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16 pages, 7086 KB  
Article
4.11 A/1650 V Sapphire-Substrate GaN MIS-HEMTs with Thin Buffer for Medium-Voltage Power Applications
by Changhao Chen, Yang Liu, Xiaowei Zhou, Peixian Li, Yongfeng Zhang, Bo Yang, Zili Yang and Junchun Bai
Micromachines 2026, 17(2), 233; https://doi.org/10.3390/mi17020233 - 11 Feb 2026
Viewed by 218
Abstract
The substantially lower breakdown electric field of Si compared to GaN necessitates thick buffer layers in Si-based GaN power devices for medium-voltage applications, significantly increasing cost. Recently, sapphire substrates, offering high electrical insulation and excellent mechanical strength, have emerged as a promising alternative. [...] Read more.
The substantially lower breakdown electric field of Si compared to GaN necessitates thick buffer layers in Si-based GaN power devices for medium-voltage applications, significantly increasing cost. Recently, sapphire substrates, offering high electrical insulation and excellent mechanical strength, have emerged as a promising alternative. In this work, we demonstrate a CMOS-compatible process for sapphire-based GaN MIS-HEMTs utilizing a thin buffer layer. The fabricated devices with a WG of 20.4 mm and an LGD of 24 μm achieve a high off-state breakdown voltage >1650 V and a maximum on-state current > 4.1 A, with tight statistical distributions of VTH and RON across the wafer. Furthermore, statistical characterization results of dynamic RON and leakage current under electrical stress conditions at both room temperature and 150 °C, confirm operational viability at high temperatures. Finally, long-term reliability for 650 V operation is validated by high-temperature reverse bias (HTRB) accelerated aging tests. Full article
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13 pages, 3401 KB  
Article
Structure-Dependent Parameter Trade-Off Optimization on RonCoff and Power Compression of AlGaN/GaN HEMTs for RF Switch Application
by Xu Zou, Meng Zhang, Ling Yang, Bin Hou, Mei Wu, Chupeng Yi, Hao Lu, Mao Jia, Qian Yu, Yutong Jiang, Xiaohua Ma and Yue Hao
Micromachines 2026, 17(2), 163; https://doi.org/10.3390/mi17020163 - 27 Jan 2026
Viewed by 307
Abstract
This paper presents, for the first time, the structure-dependent parameter trade-off optimization on figure-of-merit (RonCoff) and power compression of AlGaN/GaN high electron mobility transistors (HEMTs) for radio frequency (RF) switch applications. For GaN HEMTs operating in switching mode, [...] Read more.
This paper presents, for the first time, the structure-dependent parameter trade-off optimization on figure-of-merit (RonCoff) and power compression of AlGaN/GaN high electron mobility transistors (HEMTs) for radio frequency (RF) switch applications. For GaN HEMTs operating in switching mode, it was demonstrated that RonCoff can be effectively reduced by increasing the gate foot length (Lg_foot), decreasing the gate cap length (Lg_cap), reducing the gate bias resistance (rg), and adopting a high work function metal for the gate electrode (Φg). However, these parameter adjustments affect power compression and RonCoff in opposing manners. This paper also presents supplementary research on the effects of source-drain spacing (Lds) and gate width (Wg) on switching performance. This research achieves a dynamic balancing method for structural parameters, delivering application-specific design rules for different scenarios ranging from high-frequency to high-power applications. Full article
(This article belongs to the Special Issue RF and Power Electronic Devices and Applications, 2nd Edition)
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23 pages, 1030 KB  
Article
Mild Ozone-Induced Oxidative Stress Modulates the Activity and Viability of Porcine Neutrophils and Monocytes
by Dominika Nguyen Ngoc, Jose Luis Valverde Piedra, Andrzej Milczak, Tomasz Szponder, Beata Drzewiecka, Aleksandra Pyzerska, Małgorzata Kowalczyk, Mateusz Fila, Ewa Tomaszewska, Arti Ahluwalia and Joanna Wessely-Szponder
Animals 2026, 16(2), 193; https://doi.org/10.3390/ani16020193 - 8 Jan 2026
Viewed by 400
Abstract
Ozone (O3) is a reactive oxidant increasingly applied in biomedical settings, yet its dose-dependent effects on innate immune cells, particularly those from non-human species, remain insufficiently defined. Within a One Health framework, this study examined how two clinically relevant O3 [...] Read more.
