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Nanomaterials
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Metrology for Energy Nanomaterials
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Metrology for Energy Nanomaterials

A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Nanofabrication and Nanomanufacturing".

Deadline for manuscript submissions: closed (20 April 2024) | Viewed by 7405

Special Issue Editors

Dr. François Piquemal

E-Mail Website
Guest Editor
Direction of Scientific and Industrial Metrology, Department of Fundamental electrical Metrology, Laboratoire national de métrologie et d’essais (LNE), 78197 Trappes, France
Interests: electrical metrology at nanoscale; scanning probe microscopy; 2D materials; low-dimensional materials for energy applications
Dr. Séverine Gomès

E-Mail Website
Guest Editor
CNRS, INSA Lyon, CETHIL, Univ. Lyon, UMR5008, 69621 Villeurbanne, France
Interests: scanning thermal microscopy (SThM); nano and micro-structured materials; measurements of thermal conductivity; thermometry; heat transfer at micro and nanoscale
Dr. Luca Boarino

E-Mail Website
Guest Editor
Advanced Materials Metrology and Life Sciences Division & Nanofacility Piemonte Laboratory, Istituto Nazionale di Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135 Turin, Italy
Interests: nanofabrication; self-assembly; silicon nanostructures; advanced materials standardisation
Dr. Burkhard Beckhoff

E-Mail Website
Guest Editor
Physikalisch-Technische Bundesanstalt, PTB, D-38116 Braunschweig, Germany
Interests: X-ray spectroscopy

Special Issue Information

Dear Colleagues,

Novel technologies for alternative energy harvesting solutions are increasingly relying of the use of different classes of nanomaterials and nanostructures. This includes nanotubes, nanopillars, nanowires, 2D materials, nanosheets, nanoplatelets, nanofibers, functionalized surfaces, etc. The incorporation of nanomaterials in novel system designs is intended primarily to increase energy conversion efficiencies and improve overall performances. The demonstration of such improvements is strongly linked to adapted methods for nanoscale measurements of functional nanomaterials properties. These include but are not restricted to nanoscale thermal, electrical, mechanical, chemical, and structural properties.

The development of novel nanomaterials-based solutions for alternative energies essentially aims at producing prototypes and protocols adoptable for industrial applications. For this, measurements of nanomaterials properties should be comparable, traceable, and referenced in order to enable their industrial development. This imposes a strong need for well-developed metrology tools, calibration methods, measurement protocols, reference samples, and nanomaterials.

This Special Issue is open to contributions related to all aspects of metrology for nanomaterials in energy applications. Original research papers, reviews, technical reports, perspectives, and inter-laboratories’ comparative metrology studies are accepted for submission. Hybrid or correlative metrology approaches including different measurement methods are particularly welcome.

Topics covered in this Special Issue include but are not limited to the following:

  • Near-field scanning probe microscopy (AFM, conductive probe AFM, SCM, SMM, SThM, MFM, sNOM, etc.);
  • Scanning electron microscopy (SEM);
  • Chemical and structural characterization techniques (XPS, AES, SIMS, BET, EDX, GIXRF, etc.);
  • Electrokinetic techniques (zetametry);
  • Hybrid and correlative techniques (SEM/SMM, SEM/SThM, XRR/GIXRF, etc.);
  • Measurements of energy conversion properties (thermoelectric, piezoelectric, photovoltaic, electrochemical, etc.);
  • Measurements of energy storage properties (batteries, super capacitors, electrochemical systems, etc.);
  • Measurements of energy transport properties (thermal, electrical, etc.);
  • Metrology for fabrication of energy nanomaterials and nanodevices;
  • Reference materials and model systems for energy materials and devices.

Dr. François Piquemal
Dr. Séverine Gomès
Dr. Luca Boarino
Dr. Burkhard Beckhoff
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Nanomaterials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • metrology
  • energy nanomaterials
  • fabrication approaches for energy nanomaterials and nanodevices
  • measurements at micro- and nanoscales
  • reference samples
  • calibration methods
  • piezoelectric generators
  • 2D materials
  • electrical transport
  • thermal transport
  • electrochemical energy conversion
  • fuel cells
  • photovoltaics
  • nanomaterials for photocatalysis
  • photocatalysis

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Further information on MDPI's Special Issue policies can be found here.

Published Papers (3 papers)

