You are currently viewing a new version of our website. To view the old version click .

Advanced Studies in Coordinate Measuring Technique

This special issue belongs to the section “Optics and Lasers“.

Special Issue Information

Dear Colleagues,

This Special Issue focus on the advanced studies of coordinate measuring techniques. We mainly include the extended version of the conference paper from the XV International Scientific Conference ‘Coordinate Measuring Technique’ CMT24. However, we also welcome submissions from other research groups.

We welcome original research, case studies, and practical implementations focused on, but not limited to, the following:

  • development in a field of coordinate measuring techniques,
  • coordinate measuring machines,
  • theory of coordinate measurements,
  • measurement uncertainty,
  • traceability and inspection of coordinate measuring systems,
  • use of metrology in the production of machine elements,
  • the role and tasks of metrology in quality assurance systems,
  • new trends in surface measurements,
  • visualization and virtualization techniques,
  • metrology in The Fourth Industrial Revolution,
  • coordinate metrology education,
  • geometrical product specification.

Prof. Dr. Adam Gąska
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • development in a field of coordinate measuring techniques
  • coordinate measuring machines
  • theory of coordinate measurements
  • measurements uncertainty
  • traceability and inspection of coordinate measuring systems
  • use of metrology in the production of machine elements
  • the role and tasks of metrology in quality assurance systems
  • new trends in surface measurements
  • visualization and virtualization techniques
  • metrology in The Fourth Industrial Revolution
  • coordinate metrology education
  • geometrical product specification

Benefits of Publishing in a Special Issue

  • Ease of navigation: Grouping papers by topic helps scholars navigate broad scope journals more efficiently.
  • Greater discoverability: Special Issues support the reach and impact of scientific research. Articles in Special Issues are more discoverable and cited more frequently.
  • Expansion of research network: Special Issues facilitate connections among authors, fostering scientific collaborations.
  • External promotion: Articles in Special Issues are often promoted through the journal's social media, increasing their visibility.
  • e-Book format: Special Issues with more than 10 articles can be published as dedicated e-books, ensuring wide and rapid dissemination.

Published Papers

Get Alerted

Add your email address to receive forthcoming issues of this journal.

XFacebookLinkedIn
Appl. Sci. - ISSN 2076-3417