Ozone (O3) is a reactive oxidant increasingly applied in biomedical settings, yet its dose-dependent effects on innate immune cells, particularly those from non-human species, remain insufficiently defined. Within a One Health framework, this study examined how two clinically relevant O3 exposure regimens (30 µg/mL and 90 µg/mL) affect porcine neutrophils and monocytes isolated from peripheral blood. Cell viability, reactive oxygen and nitrogen species (RONS) production, and the activity of key enzymes (myeloperoxidase, elastase, alkaline phosphatase, arginase) were assessed at 1 h and 24 h post-exposure. The lower dose induced mild functional activation without compromising viability, whereas the higher dose triggered pronounced oxidative stress, enhanced degranulation, and reduced neutrophil viability by more than 60%. Neutrophils exhibited a stronger and more dynamic response than monocytes, which retained viability and differentiation capacity at 30 µg/mL but showed impaired function at 90 µg/mL. These findings highlight the dual nature of O3, where controlled exposure may support immunomodulation, while excessive dosing disrupts cell function. Defining safe and effective therapeutic windows remains critical for future applications. Full article
(This article belongs to the Section Pigs)
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11 pages, 16090 KB  
Article
Impact of OFF-State Stress on Dynamic RON of On-Wafer 100 V p-GaN HEMTs, Studied by Emulating Monolithically Integrated Half-Bridge Operation
by Lorenzo Modica, Nicolò Zagni, Marcello Cioni, Giacomo Cappellini, Giovanni Giorgino, Ferdinando Iucolano, Giovanni Verzellesi and Alessandro Chini
Electronics 2025, 14(23), 4756; https://doi.org/10.3390/electronics14234756 - 3 Dec 2025
Viewed by 457
Abstract
This paper presents the electrical characterization of the on-resistance (RON) of on-wafer 100 V p-GaN power High-Electron-Mobility Transistors (HEMTs). This study assesses device degradation in the context of a monolithically integrated half-bridge circuit, considering both Low-Side (LS) and High-Side (HS) [...] Read more.
This paper presents the electrical characterization of the on-resistance (RON) of on-wafer 100 V p-GaN power High-Electron-Mobility Transistors (HEMTs). This study assesses device degradation in the context of a monolithically integrated half-bridge circuit, considering both Low-Side (LS) and High-Side (HS) configurations. Since on-wafer samples have been characterized, a custom experimental setup was developed to emulate stress conditions experienced by the devices in the half-bridge circuit. A periodic signal (T = 10 µs, TON = 2 µs) switching from the OFF to the ON state was applied for a cumulative duration of 1000 s. Different OFF-state stress conditions were applied by varying the gate-source OFF voltage (VGS,OFF) between 0 V and −10 V. The on-resistance exhibited a positive drift over time for devices in either the LS or the HS configuration, with the latter showing a more pronounced degradation. Measurements at higher temperatures (up to 90 °C) were carried out to characterize the dynamics of the physical mechanism behind the degradation effects. We identified hole emission from C-related acceptor traps in the buffer as the main mechanism for the observed degradation, which is present in both the HS and the LS configurations. The additional degradation observed in the HS case was attributed to the back-gating effect, stemming from the non-null body-to-source voltage. Furthermore, we found that a more negative VGS,OFF further increases RON degradation, likely related to the higher electric field near the gate contact, which enhances hole emission from C-related acceptor traps. Full article
(This article belongs to the Section Semiconductor Devices)
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20 pages, 2389 KB  
Article
Aging Stability and Radical Activity of Plasma-Activated Water Treated in Liquid- and Gas-Phase Reactors
by Ivan Karlo Cingesar, Višnja Stulić, Franka Markić, Senada Muratović, Mia Kurek, Zoran Herceg, Nadica Maltar-Strmečki and Tomislava Vukušić Pavičić
Molecules 2025, 30(23), 4585; https://doi.org/10.3390/molecules30234585 - 28 Nov 2025
Cited by 2 | Viewed by 636
Abstract
Plasma-activated water (PAW) is a liquid enriched with reactive oxygen and nitrogen species (RONS), which impart antimicrobial and bioactive properties. In this study, PAW generated in liquid or gas phase under nitrogen or oxygen atmospheres was characterized in terms of pH, electrical conductivity, [...] Read more.
