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Photonics 2017, 4(2), 29;

Polarization Characterization of Soft X-Ray Radiation at FERMI FEL-2

Elettra-Sincrotrone Trieste, Strada Statale 14-km 163,5 in AREA Science Park, 34149 Trieste, Italy
Università degli Studi di Trieste, Dipartimento di Fisica, Piazzale Europa 1, 34127 Trieste, Italy
IOM-CNR, Laboratorio TASC, 34149 Trieste, Italy
European XFEL GmbH, Holzkoppel 4, 22869 Schenefeld, Germany
DESY, Notkestrasse 85, 22607 Hamburg, Germany
ENEA, Via Enrico Fermi 45, 00044 Frascati, Italy
Current address: Particle Accelerator Physics Laboratory, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
Current address: Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland
Current address: Institut für Physik und CINSaT, Universität Kassel, Heinrich-Plett-Strasse 40, 34132 Kassel,Germany
Author to whom correspondence should be addressed.
Received: 31 January 2017 / Revised: 4 April 2017 / Accepted: 5 April 2017 / Published: 10 April 2017
(This article belongs to the Special Issue Extreme UV Lasers: Technologies and Applications)
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The control of polarization state in soft and hard X-ray light is of crucial interest to probe structural and symmetry properties of matter. Thanks to their Apple-II type undulators, the FERMI-Free Electron Lasers are able to provide elliptical, circular or linearly polarized light within the extreme ultraviolet and soft X-ray range. In this paper, we report the characterization of the polarization state of FERMI FEL-2 down to 5 nm. The results show a high degree of polarization of the FEL pulses, typically above 95%. The campaign of measurements was performed at the Low Density Matter beamline using an electron Time-Of-Flight based polarimeter. View Full-Text
Keywords: free-electron laser; extreme ultraviolet; soft X-ray; polarization control free-electron laser; extreme ultraviolet; soft X-ray; polarization control

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Roussel, E.; Allaria, E.; Callegari, C.; Coreno, M.; Cucini, R.; Mitri, S.D.; Diviacco, B.; Ferrari, E.; Finetti, P.; Gauthier, D.; Penco, G.; Raimondi, L.; Svetina, C.; Zangrando, M.; Beckmann, A.; Glaser, L.; Hartmann, G.; Scholz, F.; Seltmann, J.; Shevchuk, I.; Viefhaus, J.; Giannessi, L. Polarization Characterization of Soft X-Ray Radiation at FERMI FEL-2. Photonics 2017, 4, 29.

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