Beyond Moore Technology and Devices

A special issue of Micromachines (ISSN 2072-666X). This special issue belongs to the section "A:Physics".

Deadline for manuscript submissions: closed (25 March 2023) | Viewed by 8212

Special Issue Editor


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Guest Editor
Key Laboratory of Multifunctional Nanomaterials and Smart Systems, Suzhou Institute of NanoTech and Nano-Bionics, Chinese Academy of Sciences, Suzhou 215123, China
Interests: 2D materials and devices; ferroelectric materials and devices; spintronics; quantum transport

Special Issue Information

Dear Colleagues,

Moore's law is an empirical observation made by Gordon Moore in 1965 that the number of transistors in a dense integrated circuit (IC) doubles about every two years. Moore's Law has propelled the development of the semiconductor industry for a half-century due to the advances in silicon electronics in miniaturization. As silicon devices reach atomic scale and fabrication costs continue to rise, Moore’s law is anticipated to flatten by 2025, giving rise to post-Moore technologies afterward. The development beyond Moore's evolving technology requires an investment in basic science, including material science and device physics, to explore candidate replacement materials, device structures and system architectures to foster the continued technology scaling. Thus, new chip materials, novel devices structure, new integration processes, and special system architecture have emerged as a fascinating field of research and development to move electronics beyond Moore’s Law. Accordingly, this Special Issue seeks to showcase research papers, communications, and review articles that focus on beyond Moore technology and devices including beyond silicon materials, new device structure, novel integration technology and alternative system architecture.

Dr. Xiaowei Wang
Guest Editor

Manuscript Submission Information

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Keywords

  • beyond silicon materials
  • beyond CMOS devices
  • novel integration process
  • non-von neumann architecture

Published Papers (1 paper)

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Review

28 pages, 9485 KiB  
Review
A Review of System-in-Package Technologies: Application and Reliability of Advanced Packaging
by Haoyu Wang, Jianshe Ma, Yide Yang, Mali Gong and Qinheng Wang
Micromachines 2023, 14(6), 1149; https://doi.org/10.3390/mi14061149 - 29 May 2023
Cited by 13 | Viewed by 7763
Abstract
The system-in-package (SiP) has gained much interest in the current rapid development of integrated circuits (ICs) due to its advantages of integration, shrinking, and high density. This review examined the SiP as its focus, provides a list of the most-recent SiP innovations based [...] Read more.
The system-in-package (SiP) has gained much interest in the current rapid development of integrated circuits (ICs) due to its advantages of integration, shrinking, and high density. This review examined the SiP as its focus, provides a list of the most-recent SiP innovations based on market needs, and discusses how the SiP is used in various fields. Reliability issues must be resolved if the SiP is to operate normally. Three factors—thermal management, mechanical stress and electrical properties—can be paired with specific examples in order to detect and improve package reliability. This review provides a thorough overview of SiP technology, serves as a guide and foundation for the SiP in package reliability design, and addresses the challenges and potential for further development of this kind of package. Full article
(This article belongs to the Special Issue Beyond Moore Technology and Devices)
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