Plasma-activated water (PAW) is a liquid enriched with reactive oxygen and nitrogen species (RONS), which impart antimicrobial and bioactive properties. In this study, PAW generated in liquid or gas phase under nitrogen or oxygen atmospheres was characterized in terms of pH, electrical conductivity, oxidation-reduction potential, surface tension, and concentrations of H2O2 and NO2. Hydroxyl radical (•OH) formation was confirmed using DIPPMPO as a spin-trapping probe, while antioxidant activity was determined directly in treated water for the first time. The stability of reactive species was assessed over three months at room temperature, 4 °C, and −18 °C. Results indicate that plasma effects on physicochemical parameters depend strongly on the process gas. From a long-term storage perspective, samples maintained at 4 °C stabilized at higher H2O2 and NO2 concentrations. Antioxidant activity persisted for up to 60 days, though at low levels. EPR analysis revealed that hydroxyl radical concentration increased slightly during storage, with 60-day samples showing higher signal intensities compared to fresh PAW. Overall, the findings provide new insights into PAW composition, radical dynamics, and stability, highlighting the influence of gas atmosphere and storage conditions on its properties and supporting its potential for applications in the food, agriculture, and biomedical sectors. Full article
(This article belongs to the Collection Advances in Food Chemistry)
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29 pages, 7216 KB  
Article
Thymoquinone Protective Effect Against Mercury-Induced Reproductive Derangement in Rats: In Vivo and In Silico Investigation
by Solomon Owumi, Moses Otunla, Pelumi Akindipe, Uche Arunsi, Jesutosin O. Babalola, Chioma E. Irozuru, Ahmad Altayyar, Bayode Oluwawibe, Olatunde Owoeye and Adegboyega K. Oyelere
Toxics 2025, 13(10), 896; https://doi.org/10.3390/toxics13100896 - 19 Oct 2025
Cited by 2 | Viewed by 1296
Abstract
Mercury exposure has been linked to male infertility. Given that mercury chloride (HgCl2) may promote an oxido-inflammatory milieu associated with pathophysiological derangements, it is hypothesised that Thymoquinone (TQ), an antioxidant and anti-inflammatory agent, may mitigate the gradual harmful effects of mercury [...] Read more.
Mercury exposure has been linked to male infertility. Given that mercury chloride (HgCl2) may promote an oxido-inflammatory milieu associated with pathophysiological derangements, it is hypothesised that Thymoquinone (TQ), an antioxidant and anti-inflammatory agent, may mitigate the gradual harmful effects of mercury exposure on rat testes, epididymis, and hypothalamus, as these organs are vital to reproductive function. To test this hypothesis, 40 rats (strain: Wistar; sex: male) were randomly assigned to five cohorts of eight rats each. After a 7-day acclimation, treatments were dispensed for 28 consecutive days accordingly: Cohort I: distilled water only, as control; Cohort II: HgCl2 only (20 µg/mL); Cohort III: TQ only (2.5 mg/kg); Cohort IV: HgCl2 + TQ (20 µg/mL + 2.5 mg/kg); and Cohort V: HgCl2 + TQ (20 µg/mL + 5 mg/kg). Co-treatment with TQ preserved the body and organ weight of the HgCl2 exposed animals. However, TQ did not reduce HgCl2-induced dysfunction in sperm function and morphology. The serum follicle-stimulating hormone (FSH), luteinising hormone (LH), and testosterone were increased significantly (p < 0.05) by TQ co-treatment, while decreasing the prolactin level. TQ administration also increased (p < 0.05) testicular enzymes, including alkaline phosphatase (ALP), lactate dehydrogenase (LDH), acid phosphatase (ACP), and glucose-6-phosphate dehydrogenase (G6PD) activities, which HgCl2 decreased. TQ administration increased (p < 0.05) HgCl2-induced decreases in catalase (CAT), superoxide dismutase (SOD), glutathione peroxidase (GPx), glutathione (GSH), glutathione-s-transferase (GST), and total sulfhydryl group (TSH) levels in the