Semiconductor Radiation Detectors: Sensors, Readout Electronics and Applications

Dear Colleagues,

Semiconductor radiation detectors (SRDs) are a wide class of sensors for the measurement of radiation, that, according to their material, can be classified into either elemental (Si, Ge, C, etc.) or compound (SiC, GaAs, GaN, CdTe, TlBr, etc.) semiconductor detectors. Due to their versatility, in terms of physical and electrical properties, geometry, and doping profiles, SRDs can be adopted for high-resolution spectroscopy, imaging, timing, and dosimetry purposes, as well as for light transducers in scintillator-based detection systems, with a widespread usage in scientific, medical, and industrial applications. This incredible variety of employment possibilities comes with an even broader assortment of electronics dedicated to the front-end readout, processing, and digitization of the sensors’ charge signals. Often constrained by demanding specifications in terms of noise performance, channel density, power dissipation, and radiation hardness, the realization of such front-end electronics typically requires the design of an application-specific integrated circuit (ASIC). The joint effort in the development of the sensor and the ASIC allows for state-of-the-art applications in fundamental science, such as high-energy physics experiments at synchrotron radiation facilities, X-ray free-electron lasers, and X-ray telescopes for astrophysics, as well as in medical instrumentation, but also in industrial contexts where they are gaining ground in the most advanced inspection technologies for product quality control, security, and material recycling.

This Special Issue is dedicated to the advances in radiation detection systems based on SRDs, inviting contributions with a focus on fundamental and applicative studies of the sensors, on the design and development of the front-end electronics, and on the characterization and calibration of complete SRD systems. Both reviews and original research articles related to the topic are welcome.

Dr. Filippo Mele
Guest Editor

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