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Open AccessArticle

In-Situ Synchrotron Profile Analysis after High-Pressure Torsion Deformation

1
Faculty of Physics, University of Vienna, Vienna 1090, Austria
2
Chair of Materials Physics, Department of Material Science, University of Leoben, Leoben 8700, Austria
3
Department of Lithospheric Research, University of Vienna, Vienna 1090, Austria
4
Department of Materials Physics, Eötvös University Budapest, 1518 Budapest, Hungary
5
Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
*
Author to whom correspondence should be addressed.
Crystals 2019, 9(5), 232; https://doi.org/10.3390/cryst9050232
Received: 5 April 2019 / Revised: 26 April 2019 / Accepted: 26 April 2019 / Published: 29 April 2019
(This article belongs to the Special Issue X-ray and neutron Line Profile Analysis of Microstructures)
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Abstract

The presence of hydrostatic pressure is a general crucial characteristic of severe plastic deformation methods for reaching high strains and for introducing large quantities of lattice defects, which are necessary to establish new grain boundaries. Insights into the processes occurring during deformation and the influence of hydrostatic pressure are necessary to help better understand the SPD methods. A special experimental procedure was designed to simulate the hydrostatic pressure release: High pressure torsion (HPT)-deformed microstructure changes related to the release of hydrostatic pressure after the HPT deformation of copper and nickel were studied by freezing the sample before releasing the pressure. High-resolution in-situ X-ray diffraction of the heating process was performed using synchrotron radiation in order to apply X-ray line profile analysis to analyze the pressure release. The results on copper and nickel generally indicated the influence of hydrostatic pressure on the mobility and interaction of deformation-induced defects as well as the resulting microstructure. View Full-Text
Keywords: severe plastic deformation; hydrostatic pressure; pressure release; defect mobility severe plastic deformation; hydrostatic pressure; pressure release; defect mobility
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
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Kerber, M.; Spieckermann, F.; Schuster, R.; Joni, B.; Schell, N.; Schafler, E. In-Situ Synchrotron Profile Analysis after High-Pressure Torsion Deformation. Crystals 2019, 9, 232.

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