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13 pages, 4565 KiB  
Article
Electrical and Thermal Conductivities of Single CuxO Nanowires
by Ivan De Carlo, Luisa Baudino, Petr Klapetek, Mara Serrapede, Fabio Michieletti, Natascia De Leo, Fabrizio Pirri, Luca Boarino, Andrea Lamberti and Gianluca Milano
Nanomaterials 2023, 13(21), 2822; https://doi.org/10.3390/nano13212822 - 25 Oct 2023
Cited by 4 | Viewed by 2024
Abstract
Copper oxide nanowires (NWs) are promising elements for the realization of a wide range of devices for low-power electronics, gas sensors, and energy storage applications, due to their high aspect ratio, low environmental impact, and cost-effective manufacturing. Here, we report on the electrical [...] Read more.
Copper oxide nanowires (NWs) are promising elements for the realization of a wide range of devices for low-power electronics, gas sensors, and energy storage applications, due to their high aspect ratio, low environmental impact, and cost-effective manufacturing. Here, we report on the electrical and thermal properties of copper oxide NWs synthetized through thermal growth directly on copper foil. Structural characterization revealed that the growth process resulted in the formation of vertically aligned NWs on the Cu growth substrate, while the investigation of chemical composition revealed that the NWs were composed of CuO rather than Cu2O. The electrical characterization of single-NW-based devices, in which single NWs were contacted by Cu electrodes, revealed that the NWs were characterized by a conductivity of 7.6 × 10−2 S∙cm−1. The effect of the metal–insulator interface at the NW–electrode contact was analyzed by comparing characterizations in two-terminal and four-terminal configurations. The effective thermal conductivity of single CuO NWs placed on a substrate was measured using Scanning Thermal Microscopy (SThM), providing a value of 2.6 W∙m−1∙K−1, and using a simple Finite Difference model, an estimate for the thermal conductivity of the nanowire itself was obtained as 3.1 W∙m−1∙K−1. By shedding new light on the electrical and thermal properties of single CuO NWs, these results can be exploited for the rational design of a wide range of optoelectronic devices based on NWs. Full article
(This article belongs to the Special Issue Metrology for Energy Nanomaterials)
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34 pages, 1608 KiB  
Article
Quantitative Measurement of Thermal Conductivity by SThM Technique: Measurements, Calibration Protocols and Uncertainty Evaluation
by Nolwenn Fleurence, Séverine Demeyer, Alexandre Allard, Sarah Douri and Bruno Hay
Nanomaterials 2023, 13(17), 2424; https://doi.org/10.3390/nano13172424 - 25 Aug 2023
Cited by 1 | Viewed by 2429
Abstract
Thermal management is a key issue for the downsizing of electronic components in order to optimise their performance. These devices incorporate more and more nanostructured materials, such as thin films or nanowires, requiring measurement techniques suitable to characterise thermal properties at the nanoscale, [...] Read more.
Thermal management is a key issue for the downsizing of electronic components in order to optimise their performance. These devices incorporate more and more nanostructured materials, such as thin films or nanowires, requiring measurement techniques suitable to characterise thermal properties at the nanoscale, such as Scanning Thermal Microscopy (SThM). In active mode, a hot thermoresistive probe scans the sample surface, and its electrical resistance R changes as a function of heat transfers between the probe and sample. This paper presents the measurement and calibration protocols developed to perform quantitative and traceable measurements of thermal conductivity k using the SThM technique, provided that the heat transfer conditions between calibration and measurement are identical, i.e., diffusive thermal regime for this study. Calibration samples with a known k measured at the macroscale are used to establish the calibration curve linking the variation of R to k. A complete assessment of uncertainty (influencing factors and computational techniques) is detailed for both the calibration parameters and the estimated k value. Outcome analysis shows that quantitative measurements of thermal conductivity with SThM (with an uncertainty value of 10%) are limited to materials with low thermal conductivity (k<10Wm−1K−1). Full article
(This article belongs to the Special Issue Metrology for Energy Nanomaterials)
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13 pages, 2935 KiB  
Article
Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples
by Steffen Staeck, Anna Andrle, Philipp Hönicke, Jonas Baumann, Daniel Grötzsch, Jan Weser, Gesa Goetzke, Adrian Jonas, Yves Kayser, Frank Förste, Ioanna Mantouvalou, Jens Viefhaus, Victor Soltwisch, Holger Stiel, Burkhard Beckhoff and Birgit Kanngießer
Nanomaterials 2022, 12(21), 3766; https://doi.org/10.3390/nano12213766 - 26 Oct 2022
Cited by 9 | Viewed by 2139
Abstract
Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as oxygen, nitrogen or carbon [...] Read more.
Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as oxygen, nitrogen or carbon cannot be efficiently investigated in this energy range, because of the ineffective excitation. Moreover, common CCD detectors are not able to discriminate between fluorescence lines below 1 keV. Oxygen and nitrogen are important components of insulation and passivation layers, for example, in silicon oxide or silicon nitride. In this work, scan-free GEXRF is applied in proof-of-concept measurements for the investigation of lateral ordered 2D nanostructures in the soft X-ray range. The sample investigated is a Si3N4 lamellar grating, which represents 2D periodic nanostructures as used in the semiconductor industry. The emerging two-dimensional fluorescence patterns are recorded with a CMOS detector. To this end, energy-dispersive spectra are obtained via single-photon event evaluation. In this way, spatial and therefore angular information is obtained, while discrimination between different photon energies is enabled. The results are compared to calculations of the sample model performed by a Maxwell solver based on the finite-elements method. A first measurement is carried out at the UE56-2 PGM-2 beamline at the BESSY II synchrotron radiation facility to demonstrate the feasibility of the method in the soft X-ray range. Furthermore, a laser-produced plasma source (LPP) is utilized to investigate the feasibility of this technique in the laboratory. The results from the BESSY II measurements are in good agreement with the simulations and prove the applicability of scan-free GEXRF in the soft X-ray range for quality control and process engineering of 2D nanostructures. The LPP results illustrate the chances and challenges concerning a transfer of the methodology to the laboratory. Full article
(This article belongs to the Special Issue Metrology for Energy Nanomaterials)
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