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Special Issue "X-ray and neutron Line Profile Analysis of Microstructures"
Deadline for manuscript submissions: 15 January 2020.
at present at: School of Materials, The University of Manchester, Manchester, UK
Interests: line broadening; domain size; crystallite size; dislocations; microstrains; intergranular strains effect on line broadening; texture effect on line broadening; geometrically necessary dislocations; submicron grain size
X-ray and neutron line profile analysis proves to be an ever more powerful method to reveal many different quantitative aspects of microstructure properties in crystalline materials. It has become one of the most widely used complementary tools to electron microscopy for characterizing microstructures of materials. Functional properties of crystalline materials are determined by both the crystal structure and the imperfectness of crystal structure, where imperfectness comprises of a large variety of lattice defects. When the crystal lattice becomes imperfect diffraction peaks broaden and the kind and type of broadening also reveals great variety. Coherently scattering domains gives size broadening, dislocations, intergranular strains, thermal anisotropy in non-cubic crystals or misfit between matrix and second-phase particles produce strain broadening, planar defects of different kinds make peaks shift and broaden, chemical inhomogeneities on different scales produce specific peak shifts and shapes. All these effects can combine in various manners. On top of all that peaks can not only broaden but also become asymmetric. The vast variety of peak broadening, shift and shape is the topic of line profile analysis. Entanglement of the different causes in complex appearance of line profile patterns is the art of line profile analysis. All contributions are invited which can correlate diffraction patterns of imperfect crystalline materials with specific lattice defects. The method of obtaining lattice defect types and quantities from analysing diffraction patterns is very welcome. The relevance of specified lattice defects to fundamental materials properties is especially appreciated. Modeling diffraction patterns corresponding to different lattice defects is most welcome.
Prof. Emeritus Tamás Ungár
Dr. Gábor Ribárik
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Crystals is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
- X-ray line broadening
- neutron line broadening
- size broadening
- strain broadening
- residual internal strains
- intergranular strains
- chemical heterogeneities
- modeling diffraction patterns
- texture and line profiles