Symmetry and Asymmetry in Intelligent Image Processing: Optimization, Security, and Applications
A special issue of Symmetry (ISSN 2073-8994). This special issue belongs to the section "A: Computer Science".
Deadline for manuscript submissions: 10 August 2027 | Viewed by 1140
Editors
Interests: cryptography; watermarking; steganography; medical image protection; embedded systems; intelligent image processing
Interests: cryptography; watermarking; steganography; medical image protection; embedded systems; intelligent image processing
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
We are pleased to invite you to contribute to this Special Issue dedicated to the integration of symmetrical and asymmetrical paradigms in intelligent image processing. These structures play a key role in pattern analysis, feature extraction, and data protection. With increasing demands for high-performance and secure visual systems, understanding the impact of symmetry and asymmetry across algorithms and applications becomes crucial. This Special Issue aims to gather state-of-the-art research contributions exploring how symmetry and asymmetry can be exploited in image optimization, enhancement, reconstruction, cryptography, and AI-based recognition. It fits well within the scope of Symmetry by linking theoretical aspects with practical implementations in signal processing, AI, and secure communications. Contributions spanning novel algorithms, hybrid techniques, and real-time embedded systems are welcome.
In this Special Issue, original research articles and comprehensive reviews are welcome. Suggested topics include, but are not limited to, the following:
- Symmetry and asymmetry in image recognition, enhancement, and feature extraction;
- Chaotic and fractal-based techniques for image security and authentication;
- Metaheuristic algorithms for image analysis, segmentation, and optimization;
- Real-time and embedded systems for intelligent visual data processing;
- Hybrid artificial intelligence methods for symmetry detection and pattern analysis;
- Symmetry-driven approaches in biomedical and medical image diagnostics;
- Data hiding, digital watermarking, and tamper detection exploiting symmetrical properties.
We look forward to receiving your contributions.
Dr. Mohamed Amine Tahiri
Prof. Dr. Mhamed Sayyouri
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-anonymized peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Symmetry is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- symmetry in image processing
- metaheuristics in image processing
- image security and authentication
- intelligent embedded systems for visual applications
- medical image diagnosis and symmetry analysis
- optimization techniques for image reconstruction
- pattern recognition in symmetric and asymmetric structures
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