Gao, X.; Jia, Q.; Wang, Y.; Zhang, H.; Ma, L.; Zou, G.; Guo, F.
Review on Power Cycling Reliability of SiC Power Device. Electron. Mater. 2024, 5, 80-100.
https://doi.org/10.3390/electronicmat5020007
AMA Style
Gao X, Jia Q, Wang Y, Zhang H, Ma L, Zou G, Guo F.
Review on Power Cycling Reliability of SiC Power Device. Electronic Materials. 2024; 5(2):80-100.
https://doi.org/10.3390/electronicmat5020007
Chicago/Turabian Style
Gao, Xu, Qiang Jia, Yishu Wang, Hongqiang Zhang, Limin Ma, Guisheng Zou, and Fu Guo.
2024. "Review on Power Cycling Reliability of SiC Power Device" Electronic Materials 5, no. 2: 80-100.
https://doi.org/10.3390/electronicmat5020007
APA Style
Gao, X., Jia, Q., Wang, Y., Zhang, H., Ma, L., Zou, G., & Guo, F.
(2024). Review on Power Cycling Reliability of SiC Power Device. Electronic Materials, 5(2), 80-100.
https://doi.org/10.3390/electronicmat5020007