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Article

Quantitative Analysis of Insulator Degradation in a Single Layer Solenoid by Renormalization of the Transmission Parameter

1
Department of Electrical and Computer Engineering, SungKyunKwan University, Suwon 16419, Korea
2
Department of Mechanical Engineering, Ajou University, Suwon 443-749, Korea
*
Author to whom correspondence should be addressed.
Electronics 2020, 9(11), 1984; https://doi.org/10.3390/electronics9111984
Received: 3 October 2020 / Revised: 15 November 2020 / Accepted: 19 November 2020 / Published: 23 November 2020
(This article belongs to the Section Industrial Electronics)
In this paper, a novel method to quantitatively analyze insulator degradation in a single layer solenoid is proposed. The suggested method employs renormalization of scattering parameters to efficiently detect changes of permittivity in a degraded solenoid. Firstly, a transmission line model, including a locally degraded part in the insulator, was developed, and it was determined that the phase information of the transmission parameter was very informative to check the permittivity change in the transmission line. To check the workability of this idea in a solenoid, a 30-turn single-layer solenoid was designed and fabricated, and 51 degraded states for mimicking insulation deterioration in each turn were introduced by installing additional insulator rings, which increased local relative permittivity. The phase data of the measured transmission parameter turned out to be useful for quantifying changes of the insulator in the solenoid. To maximize the detectability, the measured scattering parameters were renormalized with different reference impedances, which was very useful for detecting degradation in the transmission parameter. In this paper, detailed procedures for quantitatively analyzing degradation of an insulator are proposed and we verify that the suggested renormalization technique is very promising for effectively evaluating the degradation of a solenoid. View Full-Text
Keywords: diagnostic method; single layer solenoid; transmission line theory; scattering parameter renormalization diagnostic method; single layer solenoid; transmission line theory; scattering parameter renormalization
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MDPI and ACS Style

Kim, K.; Han, J.; Chai, J.; Nah, W. Quantitative Analysis of Insulator Degradation in a Single Layer Solenoid by Renormalization of the Transmission Parameter. Electronics 2020, 9, 1984. https://doi.org/10.3390/electronics9111984

AMA Style

Kim K, Han J, Chai J, Nah W. Quantitative Analysis of Insulator Degradation in a Single Layer Solenoid by Renormalization of the Transmission Parameter. Electronics. 2020; 9(11):1984. https://doi.org/10.3390/electronics9111984

Chicago/Turabian Style

Kim, Kwangho, JunHee Han, Jangbom Chai, and Wansoo Nah. 2020. "Quantitative Analysis of Insulator Degradation in a Single Layer Solenoid by Renormalization of the Transmission Parameter" Electronics 9, no. 11: 1984. https://doi.org/10.3390/electronics9111984

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