testes, epididymis, and hypothalamus of experimental rats. Further, TQ reduced HgCl2-mediated increases in RONS-reactive oxygen and nitrogen species; LPO–lipid peroxidation; PC–protein carbonyl formation; and XO–xanthine oxidase activity. Furthermore, levels of inflammatory biomarkers, including tumour necrosis factor alpha (TNF-α), nitric oxide (NO), interleukin-1 beta (IL-1β), and myeloperoxidase (MPO), were decreased (p < 0.05) in the co-treated groups, with a higher dose of TQ (5.0 mg/kg) showing a more pronounced protective effect. Additionally, TQ co-administration increased Bax and decreased Bcl-2 and p53 protein levels (p < 0.05), thereby protecting the rats’ testes, epididymis, and hypothalamus from HgCl2-induced apoptosis. Molecular docking simulation analysis revealed TQ interaction dynamics with PPAR-α and PPAR-δ to suppress NF-kB-mediated pro-inflammatory sequela as well as activate Nrf-2-mediated antioxidant defence system. These predicted biological effects of TQ resonate with the findings from the in vivo studies. Therefore, supplementation with TQ may help reduce chemical-induced toxicities, including HgCl2‘s reproductive toxicity. Full article
(This article belongs to the Section Novel Methods in Toxicology Research)
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15 pages, 3325 KB  
Article
Impact of SiN Passivation on Dynamic-RON Degradation of 100 V p-GaN Gate AlGaN/GaN HEMTs
by Marcello Cioni, Giacomo Cappellini, Giovanni Giorgino, Alessandro Chini, Antonino Parisi, Cristina Miccoli, Maria Eloisa Castagna, Aurore Constant and Ferdinando Iucolano
Electron. Mater. 2025, 6(4), 14; https://doi.org/10.3390/electronicmat6040014 - 7 Oct 2025
Viewed by 1474
Abstract
In this paper, the impact of SiN passivation on dynamic-RON degradation of AlGaN/GaN HEMTs devices is put in evidence. To this end, samples showing different SiN passivation stoichiometry are considered, labeled as Sample A and Sample B. For dynamic-RON tests, two [...] Read more.
In this paper, the impact of SiN passivation on dynamic-RON degradation of AlGaN/GaN HEMTs devices is put in evidence. To this end, samples showing different SiN passivation stoichiometry are considered, labeled as Sample A and Sample B. For dynamic-RON tests, two different experimental setups are employed to investigate the RON-drift showing up during conventional switch mode operation by driving the DUTs under both (i) resistive load and (ii) soft-switching trajectory. This allows to discern the impact of hot carriers and off-state drain voltage stress on the RON parameter drift. Measurements performed with both switching loci shows similar dynamic-RON response, indicating that hot carriers are not involved in the degradation of tested devices. Nevertheless, a significant difference was observed between Sample A and Sample B, with the former showing an additional RON-degradation mechanism, not present on the latter. This additional drift is totally ascribed to the SiN passivation layer and is confirmed by the different leakage current measured across the two SiN types. The mechanism is explained by the injection of negative charges from the Source Field-Plate towards the AlGaN surface that are captured by surface/dielectric states and partially depletes the 2DEG underneath. Full article
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13 pages, 2498 KB  
Article
Evaluation of Dynamic On-Resistance and Trapping Effects in GaN on Si HEMTs Using Rectangular Gate Voltage Pulses
by Pasquale Cusumano, Alessandro Sirchia and Flavio Vella
Electronics 2025, 14(14), 2791; https://doi.org/10.3390/electronics14142791 - 11 Jul 2025
Cited by 3 | Viewed by 2745
Abstract
Dynamic on-resistance (RON) of commercial GaN on Si normally off high-electron-mobility transistor (HEMT) devices is a very important parameter because it is responsible for conduction losses that limit the power conversion efficiency of high-power switching converters. Due to charge trapping effects, [...] Read more.
