal, caused by the interference coefficient of external factors, may destroy the quantitative analysis of trace targets in complex biological systems. In this report, a “rectified signal” in the output characteristic curve, instead of the “absolute value signal” in the transfer characteristic curve, is obtained and analyzed to solve these problems. The proposed asymmetric Schottky barrier-generated MoS2/WTe2 FET biosensor achieved a 105 rectified signal, sufficient reliability and stability (maintained for 60 days), ultra-sensitive detection (10 aM) of the Down syndrome-related DYRK1A gene, and excellent specificity in base recognition. This biosensor with a response range of 10 aM–100 pM has significant application potential in the screening and rapid diagnosis of Down syndrome. Full article
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12 pages, 13982 KB  
Article
A Novel DTSCR Structure with High Holding Voltage and Enhanced Current Discharge Capability for 28 nm CMOS Technology ESD Protection
by Zeen Han, Shupeng Chen, Hongxia Liu, Shulong Wang, Boyang Ma, Ruibo Chen and Xiaojun Fu
Micromachines 2024, 15(1), 96; https://doi.org/10.3390/mi15010096 - 31 Dec 2023
Viewed by 2229
Abstract
To cope with the much narrower ESD design window in 28 nm CMOS technology, a novel diode-triggered silicon-controlled rectifier with an extra discharge path (EDP-DTSCR) for ESD protection is proposed in this paper. Compared with the traditional DTSCR, the proposed DTSCR has an [...] Read more.
To cope with the much narrower ESD design window in 28 nm CMOS technology, a novel diode-triggered silicon-controlled rectifier with an extra discharge path (EDP-DTSCR) for ESD protection is proposed in this paper. Compared with the traditional DTSCR, the proposed DTSCR has an enhanced current discharge capability that is achieved by creating a slave SCR path in parallel with the master SCR path. Moreover, the improved triggering and holding characteristic can be obtained by the proposed EDP-DTSCR. By sharing the anode emitter junction, a slave SCR path is constructed that is symmetrical to the position of the master SCR path to add an additional ESD discharge path to the EDP-DTSCR. In this way, the current discharge capability of the entire device is obviously improved. The TCAD simulation result shows that the proposed device has a remarkably lower on-resistance compared with the traditional DTSCR and the DTSCR with p-type guard ring (PGR-DTSCR). In addition, it is structurally optimized to further increase the holding voltage and reduce the trigger voltage to improve the anti-latching capability of the device, which is more conducive to the ESD protection window application of 28 nm CMOS technology. Full article
(This article belongs to the Special Issue Memory Devices Based on Two-Dimensional Materials)
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18 pages, 3052 KB  
Article
Ionic Mechanisms of Propagated Repolarization in a One-Dimensional Strand of Human Ventricular Myocyte Model
by Yukiko Himeno, Yixin Zhang, Suzuka Enomoto, Hiroto Nomura, Natsuki Yamamoto, Shotaro Kiyokawa, Mirei Ujihara, Yuttamol Muangkram, Akinori Noma and Akira Amano
Int. J. Mol. Sci. 2023, 24(20), 15378; https://doi.org/10.3390/ijms242015378 - 19 Oct 2023
Cited by 2 | Viewed by 1754
Abstract
Although repolarization has been suggested to propagate in cardiac tissue both theoretically and experimentally, it has been challenging to estimate how and to what extent the propagation of repolarization contributes to relaxation because repolarization only occurs in the course of membrane excitation in [...] Read more.
Although repolarization has been suggested to propagate in cardiac tissue both theoretically and experimentally, it has been challenging to estimate how and to what extent the propagation of repolarization contributes to relaxation because repolarization only occurs in the course of membrane excitation in normal hearts. We established a mathematical model of a 1D strand of 600 myocytes stabilized at an equilibrium potential near the plateau potential level by introducing a sustained component of the late sodium current (INaL). By applying a hyperpolarizing stimulus to a small part of the strand, we succeeded in inducing repolarization which propagated along the strand at a velocity of 1~2 cm/s. The ionic mechanisms responsible for repolarization at the myocyte level, i.e., the deactivation of both the INaL and the L-type calcium current (ICaL), and the activation of the rapid component of delayed rectifier potassium current (IKr) and the inward rectifier potassium channel (IK1), were found to be important for the propagation of repolarization in the myocyte strand. Using an analogy with progressive activation of the sodium current (INa) in the propagation of excitation, regenerative activation of the predominant magnitude of IK1 makes the myocytes at the wave front start repolarization in succession through the electrical coupling via gap junction channels. Full article
(This article belongs to the Special Issue Cardiac Arrhythmia: Molecular Mechanisms and Therapeutic Strategies)
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12 pages, 4493 KB  
Communication
Rational Design of Photocontrolled Rectifier Switches in Single-Molecule Junctions Based on Diarylethene
by Ziye Wu, Peng Cui and Mingsen Deng
Molecules 2023, 28(20), 7158; https://doi.org/10.3390/molecules28207158 - 18 Oct 2023
Cited by 2 | Viewed by 1745
Abstract
The construction of multifunctional, single-molecule nanocircuits to achieve the miniaturization of active electronic devices is a challenging goal in molecular electronics. In this paper, we present an effective strategy for enhancing the multifunctionality and switching performance of diarylethene-based molecular devices, which exhibit photoswitchable [...] Read more.
