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Open AccessArticle

A Dynamic Active Safe Semi-Supervised Learning Framework for Fault Identification in Labeled Expensive Chemical Processes

1
College of Chemical Engineering, Qingdao University of Science & Technology, Qingdao 266042, China
2
State Key Laboratory of Safety and Control for Chemicals, SINOPEC Qingdao Research Institute of Safety Engineering, Qingdao 266071, China
3
Shandong Qiwangda Group Petrochemical CO., LTD, Linzi 255400, China
*
Author to whom correspondence should be addressed.
Processes 2020, 8(1), 105; https://doi.org/10.3390/pr8010105
Received: 30 November 2019 / Revised: 8 January 2020 / Accepted: 9 January 2020 / Published: 13 January 2020
(This article belongs to the Special Issue Process Optimization and Control)
A novel active semi-supervised learning framework using unlabeled data is proposed for fault identification in labeled expensive chemical processes. A principal component analysis (PCA) feature selection strategy is first given to calculate the weight of the variables. Secondly, the identification model is trained based on the obtained key process variables. Thirdly, the pseudo label confidence of identification model is dynamically optimized with an historical, current, and future pseudo label confidence mean. To increase the upper limit of the identification model that is self-learning with high entropy process data, active learning is used to identify process data and diagnosis fault causes by ontology. Finally, a PCA-dynamic active safe semi-supervised support vector machine (PCA-DAS4VM) for fault identification in labeled expensive chemical processes is built. The application in the Tennessee Eastman (TE) process shows that this hybrid technology is able to: (i) eliminate chemical process noise and redundant process variables simultaneously, (ii) combine historical pseudo label confidence with future pseudo label confidence to improve the identification accuracy of abnormal working conditions, (iii) efficiently select and diagnose high entropy unlabeled process data, and (iv) fully utilize unlabeled data to enhance the identification performance. View Full-Text
Keywords: semi-supervised learning; active learning; feature selection; ontology; chemical process; fault identification semi-supervised learning; active learning; feature selection; ontology; chemical process; fault identification
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MDPI and ACS Style

Jia, X.; Tian, W.; Li, C.; Yang, X.; Luo, Z.; Wang, H. A Dynamic Active Safe Semi-Supervised Learning Framework for Fault Identification in Labeled Expensive Chemical Processes. Processes 2020, 8, 105.

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