Radiation Effects on Advanced Electronic Devices and Circuits
A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Semiconductor Devices".
Deadline for manuscript submissions: 15 January 2026 | Viewed by 1391
Special Issue Editors
Interests: radiation reliability; AlGaN/GaN HEMTs; 3D NAND; IGZO; CMOS devices; low-frequency noise; dynamic random access memory
Interests: gate oxide; high-k dielectrics; high-frequency measurement; reliability
Interests: failure mechanisms and models of semiconductor devices and ferroelectric transistors and memories; reliability sensitivity characterization techniques; reliability of circuits and systems; radiation reliability
Special Issue Information
Dear Colleagues,
Cutting-edge integrated circuit (IC) technologies are relied upon heavily by modern devices and AI systems that match or surpass human performance in numerous applications due to the remarkable advancements in their computational abilities. Over the past few decades, IC components, especially advanced semiconductor devices, have shrunk dramatically in size from tens of microns to nanoscale dimensions. This miniaturization, coupled with advancements in manufacturing techniques, has enabled higher transistor densities and significant improvements in IC performance, cost-effectiveness, and reliability. Critical systems, such as those used in defense, space exploration, and high-energy particle detection, depend on these advanced IC technologies to perform essential functions in environments exposed to high radiation. However, high-radiation conditions can degrade such materials, devices, and ICs, leading to unpredictable behavior or outright failure. If these risks are not addressed during system design, construction, and operation, or if errors are not identified and corrected during use, the consequences could be catastrophic. Moreover, as IC dimensions continue to shrink and operating voltages decrease, electronic systems are becoming increasingly susceptible to radiation effects, not only in avionics but also at ground level. As a result, radiation reliability has become a major concern for electronic applications.
We are pleased to announce a Special Issue on “Radiation Effects on Advanced Electronic Devices and Circuits”, inviting researchers and experts in the field to present their novel and recent achievements in topics of interest that may include, but are not limited to, the following:
- Effects of radiation on materials and semiconductor devices.
- Effects of radiation on the circuit and system level, like SRAM.
- Radiation hardness technology to improve the reliability of electronic components under harsh radiation environments.
- Novel characterization methods, like advanced AI algorithms, to explore the radiation degradation of semiconductor materials and electronic components/systems.
This is a fantastic opportunity to present your work and enrich the collective understanding in the field of radiation effects on electronic materials, components, and systems. We welcome submissions that showcase innovative research, introduce new methodologies, and highlight practical electronic applications of technologies and systems under harsh radiation environments. We eagerly anticipate your valuable contributions and hope that this Special Issue will inspire collaboration and knowledge sharing among researchers and readers.
We look forward to receiving your contributions.
Dr. Xun Li
Dr. Yuhang Sun
Dr. Hua Chen
Dr. Hao Qiu
Guest Editors
Manuscript Submission Information
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Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- radiation reliability
- semiconductor devices
- electronic devices and systems
- total ionizing dose (TID)
- displacement damage (DD)
- single-event effects
- radiation hardness
- artificial intelligence
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