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Photonics
Special Issues
Design and Applications of Optical Microscopy Imaging System
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Design and Applications of Optical Microscopy Imaging System

A special issue of Photonics (ISSN 2304-6732).

Deadline for manuscript submissions: closed (28 February 2023) | Viewed by 13768

Special Issue Editors

Dr. Wei Yan

E-Mail Website
Guest Editor
Center for Biomedical Photonics & College of Physics and Optoelectronic Engineering, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen 518071, China
Interests: optical super-resolution imaging; fluorescence lifetime imaging system; adaptive optics
Prof. Dr. Chao Tian

E-Mail Website
Guest Editor
Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230026, China
Interests: photoacoustic imaging; photoacoustic microscopy; photoacoustic tomography
Dr. Luwei Wang

E-Mail Website
Guest Editor
Center for Biomedical Photonics & College of Physics and Optoelectronic Engineering, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen 518071, China
Interests: optical super-resolution imaging; fluorescence lifetime imaging system; adaptive optics

Special Issue Information

Dear Colleagues,

The design of optical microscopy imaging systems is rapidly becoming increasingly important due to the wide range of applications of optical microscopy imaging in related fields such as biology, medicine, and materials. Over the past few decades, a series of advancements in optical devices and control methods have made optical microscopy imaging systems more influential in biomedical imaging.

This Special Issue will focus on comprehensive study of the design and applications of optical microscopy imaging systems spanning designing methods, analyzing methods, and microscopy application. Original research articles and perspectives are welcome from multidisciplinary research fields, with a focus on topics including, but not limited to:

  • The novel design of optical microscopy systems for biomedical optical imaging.
  • New applications of optical microscopy systems.
  • The exploitation and application of fluorescence lifetime imaging systems.
  • The exploitation and application of optical super-resolution imaging systems.
  • Photoacoustic imaging, photoacoustic microscopy, and photoacoustic tomography.

Dr. Wei Yan
Prof. Dr. Chao Tian
Dr. Luwei Wang
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Photonics is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

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Further information on MDPI's Special Issue polices can be found here.

Published Papers (4 papers)

