Kotzea, S.; Witte, W.; Godejohann, B.-J.; Marx, M.; Heuken, M.; Kalisch, H.; Aidam, R.; Vescan, A.
Comparison of MOCVD and MBE Regrowth for CAVET Fabrication. Electronics 2019, 8, 377.
https://doi.org/10.3390/electronics8040377
AMA Style
Kotzea S, Witte W, Godejohann B-J, Marx M, Heuken M, Kalisch H, Aidam R, Vescan A.
Comparison of MOCVD and MBE Regrowth for CAVET Fabrication. Electronics. 2019; 8(4):377.
https://doi.org/10.3390/electronics8040377
Chicago/Turabian Style
Kotzea, Simon, Wiebke Witte, Birte-Julia Godejohann, Mathias Marx, Michael Heuken, Holger Kalisch, Rolf Aidam, and Andrei Vescan.
2019. "Comparison of MOCVD and MBE Regrowth for CAVET Fabrication" Electronics 8, no. 4: 377.
https://doi.org/10.3390/electronics8040377
APA Style
Kotzea, S., Witte, W., Godejohann, B.-J., Marx, M., Heuken, M., Kalisch, H., Aidam, R., & Vescan, A.
(2019). Comparison of MOCVD and MBE Regrowth for CAVET Fabrication. Electronics, 8(4), 377.
https://doi.org/10.3390/electronics8040377