Tognazzi, A.; Rocco, D.; Gandolfi, M.; Locatelli, A.; Carletti, L.; De Angelis, C.
High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing. Optics 2021, 2, 193-199.
https://doi.org/10.3390/opt2030018
AMA Style
Tognazzi A, Rocco D, Gandolfi M, Locatelli A, Carletti L, De Angelis C.
High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing. Optics. 2021; 2(3):193-199.
https://doi.org/10.3390/opt2030018
Chicago/Turabian Style
Tognazzi, Andrea, Davide Rocco, Marco Gandolfi, Andrea Locatelli, Luca Carletti, and Costantino De Angelis.
2021. "High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing" Optics 2, no. 3: 193-199.
https://doi.org/10.3390/opt2030018
APA Style
Tognazzi, A., Rocco, D., Gandolfi, M., Locatelli, A., Carletti, L., & De Angelis, C.
(2021). High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing. Optics, 2(3), 193-199.
https://doi.org/10.3390/opt2030018