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Materials
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Non-Destructive Evaluation on Hidden Damage of Micro/Nano Structures
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Non-Destructive Evaluation on Hidden Damage of Micro/Nano Structures

A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".

Deadline for manuscript submissions: closed (20 December 2021) | Viewed by 4568

Special Issue Editors

Prof. Dr. Ik-Keun Park

E-Mail Website
Guest Editor
NDT Research Center, Seoul National University of Science and Technology (SeoulTech), Seoul, Republic of Korea
Interests: nondestructive testing and evaluation (NDT&E); phased-array ultrasound (UT&PAUT); nondestructive material characterization
Special Issues, Collections and Topics in MDPI journals
Dr. Chungseok Kim

E-Mail Website
Guest Editor
Department of Materials Science and Engineering, Chosun University, Gwangju, Republic of Korea
Interests: nonlinear ultrasonic NDT; material damage; material design
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

Micro/nano structures are widely applied in high-tech industries such as the bio, energy, automobile, electric and electronics (semiconductor and display), robots, and automation industries. Nondestructive testing and evaluation (NDT&E) is one of the most critical aspects in many fields. Conventional techniques for evaluation/characterization of defects and properties of micro/nano structures mainly involves analysis of TEM, SEM, AFM, and XRD data and images. Although providing the most achievable resolution, the techniques focus on crystal structures near the surface of a very small area, which requires specimen preparation.

To be able to discover and evaluate hidden damage inside micro/nano structures, various nondestructive evaluation techniques have been proposed, such as UT, RT, and ECT. Most of the nondestructive methods were developed for both in situ and laboratory examinations, and have been playing a pivotal role in various industries. However, considering the growing complexity of micro/nano structures, advances in nondestructive evaluation techniques are being demanded.

This Special Issue will focus on fostering improvements and new developments of technology in areas related to novel techniques and approaches for characterizing hidden damage in micro/nano structures. Accounts of experimental and numerical modeling/simulation research on all aspects related to this multidisciplinary subject are welcome. Original research articles as well as review articles dealing with innovative advances in nondestructive evaluation techniques represent valuable scientific contributions in the field of micro/nano structure characterization.

We look forward to and welcome your participation in this Special Issue.

Potential topics include, but are not limited to, the following:

  • Micro/nano structure, hidden damage (micro-/nanoscale) detection and assessment
  • Nondestructive evaluation (NDE)/material characterization
  • Stress, strain, and mechanical property measurements
  • Ultrasonic NDE (imaging and sensing), scanning acoustic microscopy (SAM)
  • Digital radiographic testing
  • Eddy current and electromagnetics
  • Nonlinear ultrasonic applications
  • Terahertz applications
  • Digital optical (holography, etc.) convergence application

Prof. Dr. Ik-Keun Park
Prof. Dr. Chungseok Kim
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • micro/nano structure, hidden damage (micro-/nanoscale) detection and assessment
  • nondestructive evaluation (NDE)/material characterization
  • stress, strain, and mechanical property measurements
  • ultrasonic NDE (imaging and sensing), scanning acoustic microscopy (SAM)
  • digital radiographic testing
  • eddy current and electromagnetics
  • nonlinear ultrasonic applications
  • terahertz applications
  • digital optical (holography, etc.) convergence application

Published Papers (2 papers)

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Research

12 pages, 4345 KiB  
Article
Development of a High-Resolution Acoustic Sensor Based on ZnO Film Deposited by the RF Magnetron Sputtering Method
by Dong-Chan Kang, Jeong-Nyeon Kim and Ik-Keun Park
Materials 2021, 14(22), 6870; https://doi.org/10.3390/ma14226870 - 14 Nov 2021
Cited by 3 | Viewed by 1650
Abstract
In the study, an acoustic sensor for a high-resolution acoustic microscope was fabricated using zinc oxide (ZnO) piezoelectric ceramics. The c-cut sapphire was processed into a lens shape to deposit a ZnO film using radio frequency (RF) magnetron sputtering, and an upper and [...] Read more.
In the study, an acoustic sensor for a high-resolution acoustic microscope was fabricated using zinc oxide (ZnO) piezoelectric ceramics. The c-cut sapphire was processed into a lens shape to deposit a ZnO film using radio frequency (RF) magnetron sputtering, and an upper and a lower electrode were deposited using E-beam evaporation. The electrode was a Au thin film, and a Ti thin film was used as an adhesion layer. The surface microstructure of the ZnO film was observed using a scanning electron microscope (SEM), the thickness of the film was measured using a focused ion beam (FIB) for piezoelectric ceramics deposited on the sapphire wafer, and the thickness of ZnO was measured to be 4.87 μm. As a result of analyzing the crystal growth plane using X-ray diffraction (XRD) analysis, it was confirmed that the piezoelectric characteristics were grown to the (0002) plane. The sensor fabricated in this study had a center frequency of 352 MHz. The bandwidth indicates the range of upper (375 MHz) and lower (328 MHz) frequencies at the −6 dB level of the center frequency. As a result of image analysis using the resolution chart, the resolution was about 1 μm. Full article
(This article belongs to the Special Issue Non-Destructive Evaluation on Hidden Damage of Micro/Nano Structures)
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16 pages, 8150 KiB  
Article
Experimental Verification of Contact Acoustic Nonlinearity at Rough Contact Interfaces
by Youngbeom Kim, Sungho Choi, Kyung-Young Jhang and Taehyeon Kim
Materials 2021, 14(11), 2988; https://doi.org/10.3390/ma14112988 - 31 May 2021
Cited by 7 | Viewed by 2465
Abstract
When a longitudinal wave passes through a contact interface, second harmonic components are generated due to contact acoustic nonlinearity (CAN). The magnitude of the generated second harmonic is related to the contact state of the interface, of which a model has been developed [...] Read more.
When a longitudinal wave passes through a contact interface, second harmonic components are generated due to contact acoustic nonlinearity (CAN). The magnitude of the generated second harmonic is related to the contact state of the interface, of which a model has been developed using linear and nonlinear interfacial stiffness. However, this model has not been sufficiently verified experimentally for the case where the interface has a rough surface. The present study verifies this model through experiments using rough interfaces. To do this, four sets of specimens with different interface roughness values (Ra = 0.179 to 4.524 μm) were tested; one set consists of two Al6061-T6 blocks facing each other. The second harmonic component of the transmitted signal was analyzed while pressing on both sides of the specimen set to change the contact state of the interface. The experimental results showed good agreement with the theoretical prediction on the rough interface. The magnitude of the second harmonic was maximized at a specific contact pressure. As the roughness of the contact surface increased, the second harmonic was maximized at a higher contact pressure. The location of this maximal point was consistent between experiments and theory. In this study, an FEM simulation was conducted in parallel and showed good agreement with the theoretical results. Thus, the developed FEM model allows parametric studies on various states of contact interfaces. Full article
(This article belongs to the Special Issue Non-Destructive Evaluation on Hidden Damage of Micro/Nano Structures)
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