Machine Learning for Plant Phenotyping in Wheat

A special issue of Plants (ISSN 2223-7747). This special issue belongs to the section "Plant Modeling".

Deadline for manuscript submissions: 31 July 2026

Special Issue Editors

Regional Technique Innovation Center for Wheat Production, Key Laboratory of Crop Physiology and Ecology in Southern China, Ministry of Agriculture, Collaborative Innovation Center for Modern Crop Production co-sponsored by Province and Ministry, Jiangsu Key Laboratory for Information Agriculture, Nanjing Agricultural University, Nanjing 210095, China
Interests: wheat; abiotic stress; crop production; plant phenotyping; deep learning

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Guest Editor
Shandong Engineering Research Center of Agricultural Equipment Intelligentization, Shandong Key Laboratory of Intelligent Production Technology and Equipment for Facility Horticulture, College of Mechanical and Electronic Engineering, Shandong Agricultural University, Tai’an 271018, China
Interests: intelligent control technology for agricultural equipment; research on key technologies of robots; intelligent detection technology

Special Issue Information

Dear Colleagues,

In recent years, the integration of automation control and optical sensing technologies has led to the development of various high-throughput, non-destructive phenotyping platforms, including handheld, gantry, and drone-based systems for both indoor and outdoor applications. These advancements have established a multi-scale, comprehensive plant temporal phenotyping framework, spanning from above- to below-ground, from morphological to physiological, and from macroscopic to microscopic levels. These significantly improve data collection efficiency and precision, while also causing an explosion in phenotypic data.

As one of the most critical food crops, wheat’s precise phenotyping is crucial for genetic improvement and high-yield cultivation. Researchers have amassed vast wheat 2D images (visible light, multispectral/hyperspectral, thermal infrared, and chlorophyll fluorescence) and 3D point cloud data, which urgently require in-depth exploration. Machine learning (ML) and its subfield, deep learning (DL), have played pivotal roles in processing complex data, thereby providing powerful tools for efficient, accurate, and automated analysis of large-scale phenotypic datasets. Therefore, this Special Issue aims to explore and showcase the latest research progress, methodologies, and applications of ML in wheat phenotyping studies, focusing on advancements that improving wheat genetic breeding and high-efficiency production management. Topics include, but are not limited to, the application of ML and DL techniques in the following:

  • Micro-scale phenotypic trait analysis: e.g., morphology of stomata, starch granules, and other physiological micro-indicators.
  • Organ-scale phenotypic trait analysis: e.g., seed, root, stem, leaf, and spike.
  • Individual-scale phenotypic trait analysis: e.g., plant architecture and phenological stages.
  • Population-scale phenotypic trait analysis: e.g., uniformity and yield.
  • Applications in analyzing other critical 2D and 3D wheat phenotypic traits.
  • Development of predictive/estimation models for key wheat phenotypic traits.
  • Genotype–phenotype associations: Integration of ML with genomic data to predict phenotypic outcomes, thereby supporting marker-assisted breeding and genomic selection.

We look forward to receiving your contributions.

Dr. Qing Li
Prof. Dr. Ping Liu
Guest Editors

Manuscript Submission Information

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Keywords

  • machine learning
  • deep learning
  • multi-scale phenotype
  • multi-data analysis
  • modeling

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Published Papers

This special issue is now open for submission.
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