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Mathematical and Computational Applications is published by MDPI from Volume 21 Issue 1 (2016). Articles in this Issue were published by another publisher in Open Access under a CC-BY (or CC-BY-NC-ND) licence. Articles are hosted by MDPI on as a courtesy and upon agreement with the previous journal publisher.
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Math. Comput. Appl. 2004, 9(1), 91-99;

A Simple Method for Calculating the Number of Atoms in Ion Implanted Samples from the RBS Yield

Faculty of Arts and Sciences, Physics Department, Celai Bayar University, 45140 Muradiye, Manisa, Turkey
Author to whom correspondence should be addressed.
Published: 1 April 2004
PDF [626 KB, uploaded 31 March 2016]


A simple method that computes the number of atoms in implanted samples from the integral of the elastic backseattering yield, using a pocket calculator, is represented. The energy dependence E-2, of the Rutherford law and the screening of the nuclear charge by the electron cloud is considered. The method is based on the assumption that the stopping power is a linearly decreasing function of the energy in the range from 1.4 MeV to 2 MeV. The total yield can be integrated analytically, and the number of atoms in the sample can then be ascertained by an iteration procedure that can be accomplished with a scientific pocket calculator, The results obtained are compared with the values obtained using the computer simulation code for RBS spectra RUMP.
Keywords: RBS; Elastic backscattering; Stopping Power RBS; Elastic backscattering; Stopping Power
This is an open access article distributed under the Creative Commons Attribution License (CC BY 3.0).

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Can, N.; Belik, H. A Simple Method for Calculating the Number of Atoms in Ion Implanted Samples from the RBS Yield. Math. Comput. Appl. 2004, 9, 91-99.

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