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Surface and Interface Defects of Semiconductor Materials

A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".

Deadline for manuscript submissions: 20 August 2024 | Viewed by 101

Special Issue Editor


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Guest Editor
Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China
Interests: semiconductor materials; MOS devices; surface and interface

Special Issue Information

Dear Colleagues,

Understanding the static and dynamic properties of defects is one of the key research areas in semiconductor materials science. Especially for semiconductor devices, surface and interface defects of semiconductor materials affect or even determine the performance and reliability of the devices. An in-depth understanding of the structure and characteristics of defects at the surface and interface and their impact on electrical properties is important for the performance optimization of semiconductor devices.

Considering the above, this Special Issue aims to bring together cutting-edge research and covers topics contributing to a better understanding of surface and interface defects and their applications. We aim to share, present, and discuss innovative methods of analysis, characterization, and regulation which may help us to further identify surface and interface defects and improve the performance of semiconductor devices. The submission of original research and review articles is welcome, whether they are about theoretical calculations or experimental characterization techniques.

Dr. Shengkai Wang
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • creation and excitation of defects
  • defect modification
  • semiconductor devices—surface and interface
  • interface traps and near-interface traps
  • density functional calculations
  • characterization methods
  • applications

Published Papers

This special issue is now open for submission.
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