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Microscopy and Microanalysis in Nanostructured Materials
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Microscopy and Microanalysis in Nanostructured Materials

A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Nanomaterials and Nanotechnology".

Deadline for manuscript submissions: closed (31 October 2021) | Viewed by 6866

Special Issue Editor

Prof. Dr. Julio Ramírez-Castellanos

E-Mail Website
Guest Editor
Department of Inorganic Chemistry, Complutense University of Madrid, Madrid, Spain
Interests: functional nanomaterials; oxides; electron microscopy; electrical properties
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

The chemical composition, structure, morphology, and particle size of functional nanostructured materials are key to their future technological application. With this in mind, it is necessary to develop new and different synthesis methods that ensure the compositional and morphological homogeneity of the obtained nanomaterials. The characterization techniques allow structural and microstructural characterizations, as well as the study of their physical properties. All of this contributes to the establishment of the structural–microstructural–property relationships, which allows us to understand their technological applications.

A detailed structural characterization must be performed in order to understand the mechanisms that control the functional behavior of these nanostructured materials at an atomic level, using the information obtained from advanced microscopy techniques, which allows the simultaneous acquisition of structural and compositional data at an atomic scale for the development of more effective devices.

Therefore, I invite all researchers in this field to participate with their latest results as well as review articles in the upcoming Special Issue in order to contribute to the knowledge and development of Nanostructured Materials in the future.

Prof. Dr. Julio Ramírez-Castellanos
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • nanostructured material
  • structure
  • electron microscopy
  • microanalysis
  • physical properties

Published Papers (3 papers)

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Research

14 pages, 54850 KiB  
Article
Preparation and Characterization of Pure SiC Ceramics by HTPVT Induced by Seeding with SiC Nanoarrays
by Yu-Chen Deng, Nan-Long Zhang, Qiang Zhi, Bo Wang and Jian-Feng Yang
Materials 2021, 14(21), 6317; https://doi.org/10.3390/ma14216317 - 22 Oct 2021
Cited by 1 | Viewed by 1447
Abstract
Dense SiC ceramics were fabricated by high-temperature physical vapor transport (HTPVT) growth process using SiC nanoarrays as the crystal seeds, which was obtained by vacuum heat treatment of amorphous SiC films prepared by plasma-enhanced chemical vapor deposition (PECVD) with a porous anodic aluminum [...] Read more.
Dense SiC ceramics were fabricated by high-temperature physical vapor transport (HTPVT) growth process using SiC nanoarrays as the crystal seeds, which was obtained by vacuum heat treatment of amorphous SiC films prepared by plasma-enhanced chemical vapor deposition (PECVD) with a porous anodic aluminum oxide (AAO) template. In the HTPVT process, two-step holding was adopted, and the temperature at the first step was controlled at 2100 and 2150 °C to avoid SiC nanoarrays evaporation, and the grain size of SiC crystal increased with the increase in temperature and decrease in the pressure of Ar. The temperature of the second step was 2300 °C, and rapid SiC grain growth and gradual densification were achieved. The prepared SiC ceramics exhibited a relative density of more than 99%, an average grain size of about 100 μm, a preferred orientation along the (0 0 0 6) plane, a Vickers hardness of about 29 GPa, a flexural strength of about 360 MPa, and thermal conductivity at room temperature of more than 200 W·m−1·K−1. Full article
(This article belongs to the Special Issue Microscopy and Microanalysis in Nanostructured Materials)
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15 pages, 7358 KiB  
Article
The Effect of Humidity on the Atomization Process and Structure of Nanopowder Designed for Extinguishment
by Mateusz Biel, Piotr Izak, Krystian Skubacz, Agata Stempkowska and Joanna Mastalska-Popławska
Materials 2021, 14(12), 3329; https://doi.org/10.3390/ma14123329 - 16 Jun 2021
Cited by 1 | Viewed by 1713
Abstract
Increasingly, firefighting aerosols are being used to extinguish fires. It is assumed that the extinguishing mechanism involves breaking the chain of physicochemical reactions occurring during combustion by binding free radicals at ignition. The radicals are most likely formed from the transformation of water [...] Read more.
Increasingly, firefighting aerosols are being used to extinguish fires. It is assumed that the extinguishing mechanism involves breaking the chain of physicochemical reactions occurring during combustion by binding free radicals at ignition. The radicals are most likely formed from the transformation of water molecules, with the active surfaces of aerosol micro- or even nanoparticles. The aerosol extinguishing method is very effective even though it does not reduce oxygen levels in the air. In contrast to typical extinguishing powders, the aerosol leaves a trace amount of pollutants and, above all, does not adversely affect the environment by depleting the ozone layer and increasing greenhouse effects. Depending on how the firefighting generators are released, the aerosol can act locally or volumetrically, but depending on environmental conditions, its effectiveness can be variable. The article presents the influence of environmental humidity on the atomization of aerosol nanosize, which confirms the radical combustion mechanism. This paper presents the effect of environmental humidity on the atomization of aerosol superfine (nano) particles. The main focus was on the grain distribution and its effect on the surface activity of the FP-40C type firefighting aerosol. Changes in the characteristic parameters of the particle size distribution of RRSB (Rosin-Rammler-Sperling-Bennet) are presented. Full article
(This article belongs to the Special Issue Microscopy and Microanalysis in Nanostructured Materials)
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11 pages, 5592 KiB  
Article
Monitoring Carbon in Electron and Ion Beam Deposition within FIB-SEM
by Nicholas T. H. Farr, Gareth M. Hughes and Cornelia Rodenburg
Materials 2021, 14(11), 3034; https://doi.org/10.3390/ma14113034 - 02 Jun 2021
Cited by 17 | Viewed by 3019
Abstract
It is well known that carbon present in scanning electron microscopes (SEM), Focused ion beam (FIB) systems and FIB-SEMs, causes imaging artefacts and influences the quality of TEM lamellae or structures fabricated in FIB-SEMs. The severity of such effects depends not only on [...] Read more.
It is well known that carbon present in scanning electron microscopes (SEM), Focused ion beam (FIB) systems and FIB-SEMs, causes imaging artefacts and influences the quality of TEM lamellae or structures fabricated in FIB-SEMs. The severity of such effects depends not only on the quantity of carbon present but also on its bonding state. Despite this, the presence of carbon and its bonding state is not regularly monitored in FIB-SEMs. Here we demonstrated that Secondary Electron Hyperspectral Imaging (SEHI) can be implemented in different FIB-SEMs (ThermoFisher Helios G4-CXe PFIB and Helios Nanolab G3 UC) and used to observe carbon built up/removal and bonding changes resulting from electron/ion beam exposure. As well as the ability to monitor, this study also showed the capability of Plasma FIB Xe exposure to remove carbon contamination from the surface of a Ti6246 alloy without the requirement of chemical surface treatments. Full article
(This article belongs to the Special Issue Microscopy and Microanalysis in Nanostructured Materials)
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