Characterization of Nanostructure Materials
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Nanomaterials and Nanotechnology".
Deadline for manuscript submissions: closed (20 January 2023) | Viewed by 1680
Special Issue Editor
Interests: device technology; dielectric spectroscopy; high-pressure physics; e-beam PVD; chemical and electrochemical material growth; structural and properties study of nanomaterials using electron microscopy; optical properties of semiconductors
Special Issue Information
Dear Colleagues,
Nanoscience has undergone surging development in recent decades with a simultaneous transition of scientific results to innovative technologies which in turn enrich and expand the potentialities of nanoscience and nanotechnology. The numerous interdisciplinary applications range from energy and electronics to medicine and industry. The backbone of the whole process, from synthesis to specific applications, is material characterization to probe the specific characteristics and qualities of materials and devices. Both standalone and combined, various methods provide an insight to structural or compositional information, such as the shape, size, crystal structure, chemical composition, surface or interface environment, as well as physicochemical responses which can be, among others, optical, electrical, or magnetic.
This Special Issue on “Characterization of Nanostructure Materials” aspires to present the various characterization methods and capabilities which emerge through their application to the broad spectrum of nanotechnology.
Dr. Elias Sakellis
Guest Editor
Manuscript Submission Information
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Keywords
- nanoscience
- characterization methods
- nanostructures