Dynamic on-resistance (RON) of commercial GaN on Si normally off high-electron-mobility transistor (HEMT) devices is a very important parameter because it is responsible for conduction losses that limit the power conversion efficiency of high-power switching converters. Due to charge trapping effects, dynamic RON is always higher than in DC, a behavior known as current collapse. To study how short-time dynamics of charge trapping and release affects RON we use rectangular 0–5 V gate voltage pulses with durations in the 1 μs to 100 μs range. Measurements are first carried out for single pulses of increasing duration, and it is found that RON depends on both pulse duration and drain current ID, being higher at shorter pulse durations and lower ID. For a train of five pulses, RON decreases with pulse number, reaching a steady state after a time interval of 100 μs. The response to a five pulses train is compared to that of a square-wave signal to study the time evolution of RON toward a dynamic steady state. The DC RON is also measured, and it is a factor of ten smaller than dynamic RON at the same ID. This confirms that a reduction in trapped charges takes place in DC as compared to the square-wave switching operation. Additional off-state stress tests at VDS = 55 V reveal the presence of residual surface traps in the drain access region, leading to four times increase in RON in comparison to pristine devices. Finally, the dynamic RON is also measured by the double-pulse test (DPT) technique with inductive load, giving a good agreement with results from single-pulse measurements. Full article
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14 pages, 3948 KB  
Article
Using Triangular Gate Voltage Pulses to Evaluate Hysteresis and Charge Trapping Effects in GaN on Si HEMTs
by Pasquale Cusumano, Flavio Vella and Alessandro Sirchia
Electronics 2025, 14(10), 1991; https://doi.org/10.3390/electronics14101991 - 13 May 2025
Cited by 3 | Viewed by 1322
Abstract
Charge carrier traps due to crystal defects in GaN on Si HEMT devices are responsible for dynamic performance degradation, long-term reliability limitations, and peculiar failure modes. The behavior of traps depends on many variables including heterostructure quality, the specific device structure, and operating [...] Read more.
Charge carrier traps due to crystal defects in GaN on Si HEMT devices are responsible for dynamic performance degradation, long-term reliability limitations, and peculiar failure modes. The behavior of traps depends on many variables including heterostructure quality, the specific device structure, and operating conditions. To study the short time dynamics of charge trapping and release on the threshold voltage shift and hysteresis of commercial normally off GaN HEMTs we use triangular 0–5 V gate voltage pulses in the μs to ms duration range. Measurements are performed for single pulses by varying pulse duration and for a train of a few pulses by varying their number. The results indicate that hysteresis and related threshold voltage shift occur after repeated pulses, suggesting an accumulation of trapped charges. However, for a triangular wave hysteresis vanishes, meaning that a dynamic balance between charge trapping and release is established in the device. This can be considered as a positive indicator of device robustness and reliability. The same method, used to measure the gate threshold voltage shift and dynamic RON after a 30 min off-state DC stress at VDS = 55 V with a floating gate, highlights an appreciable performance degradation of the device. Full article
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12 pages, 5077 KB  
Article
Optimization of Low-Voltage p-GaN Gate HEMTs for High-Efficiency Secondary Power Conversion
by Lili Zhai, Xiangdong Li, Jian Ji, Lu Yu, Liang Chen, Yaoming Chen, Haonan Xia, Zhanfei Han, Junbo Wang, Xi Jiang, Song Yuan, Tao Zhang, Yue Hao and Jincheng Zhang
Micromachines 2025, 16(5), 556; https://doi.org/10.3390/mi16050556 - 2 May 2025
Cited by 1 | Viewed by 1842
Abstract
The explosive demand for high-performance secondary power sources in artificial intelligence (AI) has brought significant opportunities for low-voltage GaN devices. This paper focuses on research on high-efficiency and high-reliability low-voltage p-GaN gate HEMTs with a gate–drain distance, LGD, of 1 to [...] Read more.
