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Micromechanical Characterisation and Structures of Materials

This special issue belongs to the section "Advanced Materials Characterization".

Special Issue Information

Keywords

  • Microscale characterisation
  • Mechanical testing
  • Nano/microscale materials
  • Technique optimization
  • Electron microscopy
  • Focused ion beam (FIB) techniques
  • Nanoindentation
  • Atomic force microscopy (AFM)
  • Diffraction methods

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Published Papers

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Materials - ISSN 1996-1944