Symmetry in Optical Materials

A special issue of Symmetry (ISSN 2073-8994). This special issue belongs to the section "Physics".

Deadline for manuscript submissions: closed (31 August 2019) | Viewed by 2282

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Department of Electrical Engineering, Czestochowa Univeristy of Technology, PL-42201, Armii Krajoej 17, Czestochowa, Poland
Interests: nonlinear optical crystals and nanocrystals; laser stimulated effects in crystals; nanophotonic and optoelecronic crystals
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Special Issue Information

Dear Colleagues,

Aspects of symmetry cover a wide range of physical, chemistry, and biological topics: they include nonlinear optics, nanoparticles, gravitation, biopolymers, etc. Both microscopical and phenomenological aspects exist here. Particular attention will be devoted to phenomena that are forbidden by symmetry following the macroscopical approach and may be allowed following the microscopical theory. Particular attention will be devoted to incommensurate superstructures and other topics, where the generally adapted symmetry aspects will be significantly modified.

Prof. Dr. Iwan Kityk
Guest Editor

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Published Papers (1 paper)

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Research

10 pages, 2937 KiB  
Article
Design a Stratiform Metamaterial with Precise Optical Property
by Yi-Jun Jen and Wei-Chin Liu
Symmetry 2019, 11(12), 1464; https://doi.org/10.3390/sym11121464 - 01 Dec 2019
Cited by 3 | Viewed by 2018
Abstract
In this work, a stratiform metamaterial is arranged as multiple periods of metal-dielectric symmetrical film stack to provide precise equivalent refractive index and admittance. There are multiple solutions of equivalent refractive index retrieved from the characteristic matrix of the film stack. The correct [...] Read more.
In this work, a stratiform metamaterial is arranged as multiple periods of metal-dielectric symmetrical film stack to provide precise equivalent refractive index and admittance. There are multiple solutions of equivalent refractive index retrieved from the characteristic matrix of the film stack. The correct refractive index is derived by connecting different branches of solution at different ranges of wavelength or thickness of the dielectric layer. The refractive index of an Ag-TiO2 five-layered symmetrical film stack shown in previous work is demonstrated to be positive real instead of negative real. The associated type I iso-frequency curve supports negative refraction. In order to extend the operating wavelength of type I metamaterial, the number of the metal-dielectric symmetrical film stack is increased to reduce the thickness of the dielectric film to approach subwavelength requirement. Full article
(This article belongs to the Special Issue Symmetry in Optical Materials)
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