The explosive demand for high-performance secondary power sources in artificial intelligence (AI) has brought significant opportunities for low-voltage GaN devices. This paper focuses on research on high-efficiency and high-reliability low-voltage p-GaN gate HEMTs with a gate–drain distance, LGD, of 1 to 3 μm in our pilot line, manufactured on 6-inch Si using a CMOS-compatible process, with extraordinary wafer-level uniformity. Specifically, these fabricated p-GaN gate HEMTs with an LGD of 1.5 μm demonstrate a blocking voltage of over 180 V and a high VTH of 1.6 V and exhibit a low RON of 2.8 Ω·mm. It is found that device structure optimization can significantly enhance device reliability. That is, through the dedicated optimization of source field plate structure and interlayer dielectric (ILD) thickness, the dynamic ON-resistance, RON, degradation of devices with an LGD of 1.5 µm was successfully suppressed from 60% to 20%, and the VTH shift was significantly reduced from 1.1 to 0.5 V. Further, the devices also passed preliminary gate bias stress and high-voltage OFF-state stress tests, providing guidance for preparing high-performance, low-voltage p-GaN gate HEMTs in the future. Full article
(This article belongs to the Section E:Engineering and Technology)
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21 pages, 1030 KB  
Review
RON Receptor Signaling and the Tumor Microenvironment
by Emily Wachter, Levi H. Fox, Zhixin Lu, Angelle D. Jones, Nicholas D. Casto and Susan E. Waltz
Genes 2025, 16(4), 437; https://doi.org/10.3390/genes16040437 - 6 Apr 2025
Viewed by 1500
Abstract
The immune microenvironment plays a critical role in tumor growth and development. Immune activation within the tumor microenvironment is dynamic and can be modulated by tumor intrinsic and extrinsic signaling. The RON receptor tyrosine kinase is canonically associated with growth signaling and wound [...] Read more.
The immune microenvironment plays a critical role in tumor growth and development. Immune activation within the tumor microenvironment is dynamic and can be modulated by tumor intrinsic and extrinsic signaling. The RON receptor tyrosine kinase is canonically associated with growth signaling and wound healing, and this receptor is frequently overexpressed in a variety of cancers. Epithelial cells, macrophages, dendritic cells, and fibroblasts express RON, presenting an important axis by which RON overexpressing tumors influence the tumor microenvironment. This review synthesizes the existing literature on the roles of tumor cell-intrinsic and -extrinsic RON signaling, highlighting areas of interest and gaps in knowledge that show potential for future studies. Full article
(This article belongs to the Section Molecular Genetics and Genomics)
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29 pages, 2787 KB  
Article
Asymmetric Shocks and Pension Fund Volatility: A GARCH Approach with Macroeconomic Predictors to an Unexplored Emerging Market
by Cristiana Tudor, Aura Girlovan, Gabriel Robert Saiu and Daniel Dumitru Guse
Mathematics 2025, 13(7), 1134; https://doi.org/10.3390/math13071134 - 30 Mar 2025
Cited by 1 | Viewed by 2755
Abstract
Financial stability analysis requires volatility modeling, especially in emerging nations where pension fund systems are very vulnerable to macrofinancial risks. In order to examine the volatility dynamics of Romania’s private pension system, this study uses daily net asset value (NAV) data from 2012 [...] Read more.
