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Special Issue "Electronics for Sensors"

A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Electronic Sensors".

Deadline for manuscript submissions: 31 December 2020.

Special Issue Editors

Prof. Dr. Giuseppe Ferri
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Guest Editor
Department of Industrial and Information Engineering and Economics, University of L’Aquila, 67100 L’Aquila, Italy
Tel. +390862434446
Interests: Sensor interfaces; Electronics for sensors
Special Issues and Collections in MDPI journals
Dr. Gianluca Barile
E-Mail
Guest Editor
Department of Industrial and Information Engineering and Economics, University of L’Aquila, L'Aquila, Italy
Interests: Capacitive sensors; Electronics for sensors
Special Issues and Collections in MDPI journals
Dr. Alfiero Leoni
E-Mail
Guest Editor
Department of Industrial and Information Engineering and Economics, University of L’Aquila, L'Aquila, Italy
Interests: Portable sensors; Electronics for sensors
Special Issues and Collections in MDPI journals

Special Issue Information

Dear Colleagues,

Sensors are devices largely applied in daily life and in commercial applications. Sensor systems are sensors completed by suitable electronic interfaces which help to improve the overall performance. As a consequence, particular attention must be paid to design electronics for sensors, also considering the drawbacks related to technology scaling and different technology integrations.

The aim of this Special Issue is to find new possible solutions regarding electronics for sensors, both analog and digital, at different frequencies. Contributors are invited to present and highlight the advances and the latest novel and emergent results on this topic, showing best practices, implementations, and applications.

The Guest Editors invite to submit original research contributions showing the electronics circuits employed in sensors. Additionally, application-oriented and review papers are encouraged.

Prof. Dr. Giuseppe Ferri
Dr. Gianluca Barile
Dr. Alfiero Leoni
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Sensor interfaces
  • Analog front-ends
  • CMOS read-out systems
  • Electronics for sensors
  • Acquisition systems
  • Electronic noise
  • Sensor networks

Published Papers (1 paper)

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Research

Open AccessArticle
A Highly Linear CMOS Image Sensor Design Based on an Adaptive Nonlinear Ramp Generator and Fully Differential Pipeline Sampling Quantization with a Double Auto-Zeroing Technique
Sensors 2020, 20(4), 1046; https://doi.org/10.3390/s20041046 - 14 Feb 2020
Abstract
For a complementary metal-oxide-semiconductor image sensor with highly linear, low noise and high frame rate, the nonlinear correction and frame rate improvement techniques are becoming very important. The in-pixel source follower transistor and the integration capacitor on the floating diffusion node cause linearity [...] Read more.
For a complementary metal-oxide-semiconductor image sensor with highly linear, low noise and high frame rate, the nonlinear correction and frame rate improvement techniques are becoming very important. The in-pixel source follower transistor and the integration capacitor on the floating diffusion node cause linearity degradation. In order to address this problem, this paper proposes an adaptive nonlinear ramp generator circuit based on dummy pixels used in single-slope analog-to-digital converter topology for a complementary metal-oxide-semiconductor (CMOS) image sensor. In the proposed approach, the traditional linear ramp generator circuit is replaced with the new proposed adaptive nonlinear ramp generator circuit that can mitigate the nonlinearity of the pixel unit circuit, especially the gain nonlinearity of the source follower transistor and the integration capacitor nonlinearity of the floating diffusion node. Moreover, in order to enhance the frame rate and address the issue of high column fixed pattern noise, a new readout scheme of fully differential pipeline sampling quantization with a double auto-zeroing technique is proposed. Compared with the conventional readout structure without a fully differential pipeline sampling quantization technique and double auto-zeroing technique, the proposed readout scheme cannot only enhance the frame rate but can also improve the consistency of the offset and delay information of different column comparators and significantly reduce the column fixed pattern noise. The proposed techniques are simulated and verified with a prototype chip fabricated using typical 180 nm CMOS process technology. The obtained measurement results demonstrate that the overall nonlinearity of the CMOS image sensor is reduced from 1.03% to 0.047%, the efficiency of the comparator is improved from 85.3% to 100%, and the column fixed pattern noise is reduced from 0.43% to 0.019%. Full article
(This article belongs to the Special Issue Electronics for Sensors)
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