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Research

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10 pages, 3784 KiB  
Communication
Experimental Study on Measuring Petzval Image Plane of Streak Tube with Single Image
by Houzhi Cai, Yong Wang, Fangke Zong, Lihong Niu, Qinlao Yang and Jingjin Zhang
Photonics 2023, 10(3), 297; https://doi.org/10.3390/photonics10030297 - 11 Mar 2023
Viewed by 1429
Abstract
In the process of image reconstruction of compressed sensing algorithms, building a measurement matrix related to the parameters of the imaging system is necessary to improve its imaging quality. Additionally, building a compressed ultrafast imaging system based on a streak camera, which includes [...] Read more.
In the process of image reconstruction of compressed sensing algorithms, building a measurement matrix related to the parameters of the imaging system is necessary to improve its imaging quality. Additionally, building a compressed ultrafast imaging system based on a streak camera, which includes aberrations in the imaging system, is necessary. However, the aberration coefficient of the streak tube can be obtained only by numerical calculation based on the known internal structure of the streak tube, and it does not apply to a tube with an unknown structure. Based on the Lagrange–Helmholtz relation, which is widely established in electronic optical imaging systems, this study proposes a method to obtain the Petzval image plane of a streak tube by measuring only a single image without considering the internal structure of the streak tube. This method provides a reference for the construction of the measurement matrix in the application of the compressed sensing algorithm; additionally, it provides a test scheme for the performance index of the streak tube after assembly in commercial production to further optimize the assembly process and improve the yield of production. Full article
(This article belongs to the Special Issue Design and Applications of Optical Microscopy Imaging System)
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8 pages, 2707 KiB  
Communication
An Experimental Study Measuring the Image Field Angle of an Electron Beam Using a Streak Tube
by Houzhi Cai, Xuan Deng, Lihong Niu, Qinlao Yang and Jingjin Zhang
Photonics 2023, 10(3), 267; https://doi.org/10.3390/photonics10030267 - 3 Mar 2023
Viewed by 1288
Abstract
The final stage of an inertial confinement fusion (ICF) experiment requires the diagnostic instruments to have the ability to obtain multiple images with high spatiotemporal resolution due to its extremely short duration. However, the influence of field curvature in the streak tube may [...] Read more.
The final stage of an inertial confinement fusion (ICF) experiment requires the diagnostic instruments to have the ability to obtain multiple images with high spatiotemporal resolution due to its extremely short duration. However, the influence of field curvature in the streak tube may lead to resolution differences between each image from single line-of-sight (SLOS) technology. In order to achieve high-precision adaptive adjustments, the direction and depth of adjustment should be determined rapidly, which means that the diagnostic instrument must work within the image depth of field of its detector imaging system, requiring it to measure the image field angle of the electron beam. Here, a method based on the streak tube using the combination of planar and spherical fluorescent screens to directly calculate the image field angle of the electron beam from the rear image quality has been proposed for the first time, and its effectiveness has been proved by experiments. It is expected to provide a basis for the diagnostic equipment in ICF experiments to achieve adaptive high-precision adjustment of the focusing voltage to obtain a series of high-resolution images. Full article
(This article belongs to the Special Issue Design and Applications of Optical Microscopy Imaging System)
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11 pages, 4913 KiB  
Communication
Two-Dimensional Ultrafast X-ray Imager for Inertial Confinement Fusion Diagnosis
by Houzhi Cai, Kaixuan Lin, Qiuyan Luo, Dong Wang, Junkun Huang, Kangjing Xu, Longjie Luo and Jinyuan Liu
Photonics 2022, 9(5), 287; https://doi.org/10.3390/photonics9050287 - 22 Apr 2022
Cited by 2 | Viewed by 1883
Abstract
A two-dimensional ultrafast X-ray imager (UXI) composed of a time-dilation device, an electron-beam imaging unit, a gated microchannel plate (MCP) framing tube, and a pulser was developed. The time-dilation device extends the time spread of the electron signal generated by the pulsed photocathode [...] Read more.
A two-dimensional ultrafast X-ray imager (UXI) composed of a time-dilation device, an electron-beam imaging unit, a gated microchannel plate (MCP) framing tube, and a pulser was developed. The time-dilation device extends the time spread of the electron signal generated by the pulsed photocathode (PC), and the electron-beam imaging unit images the electron pulse from PC to MCP. Finally, the gated MCP framing tube samples the dilated electron pulse. The time resolution and image size of the UXI were measured with an X-ray generated by a terawatt laser targeting device. When a driving pulse with a 2 V/ps slope is applied to the PC, the measured time resolution is 21 ps, and the image size is 12 mm × 3.9 mm. Furthermore, the image size varies with the time resolution. The results show that as the time resolution improves, the image size decreases. The use of two opposite-transmission PC driving pulses could improve the image size. Moreover, the measured UXI spatial resolution is 5 lp/mm, and the spatial resolution will be worse with the increasing off-axis distance. Full article
(This article belongs to the Special Issue Design and Applications of Optical Microscopy Imaging System)
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Review

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25 pages, 23292 KiB  
Review
Low-Illumination Image Enhancement Based on Deep Learning Techniques: A Brief Review
by Hao Tang, Hongyu Zhu, Linfeng Fei, Tingwei Wang, Yichao Cao and Chao Xie
Photonics 2023, 10(2), 198; https://doi.org/10.3390/photonics10020198 - 12 Feb 2023
Cited by 19 | Viewed by 8519
Abstract
As a critical preprocessing technique, low-illumination image enhancement has a wide range of practical applications. It aims to improve the visual perception of a given image captured without sufficient illumination. Conventional low-illumination image enhancement methods are typically implemented by improving image brightness, enhancing [...] Read more.
As a critical preprocessing technique, low-illumination image enhancement has a wide range of practical applications. It aims to improve the visual perception of a given image captured without sufficient illumination. Conventional low-illumination image enhancement methods are typically implemented by improving image brightness, enhancing image contrast, and suppressing image noise simultaneously. Nevertheless, recent advances in this area are dominated by deep-learning-based solutions, and consequently, various deep neural networks have been proposed and applied to this field. Therefore, this paper briefly reviews the latest low-illumination image enhancement, ranging from its related algorithms to its unsolved open issues. Specifically, current low-illumination image enhancement methods based on deep learning are first sorted out and divided into four categories: supervised learning methods, unsupervised learning methods, semi-supervised learning methods, and zero-shot learning methods. Then, existing low-light image datasets are summarized and analyzed. In addition, various quality assessment indices for low-light image enhancement are introduced in detail. We also compare 14 representative algorithms in terms of both objective evaluation and subjective evaluation. Finally, the future development trend of low-illumination image enhancement and its open issues are summarized and prospected. Full article
(This article belongs to the Special Issue Design and Applications of Optical Microscopy Imaging System)
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