Financial stability analysis requires volatility modeling, especially in emerging nations where pension fund systems are very vulnerable to macrofinancial risks. In order to examine the volatility dynamics of Romania’s private pension system, this study uses daily net asset value (NAV) data from 2012 to 2024 to evaluate four GARCH-type models: standard GARCH (sGARCH), exponential GARCH (EGARCH), Glosten–Jagannathan–Runkle GARCH (GJR-GARCH), and component GARCH (C-GARCH). The analysis includes domestic and international equity indices (BET, STOXX), government bond yields (ROMGB 10Y, ROMANI 5Y), short-term interbank rates (ROBOR ON), and exchange rate fluctuations (RON/EUR). Current findings indicate that EGARCH captures asymmetric fluctuations in pension fund performance, where positive shocks generate larger increases in volatility than negative ones, highlighting an atypical asymmetry pattern. Furthermore, the stabilizing effects of government bonds are overshadowed by stock market behavior, which becomes the primary driver of risk. Fluctuations in exchange rates further increase volatility, especially in markets vulnerable to external disturbances. The findings offer empirical evidence for the necessity of more cautious risk management approaches and highlight the importance of regulatory oversight in maintaining market confidence. The study underscores the importance of customized allocation frameworks that reduce vulnerability to disruptive events while maintaining prospects for sustained growth. This new dataset contributes to enhancing the comprehension of pension fund volatility within the context of emerging markets. These insights can assist managers and policymakers seeking to fortify retirement outcomes. Full article
(This article belongs to the Section E5: Financial Mathematics)
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30 pages, 2326 KB  
Article
Statistical Analysis and Forecasts of Performance Indicators in the Romanian Healthcare System
by Cristian Ovidiu Drăgan, Laurențiu Stelian Mihai, Ana-Maria Camelia Popescu, Ion Buligiu, Lucian Mirescu and Daniel Militaru
Healthcare 2025, 13(2), 102; https://doi.org/10.3390/healthcare13020102 - 7 Jan 2025
Cited by 1 | Viewed by 2955
Abstract
Background/Objectives: Globally, healthcare systems face challenges in optimizing performance, particularly in the wake of the COVID-19 pandemic. This study focuses on the analysis and forecasting of key performance indicators (KPIs) for the County Emergency Clinical Hospital in Craiova, Romania. The study evaluates indicators [...] Read more.
Background/Objectives: Globally, healthcare systems face challenges in optimizing performance, particularly in the wake of the COVID-19 pandemic. This study focuses on the analysis and forecasting of key performance indicators (KPIs) for the County Emergency Clinical Hospital in Craiova, Romania. The study evaluates indicators such as average length of stay (ALoS), bed occupancy rate (BOR), number of cases (NC), case mix index (CMI), and average cost per hospitalization (ACH), providing insight into their dynamics and future trends. Methods: We performed statistical analyses on quarterly data from 2010 to 2023, employing descriptive statistics and stationarity tests (e.g., Dickey–Fuller), using ARIMA models to forecast each KPI, ensuring model validation through tests for autocorrelation, heteroscedasticity, and stationarity. The model selection prioritized Akaike and Schwarz criteria for robustness. Results: The findings reveal that ALoS and BOR demonstrate seasonality and are influenced by colder months, and it is expected that the ALoS will stabilize to around five days by 2025. Moreover, we predict that the BOR will range between 46 and 52%, reflecting these seasonal variations. The NC forecasts indicate a post-pandemic recovery but to below pre-pandemic levels, and we project the CMI to stabilize at around 1.54, suggesting a return to consistent case complexity. The ACH showed significant growth, particularly in the fourth quarter, driven by inflation and seasonal costs, and it is projected to reach more than RON 3000 by 2025. Conclusions: This study highlights the utility of ARIMA models in forecasting healthcare KPIs, enabling proactive resource planning and decision-making. The findings underscore the impact of seasonality and economic factors on hospital operations, offering valuable insights for improving efficiency and adapting to post-pandemic challenges. Full article
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14 pages, 3865 KB  
Article
SiC MOSFET with Integrated SBD Device Performance Prediction Method Based on Neural Network
by Xiping Niu, Ling Sang, Xiaoling Duan, Shijie Gu, Peng Zhao, Tao Zhu, Kaixuan Xu, Yawei He, Zheyang Li, Jincheng Zhang and Rui Jin
Micromachines 2025, 16(1), 55; https://doi.org/10.3390/mi16010055 - 31 Dec 2024
Cited by 3 | Viewed by 3290
Abstract
The SiC MOSFET with an integrated SBD (SBD-MOSFET) exhibits excellent performance in power electronics. However, the static and dynamic characteristics of this device are influenced by a multitude of parameters, and traditional TCAD simulation methods are often characterized by their complexity. Due to [...] Read more.