The construction of multifunctional, single-molecule nanocircuits to achieve the miniaturization of active electronic devices is a challenging goal in molecular electronics. In this paper, we present an effective strategy for enhancing the multifunctionality and switching performance of diarylethene-based molecular devices, which exhibit photoswitchable rectification properties. Through a molecular engineering design, we systematically investigate a series of electron donor/acceptor-substituted diarylethene molecules to modulate the electronic properties and investigate the transport behaviors of the molecular junctions using the non-equilibrium Green’s function combined with the density functional theory. Our results demonstrate that the asymmetric configuration, substituted by both the donor and acceptor on the diarylethene molecule, exhibits the highest switching ratio and rectification ratio. Importantly, this rectification function can be switched on/off through the photoisomerization of the diarylethene unit. These modulations in the transport properties of these molecular junctions with different substituents were obtained with molecule-projected self-consistent Hamiltonian and bias-dependent transmission spectra. Furthermore, the current–voltage characteristics of these molecular junctions can be explained by the molecular energy level structure, showing the significance of energy level regulation. These findings have practical implications for constructing high-performance, multifunctional molecular-integrated circuits. Full article
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25 pages, 12066 KB  
Review
A Review of Power Electronic Devices for Heavy Goods Vehicles Electrification: Performance and Reliability
by Olayiwola Alatise, Arkadeep Deb, Erfan Bashar, Jose Ortiz Gonzalez, Saeed Jahdi and Walid Issa
Energies 2023, 16(11), 4380; https://doi.org/10.3390/en16114380 - 28 May 2023
Cited by 13 | Viewed by 4436
Abstract
This review explores the performance and reliability of power semiconductor devices required to enable the electrification of heavy goods vehicles (HGVs). HGV electrification can be implemented using (i) batteries charged with ultra-rapid DC charging (350 kW and above); (ii) road electrification with overhead [...] Read more.
This review explores the performance and reliability of power semiconductor devices required to enable the electrification of heavy goods vehicles (HGVs). HGV electrification can be implemented using (i) batteries charged with ultra-rapid DC charging (350 kW and above); (ii) road electrification with overhead catenaries supplying power through a pantograph to the HGV powertrain; (iii) hydrogen supplying power to the powertrain through a fuel cell; (iv) any combination of the first three technologies. At the heart of the HGV powertrain is the power converter implemented through power semiconductor devices. Given that the HGV powertrain is rated typically between 500 kW and 1 MW, power devices with voltage ratings between 650 V and 1200 V are required for the off-board/on-board charger’s rectifier and DC-DC converter as well as the powertrain DC-AC traction inverter. The power devices available for HGV electrification at 650 V and 1.2 kV levels are SiC planar MOSFETs, SiC Trench MOSFETs, silicon super-junction MOSFETs, SiC Cascode JFETs, GaN HEMTs, GaN Cascode HEMTs and silicon IGBTs. The MOSFETs can be implemented with anti-parallel SiC Schottky diodes or can rely on their body diodes for third quadrant operation. This review examines the various power semiconductor technologies in terms of losses, electrothermal ruggedness under short circuits, avalanche ruggedness, body diode and conduction performance. Full article
(This article belongs to the Section F3: Power Electronics)
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14 pages, 2883 KB  
Article
Reproducible NiO/Ga2O3 Vertical Rectifiers with Breakdown Voltage >8 kV
by Jian-Sian Li, Hsiao-Hsuan Wan, Chao-Ching Chiang, Xinyi Xia, Timothy Jinsoo Yoo, Honggyu Kim, Fan Ren and Stephen J. Pearton
Crystals 2023, 13(6), 886; https://doi.org/10.3390/cryst13060886 - 28 May 2023
Cited by 23 | Viewed by 4024
Abstract
Optimized vertical heterojunction rectifiers with a diameter of 100 µm, consisting of sputter-deposited p-type NiO forming a p–n junction with thick (10 µm) Ga2O3 drift layers grown by halide vapor phase epitaxy (HVPE) on (001) Sn-doped (1019 cm−3 [...] Read more.
