Special Issue "X-ray and neutron Line Profile Analysis of Microstructures"
A special issue of Crystals (ISSN 2073-4352).
Deadline for manuscript submissions: closed (15 January 2020).
at present at: School of Materials, The University of Manchester, Manchester, UK
Interests: line broadening; domain size; crystallite size; dislocations; microstrains; intergranular strains effect on line broadening; texture effect on line broadening; geometrically necessary dislocations; submicron grain size
X-ray and neutron line profile analysis proves to be an ever more powerful method to reveal many different quantitative aspects of microstructure properties in crystalline materials. It has become one of the most widely used complementary tools to electron microscopy for characterizing microstructures of materials. Functional properties of crystalline materials are determined by both the crystal structure and the imperfectness of crystal structure, where imperfectness comprises of a large variety of lattice defects. When the crystal lattice becomes imperfect diffraction peaks broaden and the kind and type of broadening also reveals great variety. Coherently scattering domains gives size broadening, dislocations, intergranular strains, thermal anisotropy in non-cubic crystals or misfit between matrix and second-phase particles produce strain broadening, planar defects of different kinds make peaks shift and broaden, chemical inhomogeneities on different scales produce specific peak shifts and shapes. All these effects can combine in various manners. On top of all that peaks can not only broaden but also become asymmetric. The vast variety of peak broadening, shift and shape is the topic of line profile analysis. Entanglement of the different causes in complex appearance of line profile patterns is the art of line profile analysis. All contributions are invited which can correlate diffraction patterns of imperfect crystalline materials with specific lattice defects. The method of obtaining lattice defect types and quantities from analysing diffraction patterns is very welcome. The relevance of specified lattice defects to fundamental materials properties is especially appreciated. Modeling diffraction patterns corresponding to different lattice defects is most welcome.
Prof. Emeritus Tamás Ungár
Dr. Gábor Ribárik
Manuscript Submission Information
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- X-ray line broadening
- neutron line broadening
- size broadening
- strain broadening
- residual internal strains
- intergranular strains
- chemical heterogeneities
- modeling diffraction patterns
- texture and line profiles