The SiC MOSFET with an integrated SBD (SBD-MOSFET) exhibits excellent performance in power electronics. However, the static and dynamic characteristics of this device are influenced by a multitude of parameters, and traditional TCAD simulation methods are often characterized by their complexity. Due to the increasing research on neural networks in recent years, such as the application of neural networks to the prediction of GaN JBS and Finfet devices, this paper considers the application of neural networks to the performance prediction of SiC MOSFET devices with an integrated SBD. This study introduces a novel approach utilizing neural network machine learning to predict the static and dynamic characteristics of the SBD-MOSFET. In this research, SBD-MOSFET devices are modeled and simulated using Sentaurus TCAD(2017) software, resulting in the generation of 625 sets of device structure and sample data, which serve as the sample set for the neural network. These input variables are then fed into the neural network for prediction. The findings indicate that the mean square error (MSE) values for the threshold voltage (Vth), breakdown voltage (BV), specific on-resistance (Ron), and total switching power dissipation (E) are 0.0051, 0.0031, 0.0065, and 0.0220, respectively, demonstrating a high degree of accuracy in the predicted values. Meanwhile, in the comparison of convolutional neural networks and machine learning, the CNN accuracy is much higher than the machine learning methods. This method of predicting device performance via neural networks offers a rapid means of designing SBD-MOSFETs with specified performance targets, thereby presenting significant advantages in accelerating research on SBD-MOSFET performance prediction. Full article
(This article belongs to the Special Issue Research Progress of Advanced SiC Semiconductors)
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16 pages, 5948 KB  
Article
AdipoRon Alleviates Liver Injury by Protecting Hepatocytes from Mitochondrial Damage Caused by Ionizing Radiation
by Yi Liu, Yinfen Xu, Huilin Ji, Fenfen Gao, Ruoting Ge, Dan Zhou, Hengyi Fu, Xiaodong Liu and Shumei Ma
Int. J. Mol. Sci. 2024, 25(20), 11277; https://doi.org/10.3390/ijms252011277 - 20 Oct 2024
Cited by 3 | Viewed by 2025
Abstract
Radiation liver injury is a common complication of hepatocellular carcinoma radiotherapy. It is mainly caused by irreversible damage to the DNA of hepatocellular cells directly by radiation, which seriously interferes with metabolism and causes cell death. AdipoRon can maintain lipid metabolism and stabilize [...] Read more.
Radiation liver injury is a common complication of hepatocellular carcinoma radiotherapy. It is mainly caused by irreversible damage to the DNA of hepatocellular cells directly by radiation, which seriously interferes with metabolism and causes cell death. AdipoRon can maintain lipid metabolism and stabilize blood sugar by activating adiponectin receptor 1 (AdipoR1). However, the role of AdipoRon/AdipoR1 in the regulation of ionizing radiation (IR)-induced mitochondrial damage remains unclear. In this study, we aimed to elucidate the roles of AdipoRon/AdipoR1 in IR-induced mitochondrial damage in normal hepatocyte cells. We found that AdipoRon treatment rescued IR-induced liver damage in mice and mitochondrial damage in normal hepatocytes in vivo and in vitro. AdipoR1 deficiency exacerbated IR-induced oxidative stress, mitochondrial dynamics, and biogenesis disorder. Mechanistically, the absence of AdipoR1 inhibits the activity of adenosine monophosphate-activated protein kinase α (AMPKα), subsequently leading to disrupted mitochondrial dynamics by decreasing mitofusin (MFN) and increasing dynamin-related protein 1 (DRP1) protein expression. It also controls mitochondrial biogenesis by suppressing the peroxisome proliferator-activated receptor-gamma coactivator-1 alpha (PGC1α) and transcription factor A (TFAM) signaling pathway, ultimately resulting in impaired mitochondrial function. To sum up, AdipoRon/AdipoR1 maintain mitochondrial function by regulating mitochondrial dynamics and biogenesis through the AdipoR1-AMPKα signaling pathway. This study reveals the significant role of AdipoR1 in regulating IR-induced mitochondrial damage in hepatocytes and offers a novel approach to protecting against damage caused by IR. Full article
(This article belongs to the Section Molecular Pathology, Diagnostics, and Therapeutics)
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