Optimized vertical heterojunction rectifiers with a diameter of 100 µm, consisting of sputter-deposited p-type NiO forming a p–n junction with thick (10 µm) Ga2O3 drift layers grown by halide vapor phase epitaxy (HVPE) on (001) Sn-doped (1019 cm−3) β-Ga2O3 substrates, exhibited breakdown voltages >8 kV over large areas (>1 cm2). The key requirements were low drift layer doping concentrations (<1016 cm3), low power during the NiO deposition to avoid interfacial damage at the heterointerface and formation of a guard ring using extension of the NiO beyond the cathode metal contact. Breakdown still occurred at the contact periphery, suggesting that further optimization of the edge termination could produce even larger breakdown voltages. On-state resistances without substrate thinning were <10 mΩ.cm−2, leading to power figure-of-merits >9 GW.cm−2. The devices showed an almost temperature-independent breakdown to 600 K. These results show the remarkable potential of NiO/Ga2O3 rectifiers for performance beyond the limits of both SiC and GaN. The important points to achieve the excellent performance were: (1) low drift doping concentration, (2) low power during the NiO deposition and (3) formation of a guard ring. Full article
(This article belongs to the Section Inorganic Crystalline Materials)
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11 pages, 5131 KB  
Article
Design of 6 GHz Variable-Gain Low-Noise Amplifier Using Adaptive Bias Circuit for Radar Receiver Front End
by Hyungseok Nam, Dang-An Nguyen, Yanghyun Kim and Chulhun Seo
Electronics 2023, 12(9), 2036; https://doi.org/10.3390/electronics12092036 - 27 Apr 2023
Cited by 1 | Viewed by 2608
Abstract
This paper presents a variable-gain low-noise amplifier (VGLNA) based on an adaptive bias (ADB) circuit for the radar receiver front end. The ADB circuit processes the signal separated by a coupler at the LNA output port. First, the ADB circuit rectifies the coupled [...] Read more.
This paper presents a variable-gain low-noise amplifier (VGLNA) based on an adaptive bias (ADB) circuit for the radar receiver front end. The ADB circuit processes the signal separated by a coupler at the LNA output port. First, the ADB circuit rectifies the coupled signal into positive DC voltage through a rectifier, which is then inverted to control a junction-gate field-effect transistor (JFET). The voltage-controlled current of JFET flows through a voltage-divider network and finally produces the DC biasing voltage for the BJT base termination, which decreases with the increase in the input RF power. The proposed VGLNA operates automatically in high gain at low input power and low gain at high input power, providing a wider dynamic range as compared to the constant-bias counterpart. For validation, a prototype is fabricated and measured at 6 GHz. As observed, the base biasing voltage generated by the ADB circuit is changed from 858 mV to 798 mV as the input power increases from −50 dBm to 0 dBm. As a result, the dynamic range represented by the input P1dB point (IP1dB) has an increase of 6.5 dB, while LNA still maintains a high gain of 15.15 dB at low input power. Full article
(This article belongs to the Special Issue Advanced RF, Microwave, and Millimeter-Wave Circuits and Systems)
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17 pages, 3993 KB  
Article
Indirect Thermographic Temperature Measurement of a Power Rectifying Diode Die under Forced Convection Conditions
by Krzysztof Dziarski, Arkadiusz Hulewicz, Łukasz Drużyński and Grzegorz Dombek
Appl. Sci. 2023, 13(7), 4440; https://doi.org/10.3390/app13074440 - 31 Mar 2023
Cited by 2 | Viewed by 1621
Abstract
The supply of energy with the correct parameters to electrical appliances is possible with the use of energy converters. When a direct current is required, rectifier bridges are needed. These can be made using rectifier diodes. The problem of excessive junction temperatures in [...] Read more.
The supply of energy with the correct parameters to electrical appliances is possible with the use of energy converters. When a direct current is required, rectifier bridges are needed. These can be made using rectifier diodes. The problem of excessive junction temperatures in power diodes, which are used to build rectifier bridges and power converters, was recognized. For this reason, research work was carried out to create a model of a rectifier diode placed on a heat sink and to analyze the heat dissipation from the junction of this diode under forced convection conditions. The results obtained from the simulation work were compared with the results of thermographic temperature measurements. The boundary conditions chosen for the simulation work are presented. A method is also presented that determined the convection coefficient under forced convection conditions. The difference between the simulation results and the results of the thermographic measurements was found to be 0.1 °C, depending on the power dissipated at the junction and the air velocity around the diode. Full article
(This article belongs to the Special Issue Recent Progress in Infrared Thermography)
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