Symmetry in Optimization Methods for Image Processing

A special issue of Symmetry (ISSN 2073-8994). This special issue belongs to the section "Computer".

Deadline for manuscript submissions: 31 July 2025 | Viewed by 87

Special Issue Editor


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Guest Editor
College of Information Science and Technology, Beijing University of Chemical Technology, Beijing 100029, China
Interests: smart healthcare; medical image processing; multimodal medical data analysis; robust machine learning; pattern recognition

Special Issue Information

Dear Colleagues,

We are pleased to invite you this Special Issue, ‘Symmetry in Optimization Methods for Image Processing’. This Special Issue explores symmetry and asymmetry in image processing, with a particular focus on high-efficiency solutions. It aims to compile groundbreaking research findings, demonstrating how these concepts can enhance the efficiency, accuracy, and performance of algorithms in real-time applications.

Contributions may include, but are not limited to, theories, algorithms, and applications related to symmetry and asymmetry. These innovations involve utilizing symmetry to accomplish real-time embedded tasks such as object recognition, image segmentation, and feature extraction, while also promoting effective strategies for dealing with asymmetrical data, features, and tasks in dynamic and complex scenarios.

We cordially invite you to share your insights on a wide range of topics, including, but not limited to, the following aspects of symmetry and asymmetry in imaging:

  • Symmetry detection algorithms: Innovative methods for detecting and leveraging symmetrical features in images to enhance recognition and classification tasks.
  • Asymmetry analysis: Approaches to analyzing asymmetric patterns and their impacts on image classification, object detection, and scene understanding.
  • Noise analysis: Examination of noise present in image annotations, including symmetric, noisy, and asymmetric noise, aiming to mitigate its effects on deep neural networks.
  • Embedded system architecture: Design and implementation of hardware and software frameworks optimized for processing symmetric and asymmetric image data.
  • Applications: Case studies demonstrating real-world applications in fields such as robotics, surveillance, medical imaging, and autonomous vehicles, highlighting how symmetry/asymmetry affects system performance.
  • Machine learning techniques: Integration of machine learning methods that utilize symmetry and asymmetry to enhance image analysis and feature extraction.

Dr. Ruirui Li
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Symmetry is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • noise processing
  • sparse modeling
  • image segmentation
  • image classification
  • bias analysis
  • embedded systems
  • and computer vision

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Published Papers

This special issue is now open for submission.
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